Steven Robert Hayashi - Niskayuna NY, US Zhongguo Li - Shanghai, CN Kevin George Harding - Niskayuna NY, US Jianming Zheng - Shanghai, CN Howard Paul Weaver - Mason OH, US Xiaoming Du - Shanghai, CN Tian Chen - Shanghai, CN
Assignee:
General Electric Company - Schenectady NY
International Classification:
G01B 11/24
US Classification:
356601, 356608
Abstract:
A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.
Method And System For Measurement Of A Cutting Tool
Xiaoming Du - Shanghai, CN Kevin George Harding - Niskayuna NY, US Steven Robert Hayashi - Niskayuna NY, US Tian Chen - Shanghai, CN Jianming Zheng - Shanghai, CN Howard Paul Weaver - Mason OH, US James Allen Baird - Amelia OH, US Xinjue Zou - Shanghai, CN
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01B 11/24
US Classification:
356601, 356607
Abstract:
A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.
Xiaoming Du - Shanghai, CN Kevin George Harding - Niskayuna NY, US Steven Robert Hayashi - Niskayuna NY, US Jianming Zheng - Shanghai, CN Tian Chen - Shanghai, CN Howard Paul Weaver - Mason OH, US Yong Yang - Atlanta GA, US Guofei Hu - Shanghai, CN
A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system.
Method And System For Parameter Extraction Of A Cutting Tool
Tian Chen - Shanghai, CN Kevin George Harding - Niskayuna NY, US Steven Robert Hayashi - Niskayuna NY, US Xiaoming Du - Shanghai, CN Jianming Zheng - Shanghai, CN Howard Paul Weaver - Mason OH, US James Allen Baird - Amelia OH, US Xinjue Zou - Shanghai, CN Kevin William Meyer - Cincinnati OH, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01B 11/24
US Classification:
356601, 356607
Abstract:
A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.
Method And System For Gash Parameter Extraction Of A Cutting Tool
Tian Chen - Shanghai, CN Kevin George Harding - Niskayuna NY, US Steven Robert Hayashi - Niskayuna NY, US Xiaoming Du - Shanghai, CN Howard Paul Weaver - Mason OH, US James Allen Baird - Amelia OH, US Xinjue Zou - Shanghai, CN Kevin William Meyer - Cincinnati OH, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G06F 19/00 G01B 5/20
US Classification:
700175, 700195, 702167
Abstract:
A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.
Nicholas Joseph Kray - Cincinnati OH, US David W. Crall - Loveland OH, US Daniel E. Mollmann - Cincinnati OH, US Donald Lee Gardner - West Chester OH, US Marcia Boyle Johnson - Lebanon OH, US Howard P. Weaver - Mason OH, US Max Robert Farson - Greenville SC, US
International Classification:
F01D 5/14 B23P 15/04
US Classification:
416 1, 298892
Abstract:
A method for reducing tip rub loads in a rotor blade is described having the steps of selecting a location of contact between the rotor blade and a static structure; selecting a location on the blade for incorporating a tip-cutter; selecting a cutter-profile for the tip-cutter; and incorporating the tip-cutter on the selected location on the blade such that tip-cutter is capable of removing a portion of the static structure during a tip rub such that tip rub loads are facilitated to be reduced.
Satheesh Jeyaraman - Bangalore, IN Kevin George Harding - Niskayuna NY, US Anandraj Sengupta - Bangalore, IN Debasish Mishra - Bangalore, IN Suneel Tumkur Shankarappa - Hyderabad, IN Howard Paul Weaver - Mason OH, US Kevin William Meyer - Cincinnati OH, US
Assignee:
GENERAL ELECTRIC COMPANY - SCHENECTADY NY
International Classification:
G06K 9/00
US Classification:
382152
Abstract:
A portable wear quantification system includes a hand-held image acquisition device and a fixture. The fixture includes a first end coupled to the image acquisition device. A light source emits a light beam along an emission axis. A beam splitter is disposed at an angle with respect to an axis of view of the image acquisition device for directing the beam from the light source toward a portion of an object. A second end of the fixture is located on an opposite side of the beam splitter from the first end. The second end includes a platform that is configured to position the fixture with respect to the object. A channel extends from the first end to the second end along the axis of view of the image acquisition device.
- Schenectady NY, US Renwei YUAN - Shanghai, CN Howard Paul WEAVER - Evendale OH, US Richard Leigh ADRIAN - Evendale OH, US Xiaobin CHEN - Shanghai, CN
International Classification:
B23H 1/04
Abstract:
An apparatus includes an electrode assembly comprising a carriage having a plurality of electrode holders, the electrode holders being respectively configured to detachably receive a plurality of electrodes, the electrodes include a plurality of first electrodes and a plurality of second electrodes. The first electrodes are configured for rough machining a workpiece by electric discharging or wire electric discharging to remove material from the workpiece, the second electrodes are configured for finish machining the rough machined workpiece by electric discharging to remove material from the rough machined workpiece.
Ge Aviation
Consulting Engineer
Ge Aviation Oct 2015 - Jun 2019
Principal Engineer
Ge Aviation Apr 2010 - Sep 2015
Rotating Parts and Structures Lean Lab Leader
Ge Aviation Jan 2004 - Mar 2010
 Metalworking Technology Lab Leader
Ge Aviation Jun 2002 - Jun 2004
Six Sigma Black Belt
Education:
Michigan Technological University 1977 - 1980
Master of Science, Masters, Bachelors, Bachelor of Science, Mechanical Engineering
Grand Rapids Community College 1975 - 1977
Associates, Engineering
Skills:
Six Sigma Lean Manufacturing Aerospace Engineering Machining Manufacturing Continuous Improvement Spc Engineering Management Dmaic Root Cause Analysis Cad/Cam Manufacturing Engineering Composites Green Belt Aviation Unigraphics Mechanical Engineering Value Stream Mapping Black Belt Minitab Process Improvement
Interests:
Boating Boy Scout Leader Photography Camping Woodworking
Dr. Weaver graduated from the Kansas City University of Medicine and Biosciences College of Osteopathic Medicine in 1984. He works in Orlando, FL and specializes in Family Medicine. Dr. Weaver is affiliated with Florida Hospital Kissimmee and Orlando Regional Medical Center.
Acute Bronchitis Acute Sinusitis Anemia Anxiety Phobic Disorders Benign Polyps of the Colon
Languages:
English
Description:
Dr. Weaver graduated from the University of Cincinnati College of Medicine in 1965. He works in Rutland, VT and specializes in Gastroenterology and Internal Medicine. Dr. Weaver is affiliated with Rutland Regional Medical Center.