Gautam Char

age ~47

from Fremont, CA

Also known as:
  • Char Gautum
Phone and address:
38775 Adcock Dr, Fremont, CA 94536

Gautam Char Phones & Addresses

  • 38775 Adcock Dr, Fremont, CA 94536
  • 4237 Nerissa Cir, Fremont, CA 94555
  • 3616 Westminister Trl, Flower Mound, TX 75022 • 5102905022
  • 7200 Pirates Cove Rd, Las Vegas, NV 89145

Us Patents

  • Method And Apparatus For Maintaining Constancy Of Force In Contact Between A Test Probe And Test Object, Which Are In A State Of Relative Motion

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  • US Patent:
    20220196525, Jun 23, 2022
  • Filed:
    Dec 18, 2020
  • Appl. No.:
    17/127116
  • Inventors:
    Vishal Khosla - San Jose CA, US
    Nick Doe - San Jose CA, US
    Ming Chan - San Jose CA, US
    Michael Vinogradov-Nurenberg - San Jose CA, US
    Jun Xiao - San Jose CA, US
    Gautam Char - San Jose CA, US
  • International Classification:
    G01N 3/04
    G01N 3/56
  • Abstract:
    Proposed are a method and apparatus for maintaining constancy of force in contact between a test probe and test object, which are in a state of relative motion, e.g., in a material testing machine. This is achieved by providing the material testing machine with a leveling stage that includes an adjustable leveling mechanism for eliminating deviations of the support surface of the test sample table from flatness and parallelism to a reference plane that passes through the point of contact of the probe with the object perpendicular to the test probe. The mechanism includes springing elements and thrust elements that pass through the carrier member and rest against the springing elements for adjusting thrust forces applied to the springing elements for adjusting a position of the sample supporting surface relative to a virtual reference plane, which passes through the contact point perpendicular to the longitudinal axis of the probe.
  • Universal Material Tester With Several Consecutively Arranged Test Units

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  • US Patent:
    20210389218, Dec 16, 2021
  • Filed:
    Jun 16, 2020
  • Appl. No.:
    16/902781
  • Inventors:
    Gautam Char - San Jose CA, US
    Nick Doe - San Jose CA, US
    Vishal Khosla - San Jose CA, US
    Ming Chan - San Jose CA, US
    Michael Vinogradov-Nurenberg - San Jose CA, US
    Jun Xiao - San Jose CA, US
  • International Classification:
    G01N 3/04
    G01N 3/56
    G01N 3/40
  • Abstract:
    A universal material tester with two or more consecutively arranges test units has a test tool supporting carriage, which is provided with a removable partition that allows conversion of the test-unit installation socket from a multiple test unit holder into a single test-unit holder, or vice versa. An advantage of the tester is a possibility of expanding dynamic range of measurements by using two or more test units, which are installed in series at one setting and can be used in sequential tests without replacement but with different measurement ranges. This broadens the dynamic measurement ranges and allows revealing material properties otherwise unattainable. The test units may be combined with an imaging device installed in series with the test tools that engage the sample physically.
  • Apparatus And Method For In-Line Testing And Surface Analysis Of Test Material With Participation Of Raman Spectroscopy

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  • US Patent:
    20180344166, Dec 6, 2018
  • Filed:
    May 30, 2017
  • Appl. No.:
    15/608913
  • Inventors:
    Vishal Khosla - San Jose CA, US
    Nick Doe - San Jose CA, US
    Ming Chan - San Jose CA, US
    Jun Xiao - San Jose CA, US
    Gautam Char - San Jose CA, US
  • International Classification:
    A61B 5/00
    G01N 21/65
  • Abstract:
    Proposed is an apparatus and method for in-line testing and surface analysis of test material with participation of Raman spectroscopy wherein the apparatus has a column with a plurality of test units at least one of which is a wear test unit and another is a Raman spectrometer. The sample is located on a rotary table under the test units. By sequentially removing the material of the sample to a predetermined depth and then conducting the surface analysis with the use of the Raman spectrometer, it becomes possible to analyze distribution of the material components in the depth direction from the surface of the sample. delivery beams to the longitudinal axis of the Raman spectrometer.
  • Universal Mechanical Tester For Measuring Friction And Wear Characteristics Of Materials

