Eric D Norton

US Patent:

56465211, Jul 8, 1997

Filed:

Aug 1, 1995

Appl. No.:

8/510397

Inventors:

Daniel Rosenthal - Saratoga CA
Kannan Konath - Fremont CA
Robert Whyte - Ringwood, GB
Eric Norton - Cupertino CA
Stuart Robert Pearce - San Jose CA

Assignee:

Schlumberger Technologies, Inc. - San Jose CA

International Classification:

G01R 3128

US Classification:

3241581

Abstract:

Mixed-signal tester architecture and methods are provided which minimize transfer of data, offer parallel data post-processing within the analog channels, and allow flexible synchronization. Multiple analog channels each have a source digital signal processor (DSP), a digital source sequencer, digital source instrumentation, analog source instrumentation, analog measure instrumentation, digital measure instrumentation, a digital pin multiplexer, a digital measure sequencer, DSP-addressable multi-bank capture memory, a capture digital signal processor, and an inter-DSP feedback path for communication between the source DSP and the capture DSP. Each analog channel can be arranged in a feedback loop through either its analog and/or digital instrumentation using the inter-DSP feedback path. DUT response is processed in the channel, the result is used to define parameters for a subsequent test cycle, and a signal corresponding to these parameters is generated and applied to the DUT. This loop-back of the result of a test cycle within the analog channel to define the next test cycle speeds up the test process.

US Patent:

57481245, May 5, 1998

Filed:

Dec 9, 1996

Appl. No.:

8/762395

Inventors:

Daniel Rosenthal - Saratoga CA
Kannan Konath - Fremont CA
Robert Whyte - Ringwood, GB
Eric Norton - Cupertino CA
Stuart Robert Pearce - San Jose CA

Assignee:

Schlumberger Technologies Inc. - San Jose CA

International Classification:

H03M 110

US Classification:

341120

Abstract:

Mixed-signal tester architecture and methods are provided which minimize transfer of data, offer parallel data post-processing within the analog channels, and allow flexible synchronization. Multiple analog channels each have a source digital signal processor (DSP), a digital source sequencer, digital source instrumentation, analog source instrumentation, analog measure instrumentation, digital measure instrumentation, a digital pin multiplexer, a digital measure sequencer, DSP-addressable multi-bank capture memory, a capture digital signal processor, and an inter-DSP feedback path for communication between the source DSP and the capture DSP. Each analog channel can be arranged in a feedback loop through either its analog and/or digital instrumentation using the inter-DSP feedback path. DUT response is processed in the channel, the result is used to define parameters for a subsequent test cycle, and a signal corresponding to these parameters is generated and applied to the DUT. This loop-back of the result of a test cycle within the analog channel to define the next test cycle speeds up the test process.