Grace Lynn Chen

US Patent:

6620986, Sep 16, 2003

Filed:

Nov 16, 2000

Appl. No.:

09/715677

Inventors:

Thomas A. McKeon - Richmond CA
Grace Q. Chen - El Sobrante CA

Assignee:

The United States of America as represented by the Secretary of Agriculture - Washington DC

International Classification:

C12N 1582

US Classification:

800294

Abstract:

The invention is a method of Agrobacterium-mediated transformation of castor. The flower bud of an intact castor plant is wounded and Agrobacterium comprises the transgene is infiltrated into the wound. The flower bud is allowed to get seed, and seed comprising the transgene is grown into a transformed castor plant.

US Patent:

7106432, Sep 12, 2006

Filed:

Dec 9, 2002

Appl. No.:

10/315713

Inventors:

Evan R. Mapoles - San Ramon CA, US
Grace H. Chen - San Jose CA, US
Christopher F. Bevis - Los Gatos CA, US
David W. Shortt - Milpitas CA, US

Assignee:

KLA-Tencor Technologies Corporation - Milpitas CA

International Classification:

G01N 21/00
G01N 21/88
G06K 9/00

US Classification:

3562372, 3562371, 3562374, 3562375, 25055945, 382149

Abstract:

A dark field surface inspection tool of the invention includes an illumination source for directing a light beam onto a work piece. The tool includes a scanning element for enabling selected inspection points on the work piece to be scanned by the light beam. During scanning, the light scattered by each inspection point generates light scattering patterns associated with the surface characteristics of the scanned inspection point. The tool includes a photo detector array having photosensitive elements arranged to receive light from the light scattering pattern, thereby capturing an image of the light scattering pattern for each inspection point. Comparison circuitry is included for comparing light scattering patterns with a reference image to enable the identification of defects at the inspection point. The invention also includes a dark field surface inspection method comprising illuminating an inspection surface with a light beam, capturing images of light scattered from the inspection surface and comparing those images with suitable reference images to detect defects in the inspection surface.

US Patent:

7317527, Jan 8, 2008

Filed:

Nov 29, 2004

Appl. No.:

10/999017

Inventors:

Dragos Maciuca - Castro Valley CA, US
Grace H. Chen - San Jose CA, US
Tao-Yi Fu - Fremont CA, US

Assignee:

KLA-Tencor Technologies Corporation - Milpitas CA

International Classification:

G01J 4/00

US Classification:

356364, 349104

Abstract:

A filter to selectively block light from passing through the filter and to selectively permit light to pass through the filter. The filter includes an array with a plurality of individually addressable filter elements. Each filter element is selectively settable to have a variable transmittance to the light of between substantially zero percent and substantially one hundred percent. In this manner, the filter according to the present invention provides areas that pass only a portion of the light, and thus can block the light using patterns other than just an abrupt on/off filtering. By so doing, the filter is able to dramatically reduce, and in some embodiments eliminate, the light ringing that typically accompanies such on/off filters.

US Patent:

7436503, Oct 14, 2008

Filed:

Dec 10, 2004

Appl. No.:

11/009663

Inventors:

Grace Hsiu-Ling Chen - San Jose CA, US
Tao-Yi Fu - Fremont CA, US
Evan Mapoles - San Ramon CA, US

Assignee:

KLA-Tencor Technologies Corp. - Milpitas CA

International Classification:

G01N 21/00
G02B 27/42

US Classification:

3562371, 250550

Abstract:

Accordingly, the present invention provides methods and apparatus for performing a darkfield inspection on a specimen having periodic structures thereon while substantially reducing or eliminating the long range ringing response, which is typically produced by a traditional Fourier filter mask used to eliminate the diffraction caused by the periodic structures. In one embodiment, an apparatus for inspecting a specimen by detecting optical beams scattered from the specimen. The apparatus includes a beam generator for providing and directing an incident beam towards a specimen and an array subtraction device for substantially subtracting a periodic component from an output beam scattered from the specimen in response to the incident beam. The periodic component corresponds to at least one periodic structure on the specimen, and the subtraction is performed so as to substantially reduce or eliminate a ringing response from the output beam. The subtraction is also performed so as to substantially prevent subtracting any actual defect components from the output beam.

