Ernest E Burcher

US Patent:

40884082, May 9, 1978

Filed:

Nov 8, 1976

Appl. No.:

5/740155

Inventors:

Ernest E. Burcher - Newport News VA
Stephen J. Katzberg - Yorktown VA
William L. Kelly - Hampton VA

Assignee:

The United States of America as represented by the Administrator of the
National Aeronautics and Space Administration - Washington DC

International Classification:

G01B 1130

US Classification:

356120

Abstract:

The invention is a device for measuring the contour of a surface. Light from a source is imaged by a lens onto the surface which concentrates the energy from the source into a spot. A scanning means is used to scan the spot across the surface. As the surface is being scanned the surface moves relative to the point of perfect focus. When the surface moves away from perfect focus the spot increases in size, while the total energy in the spot remains virtually constant. The lens then reimages the light reflected by the surface onto two detectors through two different sized apertures. The light energy going to the two detectors is separated by a beam splitter. This second path of the light energy through the lens further defocuses the spot, but as a result of the different sizes of the apertures in each light detector path, the amount of defocus for each is different. The ratio of the outputs of the two detectors which is indicative of the contour of the surface is obtained by a divider.

US Patent:

40629961, Dec 13, 1977

Filed:

Jun 18, 1973

Appl. No.:

5/370999

Inventors:

Lloyd S. Keafer - Yorktown VA
Ernest E. Burcher - Newport News VA
Leonard P. Kopia - Newport News VA

Assignee:

The United States of America as represented by the Administrator of the
National Aeronautics and Space Administration - Washington DC

International Classification:

G02B 1314
B32B 1900

US Classification:

428334

Abstract:

An ultraviolet grade fused silica substrate is coated with vaporized fused silica. The coating thickness is controlled, one thickness causing ultraviolet light to diffuse and another thickness causing ultraviolet light to reflect a near Lambertian pattern.