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  • US Patent:
    20180202912, Jul 19, 2018
  • Filed:
    Dec 11, 2017
  • Appl. No.:
    15/838326
  • Inventors:
    Michael Vinogradov-Nurenberg - Sunnyvale CA, US
    Vishal Khosla - Fremont CA, US
    Nicholas Doe - San Ramon CA, US
    Gautam Char - Fremont CA, US
  • Assignee:
    Rtec Instruments, Inc. - San Jose CA
  • International Classification:
    G01N 3/56
  • Abstract:
    Proposed is a universal mechanical tester for measuring friction and wear characteristics of materials. The tester allows performing multiple test protocols with a single machine. The tester consists of a frame that supports a carriage moveable in a vertical direction, a force sensor assembly attached to the carriage, a positioning stage with a slide and a platform, and a plurality of modular sample stages interchangeably installable on the platform for executing linear and rotary motions of the lower sample relative to the upper sample in various directions and planes. The tester is provided with a set of identification units for identifying a modular sample stage installed on the platform and the force sensor assembly attached to the carriage.
  • Torque Measurement Tester For A Hole Treating Rotary Tool

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  • US Patent:
    20180178340, Jun 28, 2018
  • Filed:
    Dec 24, 2016
  • Appl. No.:
    15/390483
  • Inventors:
    Vishal Khosla - San Jose CA, US
    Nick Doe - San Jose CA, US
    Jun Xiao - San Jose CA, US
    Ming Chan - San Jose CA, US
    Gautam Char - San Jose CA, US
  • International Classification:
    B23Q 17/09
    G01L 3/14
  • Abstract:
    Proposed is a torque measurement tester for testing hole-treating rotary tools used on hole treating operations such as drilling, tapping, reaming, countersinking, or the like under real operation conditions for determining the most optimal operations parameters. The torque measurement unit consists of a package of three sensor units, in which the first unit is connected to the frame of the tester via pressure sensors for measuring a thrust force acting in the Z-axis direction, the second sensor unit measures forces acting on the tool in the direction of the X-axis, and the third sensor unit measures forces acting in the Y-axis direction. All measurements are carried out irrespective of each other without mutual effect on the measurement data. The third unit resiliently supports the rotary tool relative to the second unit, while the second unit is connected to the first sensor unit.
  • Method Of Determining Optimal Operation Conditions For Treating Holes With Rotary Tools

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  • US Patent:
    20180178341, Jun 28, 2018
  • Filed:
    Dec 24, 2016
  • Appl. No.:
    15/390484
  • Inventors:
    Vishal Khosla - San Jose CA, US
    Nick Doe - San Jose CA, US
    Jun Xiao - San Jose CA, US
    Ming Chan - San Jose CA, US
    Gautam Char - San Jose CA, US
  • International Classification:
    B23Q 17/09
    G01L 3/14
  • Abstract:
    Proposed is a method of determining optimal operation conditions for treating holes with a rotary tool by performing a hole treatment operation on a tester under various treatment conditions which are similar to the use of the tool in the industrial production on a real manufacturing equipment. The method consists of changing the treatment conditions and determining those operation parameters at which the treated hole is most optimally satisfies the given technical requirements. A criterion for evaluation of these optimal conditions is equality of pair forces acting on the rotary tool in the X- and Y-axis directions since such a situation prevents sidewise deviation of the tool from the direction of the thrust force applied in the Z-axis direction. The above condition is provided by the specific structure of the tester used for carrying out the method.
  • Universal Material Tester With Quick-Release Test Probe And With Reduced Cross-Talk Between The Sensors

