Jacob I Trombka

US Patent:

20050226373, Oct 13, 2005

Filed:

Sep 22, 2004

Appl. No.:

10/955586

Inventors:

Jacob Trombka - Rockville MD, US
Samuel Floyd - Columbia MD, US
Jeffrey Schweitzer - Ridgefield CT, US
Yossi Eisen - Nez Ziona, IL
Timothy McClanahan - Columbia MD, US
Arthur Ruitberg - Germantown MD, US

International Classification:

G01T001/36
G01N023/20
G01N023/223

US Classification:

378044000

Abstract:

Disclosed are systems and systems for in-situ chemical analysis at remote locations.

US Patent:

44838174, Nov 20, 1984

Filed:

Jan 31, 1983

Appl. No.:

6/462497

Inventors:

Larry G. Evans - Laurel MD
Jacob I. Trombka - Rockville MD

Assignee:

The United States of America as represented by the Administrator of the
National Aeronautics and Space Administration - Washington DC

International Classification:

G21G 106
G21T 100

US Classification:

376159

Abstract:

A neutron/gamma ray technique for mapping the distribution of contaminants in an extended medium such as the wall (10) of a building. A neutron excitation source (14) is located on one side of the wall (10) and a gamma ray spectrometer, including a gamma ray detector (16), is located on the opposite side of the wall (10) facing the excitation source (12). The source and detector are moved in unison in discrete steps over opposing wall surfaces (12, 18) so as to determine the chemical composition of the elements in a hemispheric region (20) of the wall adjacent the detector with the radius of the region being substantially that of the mean free path distance of gamma rays emitted from elements interacting with neutrons on the detector side of the wall. The source (14) and detector (16) are reversed for relatively thick walls for mapping the distribution of elements on the other side of the wall thickness. The output of the detector (16) is fed to a multi-channel pulse height analyzer (24) where the intensity of the various gamma ray spectral lines are indicated relative to a dominant constituent element such as silicon.