Helen Jean Kelly

US Patent:

41963890, Apr 1, 1980

Filed:

Jul 13, 1978

Appl. No.:

5/924128

Inventors:

Helen J. Kelly - Wappingers Falls NY
David J. Perlman - Wappingers Falls NY
Akella V. S. Satya - Wappingers Falls NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 3102
G01R 3122

US Classification:

324158R

Abstract:

Disclosed is a test site for an integrated circuit chip including a CCD register. Two serial CCD registers are spaced from each other at incrementally variable intervals. The first register receives a serial bit stream having a first binary value while the second serial register receives a bit stream having a second binary value. Data is transferred in parallel from the second register to determine the point at which the spacing between the two registers is sufficiently close to permit undesirable cross-talk.

US Patent:

39835448, Sep 28, 1976

Filed:

Aug 25, 1975

Appl. No.:

5/607330

Inventors:

Richard Thomas Dennison - Hopewell Junction NY
Leo Boyes Freeman - Poughkeepsie NY
Helen Janet Kelly - Wappingers Falls NY
Peter Tsung-Shih Liu - Wallkill NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G11C 700

US Classification:

340173R

Abstract:

A split random access memory array is integrated with a read only storage array and shares the same sense and bit decode circuitry. Each bit line of the integrated array is provided with an isolation switch between the random access and read only portions. The switch conducts when reading the read only portion but does not conduct (isolates) when writing or reading the random access portion. The isolation switch also permits the initialization of the shared differential sensing latch and facilitates the rapid writing and reading of the random access portion by removing the bit line loading due to the read only portion on such occasions.