Frederick E. Warren - Walnut Creek CA Harvey B. Crisler - El Sobrante CA Robert G. Jacobson - Brentwood CA Chang H. Kim - Berkeley CA Edward C. Llewellyn - Albany CA
Assignee:
Zehntel Incorporation - Walnut Creek CA
International Classification:
G01R 3128
US Classification:
324 73R
Abstract:
An in-circuit test system having means to stimulate the device-under-test at any desired electrical node of the device, means to record the device's response waveform at any node, means to edit the response waveform, and means to use the edited waveform to restimulate the same device in a subsequent in-circuit test.
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