The present invention is directed to a writable or recordable disk that has radially varying recording properties. In one configuration, the magnetic moment, magnetic remanence, and/or information layer thickness decreases from the disk inner diameter to the disk outer diameter. In one configuration, the writing property or coercivity of the disk decreases from the disk inner diameter to the disk outer diameter. The variation in writing property may be accomplished by varying the thickness of an underlayer to the information layer.
Method Of Determining Side Track Erasure In A Disk Drive
Gang H. Lin - San Jose CA, US Erhard Schreck - San Jose CA, US Kezhao Zhang - Fremont CA, US Don Brunnett - Pleasanton CA, US Duc Banh - San Jose CA, US Kurt Rusnak - Pleasanton CA, US Jingbo Yu - San Jose CA, US Suet Teo - San Jose CA, US Nick Warner - Livermore CA, US John Vicars - Longmont CO, US
Assignee:
Maxtor Corporation - Longmont CO
International Classification:
G11B 27/36 G11B 5/03
US Classification:
360 31, 360 66
Abstract:
A method of determining side track erasure in a disk drive having a disk and a transducer. A target track and one or more side tracks proximate to the target track on the disk are selected, and recording parameters for recording signals on the target track and each side track with the transducer are selected. Thereafter, signals are recorded on each side track and then signals are recorded on the target track multiple times. A reduction in the integrity of the recorded signals on each side track due to recording signals on the target track multiple times is detected, and the detected reduction in the integrity of the recorded signals on each side track represents the amount of the erasure of the recorded signals on the side track. Recording parameters are changed based on the signal integrity reduction to minimize side track erasure.
Erhard T. Schreck - San Jose CA, US Gang Herbert Lin - San Jose CA, US
International Classification:
G11B 5/127
US Classification:
3601253
Abstract:
A disk drive having a head with a recessed write pole for perpendicular recording to a disk. The head also includes a read element, a first shield and a second shield that share a common plane, and the write pole is recessed relative to the plane, thereby reducing pole tip protrusion.
Exchange Biased Pole For Reducing The Likelihood Of Domain Lockup In Perpendicular Recording
Yan Wu - Cupertino CA, US Gang Herbert Lin - San Jose CA, US
Assignee:
Seagate Technology LLC - Scotts Valley CA
International Classification:
G11B 5/147
US Classification:
36012508
Abstract:
A magnetic head for perpendicular recording includes a main pole having a first end and a second end. Coils are positioned with respect to the main pole. A return pole forms first and second return paths for magnetic flux extending from the second end of the main pole. The main pole includes an anti-ferromagnetic layer to pin a remnant magnetic moment in the horizontal direction.
Apparatus And Method For Testing Magnetic Disk Drive Components Using Drive-Based Parts
Robert Eaton - San Jose CA, US Gang Herbert Lin - San Jose CA, US Tao Lin - Santa Clara CA, US Amir Ali Companieh - San Francisco CA, US Rob Milby - Santa Cruz CA, US Ron Carroll - San Jose CA, US Robert Kimball - San Jose CA, US
Assignee:
Seagate Technology LLC - Scotts Valley CA
International Classification:
G01R 33/12
US Classification:
324210, 324262
Abstract:
An apparatus and method for testing a component of a magnetic disk drive in which one or more drive-based components is used in the testing process. Each of the drive-based components is based on a corresponding one of the components of the magnetic disk drive. During testing, the component to be tested and at least one of the drive-based components are selectively engaged.
Tao Lin - Santa Clara CA, US Chih-Wu Jen - Longmont CO, US Chunjer Chuck Cheng - Saratoga CA, US Gang Herbert Lin - San Jose CA, US
Assignee:
Western Digital Technologies, Inc. - Irvine CA
International Classification:
G11B 27/36 G01R 33/12
US Classification:
360 31, 324210
Abstract:
A disk spindle assembly cartridge is described. The disk spindle assembly cartridge includes a base, a spindle motor attached to the base, a disk seated on the spindle motor, a disk clamp attached to the spindle motor, wherein the disk clamp secures the disk to the spindle motor, and a cover attached to the base. The base is configured to detachably mount a head stack assembly cartridge, where the disk is accessible to a head stack assembly pivotally mounted in the head stack assembly cartridge via an opening defined by the base and the cover.
Chunjer Chuck Cheng - Saratoga CA, US Tao Lin - Santa Clara CA, US Gang Herbert Lin - San Jose CA, US
Assignee:
Western Digital Technologies, Inc. - Irvine CA
International Classification:
G01B 17/00
US Classification:
3602552, 324212, 738656
Abstract:
According to one aspect of the present disclosure, a head stack assembly cartridge is provided. The head stack assembly cartridge includes a base plate having a pivot shaft for pivotally mounting a head stack assembly and a base voice coil motor magnet attached to an inner surface of the base plate. The base voice coil motor magnet is arranged on the inner surface of the base plate to be adjacent to a coil of the head stack assembly pivotally mounted on the pivot shaft. The head stack assembly cartridge further includes a cover removably attached to the base plate and a pivot clamp removably attached to the cover and configured to secure the head stack assembly pivotally mounted on the pivot shaft.
Tao Lin - San Jose CA, US Gang Lin - San Jose CA, US
Assignee:
Western Digital Technologies, Inc. - Irvine CA
International Classification:
G11B 27/36 G01R 33/12
US Classification:
360 31, 324212
Abstract:
A hard drive component test system is provided. The hard drive component test system includes a rack having multiple test bays with first test sub-assemblies mounted in respective ones of the of test bays. A test control system is electrically coupled to each of the first test sub-assemblies. Each of the test bays is configured to receive a second test sub-assembly and to engage the second test sub-assembly with the first test sub-assembly mounted in the respective bay to form a drive assembly. The test control system is configured to selectively execute a test process on the drive assemblies mounted in the rack.