Eddie Lee Riddle

US Patent:

45258546, Jun 25, 1985

Filed:

Mar 22, 1983

Appl. No.:

6/477820

Inventors:

John L. Molbert - Durham NC
Eddie R. Riddle - Durham NC

Assignee:

Troxler Electronic Laboratories, Inc. - Research Triangle Park NC

International Classification:

G01N 2300
G01T 116
G01V 500
H01J 3900

US Classification:

378089

Abstract:

A radiation scatter gauge includes multiple detector locations for developing separate and independent sets of data from which multiple physical characteristics of a thin material and underlying substrate may be determined. In an illustrated embodiment, the apparatus and method of the invention are directed to determining characteristics of resurfaced pavement by nondestructive testing. More particularly, the density and thickness of a thin asphalt overlay and the density of the underlying pavement may be determined.