Duc Ngoc Huynh

US Patent:

6810505, Oct 26, 2004

Filed:

Jul 10, 2002

Appl. No.:

10/192989

Inventors:

Alexander Tetelbaum - Hayward CA
Maad A. Al-Dabagh - Sunnyvale CA
Duc Van Huynh - San Jose CA
Ruben Molina, Jr. - San Ramon CA

Assignee:

LSI Logic Corporation - Milpitas CA

International Classification:

G06F 1750

US Classification:

716 1, 716 4, 716 12, 716 19, 716 6, 716 11, 703 13

Abstract:

A method of designing an integrated circuit includes receiving as input a representation of a circuit design and a margin factor and scaling a parameter value in the circuit design by the margin factor to account for coupling in the circuit design. The margin factor advantageously reduces the number of iterations in the design flow and avoids the necessity of cross-talk analysis.

US Patent:

7043708, May 9, 2006

Filed:

Jun 9, 2003

Appl. No.:

10/458547

Inventors:

Alexander Tetelbaum - Hayward CA, US
Duc Van Huynh - San Jose CA, US

Assignee:

LSI Logic Corporation - Milpitas CA

International Classification:

G06F 17/50

US Classification:

716 6, 716 4, 716 5

Abstract:

A method of estimating crosstalk delay for an integrated circuit design flow includes steps of: (a) receiving an integrated circuit design; (b) selecting a list of blocks for which crosstalk delay is to be estimated from the integrated circuit design; (c) selecting one of a plurality of crosstalk delay estimation algorithms or no crosstalk delay estimation algorithm for each block in the list of blocks; (d) performing the selected one of the plurality of crosstalk delay estimation algorithms or no crosstalk delay estimation algorithm to estimate a delay for each block in the list of blocks; and (e) generating as output the estimated delay for each block in the list of blocks.

US Patent:

55294332, Jun 25, 1996

Filed:

Oct 6, 1995

Appl. No.:

8/540257

Inventors:

Duc Huynh - Fremont CA
Daniel D. Sieben - Menlo Park CA
Donald W. Nusbaum - Woodside CA

Assignee:

Pavement Marking Technologies, Inc. - Menlo Park CA

International Classification:

E01C 2322

US Classification:

404 94

Abstract:

A method and apparatus for marking a surface with a predetermined pattern is described. The apparatus includes a surface marking mechanism that supports a material dispenser. The material dispenser is manipulated along a number of axes including an x-axis, a y-axis, and a z-axis. In addition, the material dispenser is manipulated to rotate around a w-axis and to form a tilt angle with the w-axis. The surface marking mechanism includes movement devices for initial positioning of the mechanism and for re-positioning the mechanism to complete a selected pattern that does not fit within the border of the mechanism. The surface marking mechanism is responsive to control signals from a controller. The control signals are derived from a mathematical model characterizing the spatial relationship between the predetermined pattern, the material dispenser, and the surface to be marked.

US Patent:

55294324, Jun 25, 1996

Filed:

Oct 6, 1995

Appl. No.:

8/540000

Inventors:

Duc Huynh - Fremont CA
Daniel D. Sieben - Menlo Park CA
Donald W. Nusbaum - Woodside CA

Assignee:

Pavement Marking Technologies, Inc. - Menlo Park CA

International Classification:

E01C 2316
E01F 904

US Classification:

404 8405

Abstract:

A method and apparatus for marking a surface with a predetermined pattern is described. The apparatus includes a surface marking mechanism that supports a material dispenser. The material dispenser is manipulated along a number of axes including an x-axis, a y-axis, and a z-axis. In addition, the material dispenser is manipulated to rotate around a w-axis and to form a tilt angle with the w-axis. The surface marking mechanism includes movement devices for initial positioning of the mechanism and for re-positioning the mechanism to complete a selected pattern that does not fit within the border of the mechanism. The surface marking mechanism is responsive to control signals from a controller. The control signals are derived from a mathematical model characterizing the spatial relationship between the predetermined pattern, the material dispenser, and the surface to be marked.

US Patent:

54860679, Jan 23, 1996

Filed:

Dec 14, 1993

Appl. No.:

8/167662

Inventors:

Duc Huynh - Fremont CA
Daniel D. Sieben - Menlo Park CA
Donald W. Nusbaum - Woodside CA

Assignee:

Pavement Marking Technologies, Inc. - Menlo Park CA

International Classification:

E01C 2316
E01F 904

US Classification:

404 8405

Abstract:

A method and apparatus for marking a surface with a predetermined pattern is described. The apparatus includes a surface marking mechanism that supports a material dispenser. The material dispenser is manipulated along a number of axes including an x-axis, a y-axis, and a z-axis. In addition, the material dispenser is manipulated to rotate around a w-axis and to form a tilt angle with the w-axis. The surface marking mechanism includes movement devices for initial positioning of the mechanism and for re-positioning the mechanism to complete a selected pattern that does not fit within the border of the mechanism. The surface marking mechanism is responsive to control signals from a controller. The control signals are derived from a mathematical model characterizing the spatial relationship between the predetermined pattern, the material dispenser, and the surface to be marked.