George A Sanford

US Patent:

46866272, Aug 11, 1987

Filed:

Dec 24, 1984

Appl. No.:

6/685695

Inventors:

William J. Donovan - San Bernardino CA
George G. Sanford - Los Angeles CA

Assignee:

Honeywell Inc. - Minneapolis MN

International Classification:

G01R 1512
G06F 102
G06F 1520

US Classification:

364481

Abstract:

A test apparatus for testing such electrical circuit elements as components of printed circuit boards or integrated circuit chips includes a number of substantially indentical pin modules or units, one for each pin under test. The several modules are separately programmed by a CPU to provide a suitable state at the pin under test, i. e. , excitation signal, read signal or impedance. Power to the unit under test is provided by the pin module.

US Patent:

54209404, May 30, 1995

Filed:

Feb 22, 1994

Appl. No.:

8/200854

Inventors:

Michael F. Sedlar - Walnut CA
Dennis D. Hansen - Glendora CA
George G. Sanford - Diamond CA

Assignee:

Hughes Training, Inc. - Arlington TX

International Classification:

G06K 936

US Classification:

382276

Abstract:

A method for improving CGSI imaging system throughput by selectively decimating rows and/or columns of object image data prior to warp transformation in order to more closely approach a 1:1 compression ratio. The best results are produced on compressed object image data prior to decompression.

US Patent:

39671038, Jun 29, 1976

Filed:

Apr 14, 1975

Appl. No.:

5/567747

Inventors:

Lawrence P. Cachuela - Westminster CA
George G. Sanford - Diamond Bar CA

Assignee:

McDonnell Douglas Corporation - Long Beach CA

International Classification:

G06F 1104

US Classification:

235153AC

Abstract:

A decoder/analyzer test unit capable of rapidly identifying and isolating a failure or fault detected during a sequence of numerous discrete tests of a digital computer in an aircraft flight guidance system is disclosed. The test unit broadly comprises a means for comparing for coincidence of a signal representing a satisfactory result of a discrete test of a computer during a test sequence and another signal that initiated the particular discrete test, means for stopping the computer test sequencing when there is a lack of coincidence of the compared signals for any particular discrete test, and step counter means for counting and indicating the particular test that the computer is undergoing. Test points connecting with identified connections in the computer under test are provided on the test unit for troubleshooting purposes. The test unit can be operated in automatic, continuous and manual modes of operation.