Erik A Nelson

Address:

10 Sheehan Cir, Wellesley Hills, MA 02481

Phone:

7812374123

VIN:

5FNRL38908B021463

Make:

HONDA

Model:

ODYSSEY

Year:

2008

US Patent:

6386120, May 14, 2002

Filed:

Jun 30, 1998

Appl. No.:

09/107056

Inventors:

Erik Nelson - Upton MA
Jeffrey Teachout - Upton MA

Assignee:

EMC Corporation - Hopkinton MA

International Classification:

A47B 300

US Classification:

108134, 3123215

Abstract:

An electrical cabinet stores, or houses, a variety electrical components. The electrical components within the cabinet may be interconnected and may be connected to other electrical components external to the cabinet. The cabinet has an access door with a door stop that allows the door to be locked in an open position. The cabinet contains a workstation with a pivoting platform that supports an electrical component. The cabinet has an extendable bracket that extends allows an electrical component to be extended from the cabinet and removed by lifting the component in an upward direction. The cabinet has a board guide module that aligns a circuit board with an electrical connector in the cabinet. The cabinet has a bulkhead connector that reduces electromagnetic degradation in electrical cables that extend from the cabinet.

US Patent:

6449200, Sep 10, 2002

Filed:

Jul 17, 2001

Appl. No.:

09/907325

Inventors:

Erik A. Nelson - Waterbury VT
Harold Pilo - Underhill VT

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G11C 700

US Classification:

365201, 365194

Abstract:

A method and structure for the invention includes an integrated memory structure having a built-in test portion. The integrated memory structure has memory cells, bitlines and wordlines connected to the memory cells, wordline decoders connected to a plurality of the wordlines, bitline restore devices connected to the bitlines for charging the bitlines during read and write operations, and a clock circuit connected to the wordlines. During a test mode the wordline decoders simultaneously select multiple wordlines that the bitline restore devices maintain in an active state and the clock circuit maintains th multiple wordlines and the bitline restore devices in an active state for a period in excess of a normal read cycle. The invention also includes transistors which are connected to the memory cells. The transistors include bitline contacts which are stressed during the test mode.

US Patent:

6520608, Feb 18, 2003

Filed:

Jun 30, 1998

Appl. No.:

09/107057

Inventors:

Erik Nelson - Upton MA
Jeffrey Teachout - Upton MA
Lee Spechts - Billerica MA

Assignee:

EMC Corporation - Hopkinton MA

International Classification:

A47B 9700

US Classification:

3122231, 211 4147

Abstract:

An electrical cabinet stores, or houses, a variety electrical components. The electrical components within the cabinet may be interconnected and may be connected to other electrical components external to the cabinet. The cabinet has an access door with a door stop that allows the door to be locked in an open position. The cabinet contains a workstation with a pivoting platform that supports an electrical component. The cabinet has an extendable bracket that extends allows an electrical component to be extended from the cabinet and removed by lifting the component in an upward direction. The cabinet has a board guide module that aligns a circuit board with an electrical connector in the cabinet. The cabinet has a bulkhead connector that reduces electromagnetic degradation in electrical cables that extend from the cabinet.

US Patent:

6658604, Dec 2, 2003

Filed:

Oct 10, 2000

Appl. No.:

09/685939

Inventors:

William R. Corbin - Underhill VT
David P. Monty - Essex Junction VT
Erik A. Nelson - Waterbury VT
Alan D. Norris - Hinesburg VT
Steven W. Tomashot - Williston VT
David E. Chapman - Shelburne VT
Timothy E. Fiscus - South Burlington VT

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G11B 2020

US Classification:

714700, 713400

Abstract:

To overcome these problems, the present invention generates two window strobes and uses the two window strobes to determine if skew between two signals meets predetermined criteria. One of the window strobes is used to test one of the signals, and the other window strobe is generated relative to the first window strobe. The second window strobe tests the other signal (or signals, if they are data signals). From the tests of the two window strobes, it can be determined if the skew between the first and second signals meets predetermined criteria. In particular, the two window strobes are placed relative to each other and to the signals being tested in such a way that when both window strobes indicate passing conditions, skew between the two signals is guaranteed.

