James L Conner

US Patent:

20030126570, Jul 3, 2003

Filed:

Dec 20, 2002

Appl. No.:

10/326133

Inventors:

Tan Du - Plano TX, US
James Conner - Rockwall TX, US
James Holmes - Lucas TX, US

International Classification:

G06F009/45
G06F017/50

US Classification:

716/008000

Abstract:

Disclosed are systems and methods for realizing a selected semiconductor device design using a virtual IC to model the design and simulate characterization and testing for further development of the design prior to the fabrication of actual semiconductor devices. According to the disclosed embodiments of the invention, a common platform may be used for design and simulation phases of IC development.

US Patent:

56149212, Mar 25, 1997

Filed:

Jun 7, 1995

Appl. No.:

8/482538

Inventors:

James L. Conner - Rowlett TX
Michael J. Overlaur - Plano TX
Kevin Kornher - Dallas TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G09G 320
G09G 334

US Classification:

345 85

Abstract:

A method and device for controlling the bias voltages for a split-reset spatial light modulator. Each block of the spatial light modulator can be individually controlled lowering the throughput needed to load each frame of data. Blocks are selected individually or in groups with the potential of providing one voltage condition on the selected blocks and a different voltage condition on the deselected blocks. One embodiment of the disclosed method comprises input latches and buffers 44, address decode logic 46 to determine the selected blocks, mode select logic 48 to determine the requested operation, delay circuitry 50 to minimize current loading, and level shifters 52 to convert logic signals to voltage levels appropriate to control the output drive circuitry 54.

US Patent:

56710836, Sep 23, 1997

Filed:

Feb 2, 1995

Appl. No.:

8/382566

Inventors:

James L. Conner - Rowlett TX
Mike Overlaur - Plano TX
Rohit L. Bhuva - Plano TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G02B 2600

US Classification:

359291

Abstract:

A monolithic DMD spatial light modulator (20) including a storage cell array (24) of charge storage elements (30). Each charge storage cell (30) is formed using robust MOS processes, and comprises a pair of capacitors (32) having a polysilicon electrode fabricated over a substrate, and separated by a thin oxide dielectric. Each capacitor (32) is shielded by several light impermeable metal shields (37, 64, 66, 68, 72, 74, 80, 82, 88) to prevent discharging due to light incident to SLM (20). The substrate electrode (38) is encompassed by an n+ doped region (42) providing a source of minority carriers to an inversion region under the polysilicon electrode (50).

US Patent:

55483011, Aug 20, 1996

Filed:

Sep 2, 1994

Appl. No.:

8/300356

Inventors:

Kevin L. Kornher - Dallas TX
James L. Conner - Rowlett TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G09G 334

US Classification:

345 85

Abstract:

A spatial light modulator (10) having reduced control circuitry as compared to existing devices. Sets of pixel elements (11) share a memory cell (12), such that each memory cell (12) has the same fanout as other memory cells (12). Each pixel element (11) in a set is switched to an on or off state via a reset line (13) that is separate from that of the other pixel elements (11) in that set. Frame data is loaded in split bit-frames during a set time period, such that each split bit-frame contains only the data for pixel elements (11) on one reset line (13). Thus, the same memory cell (12) can be used to deliver data to all pixel elements (11) in its fanout because only one pixel element (11) in the fanout is switched at a time.

US Patent:

58251944, Oct 20, 1998

Filed:

Sep 20, 1996

Appl. No.:

8/717035

Inventors:

Rohit L. Bhuva - Plano TX
Bao Tran - Richardson TX
James L. Conner - Rowlett TX
Michael Overlaur - Plano TX
Tracy S. Paulsen - Rowlett TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G01R 3128

US Classification:

324763

Abstract:

A method of testing a large integrated circuit (10) of modular design. Test equipment is connected to a dedicated testing pad section (20) for each circuit section (22, 24, 34) of each module (12, 14, 16). The circuit section under test is tested via the testing pad adjacent that circuit section. The test equipment is then stepped to the testing section for the next circuit section. When testing is completed, the testing section is then electrically isolated from the circuit sections to prevent interference with operation of the entire circuit (10).

US Patent:

59531533, Sep 14, 1999

Filed:

Oct 27, 1997

Appl. No.:

8/958018

Inventors:

James L. Conner - Rowlett TX
Michael J. Overlaur - Plano TX
Jeffrey W. Clark - Garland TX
Herman A. Groller - Mesquite TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G02B 2608

US Classification:

359298

Abstract:

A spatial light modulator (10) having a micromechanical active portion (12) encompassed by a light shield (14). The light shield (14) is fabricated upon a substrate (36) and has a plurality of openings (72, and 80) to permit underlying layers of photoresist (90, 92) to be undercut from beneath the light shield. Removal of the photoresist layers provides a sufficiently flat light shield, and eliminates the possibility that particles from the photoresist layer could migrate to beneath active micromirrors (30) of the spatial light modulator (12).

US Patent:

56254245, Apr 29, 1997

Filed:

Nov 14, 1994

Appl. No.:

8/339373

Inventors:

James L. Conner - Rowlett TX
Joseph G. Egan - Garland TX
William R. Breithaupt - Dallas TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

H04H 912

US Classification:

348743

Abstract:

A digital motor controller (17) for controlling both the phase and speed of a brushless DC motor (16). An error detection unit (21) detects a speed error or a phase error. An error logic unit (22) uses the error to determine a speed control value, that is proportional to represent an average motor input voltage that varies from the current input voltage by an amount determined by the error. A pulse width modulation unit (23) receives the speed control value and uses it to determine the duty cycle for the motor drive signals. A commutation unit (24) modulates the appropriate drive signal, and a drive stage (27) delivers the drive signals to the motor (16).

US Patent:

56487304, Jul 15, 1997

Filed:

Nov 30, 1994

Appl. No.:

8/347021

Inventors:

Rohit L. Bhuva - Plano TX
Bao Tran - Richardson TX
James L. Conner - Rowlett TX
Michael Overlaur - Plano TX
Tracy S. Paulsen - Rowlett TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G01R 3128

US Classification:

324763

Abstract:

A large integrated circuit (10) of modular design, each module (12,14,16) having a circuit section (22,24,34) and a separate dedicated testing pad section (20). Each circuit module (12,14,16) can be individually functionally tested as an independent circuit with conventional prober equipment for defects. Each testing pad section (20) facilitates controlling the entire integrated circuit (10) so that the respective module circuit section (12,14,16) can be tested. Control circuitry (26) comprised of pass gates is provided to isolate the testing pad sections (20) from the operational portion (22,24,34) of the integrated circuit (10) when not under test. The present invention is ideally suited for large spatial light modulators, memory devices and other large sophisticated integrated circuits.