Francisco J Pataro

US Patent:

7180297, Feb 20, 2007

Filed:

Nov 28, 2005

Appl. No.:

11/288697

Inventors:

Bela Deak - Arlington TX, US
Michael Edwards - McKinney TX, US
Terry L. Elzy - Frisco TX, US
Michael Gordon - Desoto TX, US
Mahmoud Harmouch - Dallas TX, US
Aaron C. Klijn - Duncanville TX, US
Marvin G. Miller - Carrollton TX, US
Francisco J. Pataro - Dallas TX, US
Eugenio J. Tacconi - Arlington TX, US

Assignee:

AVO Multi-Amp Corporation - Dallas TX

International Classification:

G01R 31/327

US Classification:

324418, 324509

Abstract:

A test device for testing relays is provided. The test device includes a chassis and a plurality of generator components removably coupled to the chassis. Each of the plurality of generator components have a signal generator, a CPU to promote test signal generation by the signal generator, and an amplifier to amplify signals generated by the signal generator. The test device also includes a controller coupled to communicate with the plurality of generator components.

US Patent:

7248986, Jul 24, 2007

Filed:

Jun 23, 2004

Appl. No.:

10/874969

Inventors:

Aaron C. Klijn - Duncanville TX, US
Marvin G. Miller - Carrollton TX, US
Francisco J. Pataro - Dallas TX, US
Michael D. Willett - McKinney TX, US

Assignee:

Avo Multi-AMP Corporation - Dallas TX

International Classification:

G06F 19/00

US Classification:

702115, 702118, 702119, 702125, 324418, 324 731, 700295, 307 11

Abstract:

A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.

US Patent:

7415377, Aug 19, 2008

Filed:

Jul 11, 2007

Appl. No.:

11/776347

Inventors:

Aaron C. Klijn - Duncanville TX, US
Marvin G. Miller - Carrolton TX, US
Francisco J. Pataro - Dallas TX, US
Michael D. Willett - McKinney TX, US
Michael Edwards - Mckinney TX, US
Terry L. Elzy - Frisco TX, US
Michael Maahs - Dallas TX, US
John L. Shanks - Dallas TX, US
Stanley I. Thompson - Ovilla TX, US

Assignee:

AVO Multi-Amp Corporation DBA Megger - Dallas TX

International Classification:

G06F 19/00

US Classification:

702115, 702118, 702119, 702125, 324418, 324 731, 700295, 307 11

Abstract:

A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.

US Patent:

20050030693, Feb 10, 2005

Filed:

Jun 23, 2004

Appl. No.:

10/874458

Inventors:

Bela Deak - Arlington TX, US
Michael Edwards - McKinney TX, US
Terry Elzy - Frisco TX, US
Michael Gordon - Desoto TX, US
Mahmoud Harmouch - Sherman TX, US
Aaron Klijn - Duncanville TX, US
Marvin Miller - Carrollton TX, US
Francisco Pataro - Dallas TX, US
Eugenio Tacconi - Arlington TX, US

International Classification:

H02H003/00

US Classification:

361160000

Abstract:

A test device for testing relays is provided. The test device includes a chassis and a plurality of generator components removably coupled to the chassis. Each of the plurality of generator components have a signal generator, a CPU to promote test signal generation by the signal generator, and an amplifier to amplify signals generated by the signal generator. The test device also includes a controller coupled to communicate with the plurality of generator components.