US Patent:

6856569, Feb 15, 2005

Filed:

Jan 10, 2003

Appl. No.:

10/248337

Inventors:

Erik A. Nelson - Waterbury VT, US
Michael R. Ouellette - Westford VT, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G11C029/00

US Classification:

3652257, 364200, 364201

Abstract:

Multiple fuse decompression serial bitstreams support an auxiliary fuseblow capability utilizing on-chip storage and providing a composite capability of embedded memory address/data failure information. A multiple repair capability has an improved compression algorithm to compress fuse data with system level soft-set redundancy, and lends itself to self-repair design, and to provide repairs for temperature sensitive fails. An instruction based tester interface in a fuse control provides shift loaded instructions in which the sequence of test and fuse repair operations is variable to provide flexibility in the manufacturing, test and repair operations.

US Patent:

6955410, Oct 18, 2005

Filed:

Mar 28, 2003

Appl. No.:

10/402883

Inventors:

Erik C. Nelson - Upton MA, US
Fernando Luis Castro - Natick MA, US

Assignee:

EMC Corporation - Hopkinton MA

International Classification:

A47B097/00

US Classification:

312352

Abstract:

An electronic system has electronic equipment (e. g. , data storage equipment), and an electronic cabinet assembly which is configured to support the electronic equipment. The electronic cabinet assembly includes a first electronic cabinet frame defining a first set of electronic equipment bays to carry a first portion of the electronic equipment, and a second electronic cabinet frame defining a second set of electronic equipment bays to carry a second portion of the electronic equipment. The electronic cabinet assembly further includes a set of latch subassemblies which is configured to selectively (i) interconnect the first and second electronic cabinet frames, and (ii) disconnect the first and second electronic cabinet frames from each other. Accordingly, a user is capable of conveniently attaching the electronic cabinet frames together using the set of latch subassemblies, and optionally separating the electronic cabinet frames at a later time, without handling any nuts or bolts.

US Patent:

7103814, Sep 5, 2006

Filed:

Oct 25, 2002

Appl. No.:

10/065503

Inventors:

William R. Corbin - Underhill VT, US
Brian R. Kessler - Richmond VT, US
Erik A. Nelson - Waterbury VT, US
Thomas E. Obremski - So. Burlington VT, US
Donald L. Wheater - West Hinesburg VT, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 31/28

US Classification:

714726, 714733

Abstract:

Technique to perform logic and embedded memory tests using logic scan chain testing procedures in parallel with memory built in self test (BIST). This is accomplished with a combination of voltage isolation between memory and logic segments, and isolation between logic and memory test clocks. A test algorithm is introduced to enable and disable the scan chain operation during BIST operation.

US Patent:

7425026, Sep 16, 2008

Filed:

Jun 28, 2006

Appl. No.:

11/427140

Inventors:

David H. Henderson - Shirley MA, US
C. Ilhan Gundogan - Lexington MA, US
F. William French - Harvard MA, US
Erik C. Nelson - Upton MA, US

Assignee:

EMC Corporation - Hopkinton MA

International Classification:

E05C 19/00

US Classification:

292302, 312222

Abstract:

Described are seismic-resistant equipment cabinets and door latches for enabling a hinged door to remain attached to the cabinet during a seismic event of a particular intensity. The door has a latch disposed along one edge of the door. The latch includes a latch-keeper receptacle and a latching bolt disposed in the latch-keeper receptacle. The latching bolt is slideable between a latched and an unlatched position. The frame has a latch keeper assembly attached to an edge thereof. The latch keeper assembly is positioned to enter the latch-keeper receptacle when the door latches to the frame. The latch keeper assembly includes a protruding member having a tapered edge and a latching-bolt aperture to receive the latching bolt when in the latched position. The tapered edge establishes a close fit by the latch keeper assembly within the latch receptacle to limit relative motion therebetween during a seismic event.