Intel Corporation
Low Yield Analysis and Technology Development Engineer
Intel Corporation Jul 2015 - Dec 2016
Technology Development and Integration Yield Engineer
Intel Corporation Jul 2011 - Jun 2015
Virtual Fab Defect Metrology and Yield Engineer
Applied Materials Nov 2007 - Aug 2008
Defect Inspection Marketing Manager
Applied Materials Aug 2004 - Oct 2007
Wafer Inspection Applications Expert
Education:
The University of Texas at Austin Aug 1993 - May 1995
Master of Science, Masters
United States Naval Academy 1989 - 1993
Bachelors, Bachelor of Science
Skills:
Semiconductors Semiconductor Industry Metrology Silicon Ic Engineering Management Product Engineering Failure Analysis Design of Experiments Product Management R&D Cross Functional Team Leadership Optics Spc Electronics Cmos Mixed Signal