US Patent:

7505619, Mar 17, 2009

Filed:

Dec 20, 2005

Appl. No.:

11/314779

Inventors:

Evan R. Mapoles - San Ramon CA, US
Grace H. Chen - San Jose CA, US
Christopher F. Bevis - Los Gatos CA, US
David W. Shortt - Milpitas CA, US

Assignee:

KLA-Tencor Technologies Corporation - Milpitas CA

International Classification:

G06K 9/00

US Classification:

382149, 25055907, 25055941, 25055945, 348126, 348128, 3562373, 3562398, 356600, 356603, 382144, 382147

Abstract:

A dark field surface inspection tool and system are disclosed herein. The tool includes an illumination source capable of scanning a light beam onto an inspection surface. Light scattered by each inspection point is captured as image data by a photo detector array arranged at a fourier plane. The images captured are adaptively filtered to remove a portion of the bright pixels from the images to generate filtered images. The filtered images are then analyzed to detect defects in the inspection surface. Methods of the invention include using die-to-die comparison to identify bright portions of scattering patterns and generate unique image filters associated with those patterns. The associated images are then filtered to generate filtered images which are then used to detect defects. Also, data models of light scattering behavior can be used to generate filters.

US Patent:

7535563, May 19, 2009

Filed:

Aug 15, 2006

Appl. No.:

11/464567

Inventors:

Grace Hsiu-Ling Chen - San Jose CA, US
Tao-Yi Fu - Fremont CA, US
Jamie Sullivan - Eugene OR, US
Shing Lee - Fremont CA, US
Greg Kirk - Pleasanton CA, US

Assignee:

KLA-Tencor Technologies Corporation - Milpitas CA

International Classification:

G01N 21/00

US Classification:

3562375, 3562371

Abstract:

Systems configured to inspect a specimen are provided. One system includes an illumination subsystem configured to illuminate a two-dimensional field of view on the specimen. The system also includes a collection subsystem configured to collect light scattered from the specimen. In addition, the system includes an array of micro-mirrors configured to reflect a two-dimensional pattern of light diffracted from periodic structures on the specimen out of the optical path of the system without reflecting light across an entire dimension of the array out of the optical path. The system further includes a detection subsystem configured to generate output responsive to light reflected by the array into the optical path. The output can be used to detect defects on the specimen. In one embodiment, the system includes an optical element configured to increase the uniformity of the wavefront of the light reflected by the array into the optical path.

US Patent:

7590737, Sep 15, 2009

Filed:

Jul 16, 2004

Appl. No.:

10/893621

Inventors:

Grace Chen - San Jose CA, US
Bob Schatz - San Carlos CA, US
Shardul Divatia - Freemont CA, US

Assignee:

Symantec Operating Corporation - Cupertino CA

International Classification:

G06F 15/173
G06F 11/00

US Classification:

709226, 709223, 709224, 709225, 714 4, 714 25, 714 31

Abstract:

Systems, methods, apparatus and software can implement a flexible I/O fence mechanism framework allowing clustered computer systems to conveniently use one or more I/O fencing techniques. Various different fencing techniques can be used, and fencing mechanism can be customized.

US Patent:

7723112, May 25, 2010

Filed:

Oct 31, 2006

Appl. No.:

11/591019

Inventors:

Michael F. Clarke - Palo Alto CA, US
Tim Hoey - Hillsborough CA, US
Xinhao Wang - Freemont CA, US
Scott Dylla - Mountain View CA, US
Austin Gurney - San Francisco CA, US
Piero Dalerba - Palo Alto CA, US
Mark Prince - Ann Arbor MI, US
Grace Chen - Howell MI, US

Assignee:

The Regents of the University of Michigan - Ann Arbor MI
OncoMed Pharmaceuticals, Inc. - Redwood City CA

International Classification:

G01N 33/53

US Classification:

435971, 435 71, 435325, 435968

Abstract:

The present invention relates to compositions and methods for characterizing, treating and diagnosing cancer. In particular, the present invention provides a cancer stem cell profile, as well as novel stem cell cancer markers useful for the diagnosis, characterization, prognosis and treatment of cancer and in particular the targeting of solid tumor stem cells.