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  • US Patent:
    20180067031, Mar 8, 2018
  • Filed:
    Sep 5, 2016
  • Appl. No.:
    15/256668
  • Inventors:
    - San Jose CA, US
    Nick Doe - San Jose CA, US
    Jun Xiao - San Jose CA, US
    Ming Chan - San Jose CA, US
    Gautam Char - San Jose CA, US
  • International Classification:
    G01N 3/56
    G01N 19/02
    G01D 11/24
    G01N 3/40
  • Abstract:
    Proposed is a reliable and cost-effective universal material tester with reduced cross-talk between the sensors. The sensor unit consists of a pressure-sensor unit that measures a vertical force applied to the test probe during movement of the test probe relative to the test specimen and a horizontal force sensor unit for measuring the horizontally directed friction force. The horizontal force sensor unit is made in the form of a flexible parallelogram consisting of two sensor-holding plates interconnected through flexible beams, wherein one end of the first beam is attached to the upper sensor-holding plate and the opposite end to the lower sensor-holding plate, while one end of the second beam is attached to the lower sensor-holding plate and the other to the upper one. The beams are installed with gaps relative to both plates. The tester has a quick-release test probe that incorporates a soft-touch feature.
  • Apparatus For In-Line Testing And Surface Analysis On A Mechanical Property Tester

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  • US Patent:
    20180024035, Jan 25, 2018
  • Filed:
    Jul 20, 2016
  • Appl. No.:
    15/214623
  • Inventors:
    Vishal Khosla - San Jose CA, US
    Nick Doe - San Jose CA, US
    Jun Xiao - San Jose CA, US
    Ming Chan - San Jose CA, US
    Gautam Char - San Jose CA, US
  • International Classification:
    G01N 3/56
    G01B 9/02
  • Abstract:
    An apparatus for in-line testing and surface analysis of a sample contains a base which stationarily supports a column and moveably supports an optical microscope, an interferometer, and at least test unit such as a scratch and abrasive wear tester that are moveable on the column in the Z-axis direction. A sample secured on a sample table, which is supported by a replaceable tribology drive unit on an X-stage that may position the sample under the microscope, interferometer, or test unit. Depending on the type of the test, the replaceable tribology unit may impart to the sample either a linear reciprocating movement or a rotating movement. The apparatus may operate in an automatic mode and is provided with a central processing unit that control movements of all moveable units through respective drivers via controllers connected to the central processing unit.

Resumes

Gautam Char Photo 1

Vice President Software Engineering And Operations

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Location:
San Francisco, CA
Industry:
Semiconductors
Work:
Alere, Inc. Jan 2010 - Dec 2012
Senior Staff Consultant

Chars Group Sep 2007 - Dec 2012
Founder

Rtec-Instruments Inc. Sep 2007 - Dec 2012
Vice President Software Engineering and Operations

Kroll Ontrack Mar 2008 - Jan 2011
Staff Consultant

Concept Assist Sep 2007 - Jul 2009
Co-Founder
Education:
University of Mysore 1994 - 1999
Bachelors, Bachelor of Science
Skills:
Semiconductors
Soa
Process Engineering
Solution Architecture
Program Management
Product Development
Thin Films
Troubleshooting
It Strategy
Software Engineering
Software Project Management
Instrumentation
Profilometer
Interferometer
Drug Testing
Gautam Char Photo 2

Gautam Char

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Name / Title
Company / Classification
Phones & Addresses
Gautam Char
President
CHARS GROUP LLC
Business Services at Non-Commercial Site · Nonclassifiable Establishments
38775 Adcock Dr, Fremont, CA 94536
3501 Veronica Dr, Lewisville, TX 75022

Youtube

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Char Akshar Ko Naam | Thaneshwor Gautam | Mel...

Char Akshar Ko Naam... (Audio Crew) Vocal: Thaneshwor Gautam/Melina Ra...

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Aaj Diwali Mangalchar | Gautam Kale | Diwali ...

Haveli Sangeet pad witten by parmanand das it is sung on Diwali in fro...

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Learn how to draw Halloween Characters with Ryan's World! Let's see wh...

  • Duration:
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Bhui Chhodeki Chari - Prakash Parajuli & Sush...

Presenting new Nepali Teej Song Bhui Chhodeki Chari by Prakash Parajul...

  • Duration:
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Plaxo

Gautam Char Photo 3

gautam Char

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Chicago

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Gautam Char

Facebook

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Gautam Char

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