Harold D Stewart

US Patent:

6965309, Nov 15, 2005

Filed:

Apr 8, 2003

Appl. No.:

10/409229

Inventors:

Peter P. Bleznyk - Roswell GA, US
John Steven Engelmann - Roswell GA, US
Hossein Eslambolchi - Los Altos Hills CA, US
Charles C. Giddens - Conyers GA, US
David H. Lu - Morganville NJ, US
Kenneth James Smith - Dacula GA, US
Anthony M. Srdar - Alpharetta GA, US
Harold Jeffrey Stewart - Alpharetta GA, US
John Vincent Wilson - Conyers GA, US

Assignee:

AT&T Corp. - New York NY

International Classification:

G08B019/00

US Classification:

340521, 340506, 340524, 370216

Abstract:

In accordance with the teachings of the present invention, a method is presented for displaying power and heat faults that occur in a network. A server initiates a variety of power alarm display methods. Each method is directed at receiving specific types of power alarm information and displaying or inhibiting the display of this information on a wallboard. The methods operate simultaneously and update the wallboard with power alarm information in near real time. Further, the methods continue to operate and update the display of the power alarm information when tickets associated with the alarms are received or when an operator acknowledges the alarm.

US Patent:

6989893, Jan 24, 2006

Filed:

Jul 23, 2004

Appl. No.:

10/897929

Inventors:

Michael Asher - Conyers GA, US
Hossein Eslambolchi - Los Altos Hills CA, US
Chuck Giddens - Conyers GA, US
John Sinclair Huffman - Conyers GA, US
Harold Stewart - Alpharetta GA, US

Assignee:

AT&T Corp. - New York NY

International Classification:

G01N 21/00

US Classification:

356 731

Abstract:

The present invention relates to method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a likely cause for a length measurement to be shorter than a reference length. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array. In that way, it can be determined whether the missing portion of the tested fiber is at an end or between the ends, providing evidence that the short length measurement results from a fiber break or from the intentional removal of a reserve loop.

US Patent:

7075632, Jul 11, 2006

Filed:

Oct 31, 2005

Appl. No.:

11/263495

Inventors:

Michael Asher - Conyers GA, US
Hossein Eslambolchi - Los Altos Hills CA, US
Chuck Giddens - Conyers GA, US
John Sinclair Huffman - Conyers GA, US
Harold Stewart - Alpharetta GA, US

International Classification:

G01N 21/00

US Classification:

356 731

Abstract:

The present invention relates to method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a likely cause for a length measurement to be shorter than a reference length. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array. In that way, it can be determined whether the missing portion of the tested fiber is at an end or between the ends, providing evidence that the short length measurement results from a fiber break or from the intentional removal of a reserve loop.

US Patent:

7256878, Aug 14, 2007

Filed:

May 15, 2006

Appl. No.:

11/434357

Inventors:

Michael Asher - Conyers GA, US
Hossein Eslambolchi - Los Altos Hills CA, US
Chuck Giddens - Conyers GA, US
John Sinclair Huffman - Conyers GA, US
Harold Stewart - Alpharetta GA, US

Assignee:

AT&T Corp. - New York NY

International Classification:

G01N 21/00

US Classification:

356 731

Abstract:

The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array.

US Patent:

7397545, Jul 8, 2008

Filed:

Jul 16, 2007

Appl. No.:

11/879102

Inventors:

Michael Asher - Conyers GA, US
Hossein Eslambolchi - Los Altos Hills CA, US
Chuck Giddens - Conyers GA, US
John Sinclair Huffman - Conyers GA, US
Harold Stewart - Alpharetta GA, US

Assignee:

AT&T Corp. - New York NY

International Classification:

G01N 21/00

US Classification:

356 731

Abstract:

The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. The reference trace may be replaced or an alarm may be transmitted under certain conditions.

US Patent:

7605912, Oct 20, 2009

Filed:

Jun 9, 2008

Appl. No.:

12/157297

Inventors:

Michael Asher - Conyers GA, US
Hossein Eslambolchi - Los Altos Hills CA, US
Chuck Giddens - Conyers GA, US
John Sinclair Huffman - Conyers GA, US
Harold Stewart - Alpharetta GA, US

Assignee:

AT&T Corp - New York NY

International Classification:

G01N 21/00

US Classification:

356 731

Abstract:

The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. The reference trace may be replaced or an alarm may be transmitted under certain conditions.

US Patent:

7660985, Feb 9, 2010

Filed:

Apr 29, 2004

Appl. No.:

10/835496

Inventors:

Michael L. Asher - Green Grove Springs FL, US
Charles C. Giddens - Conyers GA, US
Harold Jeffrey Stewart - Alpharetta GA, US

Assignee:

AT&T Corp. - New York NY

International Classification:

G06F 12/16

US Classification:

713164, 726 22

Abstract:

For each process a stack data structure that includes two stacks, which are joined at their bases, is created. The two stacks include a normal stack, which grows downward, and an inverse stack, which grows upward. Items on the stack data structure are segregated into protected and unprotected classes. Protected items include frame pointers and return addresses, which are stored on the normal stack. Unprotected items are function parameters and local variables. The unprotected items are stored on the inverse stack.

US Patent:

8010788, Aug 30, 2011

Filed:

Dec 21, 2009

Appl. No.:

12/643259

Inventors:

Michael L. Asher - Green Grove Springs FL, US
Charles C. Giddens - Conyers GA, US
Harold Jeffrey Stewart - Alpharetta GA, US

Assignee:

AT&T Intellectual Property II, LP - Atlanta GA

International Classification:

G06F 12/16

US Classification:

713164, 726 22

Abstract:

For each process a stack data structure that includes two stacks, which are joined at their bases, is created. The two stacks include a normal stack, which grows downward, and an inverse stack, which grows upward. Items on the stack data structure are segregated into protected and unprotected classes. Protected items include frame pointers and return addresses, which are stored on the normal stack. Unprotected items are function parameters and local variables. The unprotected items are stored on the inverse stack.