James Edgar Hudson
age ~56
from Portland, OR
- Also known as:
-
- James E Hudson
- James Te Hudson
- Jamese Hudson
- Jamie Hudson
- Je Hudson
- Demetria Grace Brown
- Demetria Brown
- Demetri Brown
- Grace Demetria
- Phone and address:
- 1244 Upland Dr, Portland, OR 97221
James Hudson Phones & Addresses
- 1244 Upland Dr, Portland, OR 97221
- Austin, TX
- Saint Louis, MO
- Yachats, OR
- Beaverton, OR
- Tempe, AZ
- Fort Worth, TX
Vehicle Records
-
James Hudson
view source -
Address:5812 Cataumet Ct, Saint Louis, MO 63128
-
VIN:2HNYD285X7H538336
-
Make:ACURA
-
Model:MDX
-
Year:2007
Lawyers & Attorneys
James Hudson - Lawyer
view sourceSpecialties:
California Workers' Compensation
Worker's Compensation
Worker's Compensation
ISLN:
913945283
Admitted:
1998
University:
Sonoma State University, B.A., 1993
Law School:
Empire College of Law, J.D., 1997
James Hudson - Lawyer
view sourceOffice:
Hudson & Bondurant, P.C.
Specialties:
Real Estate
Estate Planning
Banking Law
Commercial Real Estate
Zoning, Planning and Land Use
Estate Planning
Banking Law
Commercial Real Estate
Zoning, Planning and Land Use
ISLN:
906327294
Admitted:
1976
University:
Davidson College, B.S., 1971
Law School:
University of Richmond, J.D., 1976
James Hudson - Lawyer
view sourceOffice:
W. Keith Goody
Specialties:
Death Penalty Mitigation
Personal Injury Trial Assistant
Criminal Law Trial Assistant
Personal Injury Trial Assistant
Criminal Law Trial Assistant
ISLN:
916564788
University:
Washington State University, B.S., 2001
James Hudson - Lawyer
view sourceSpecialties:
Criminal Law
Domestic Relations
Domestic Relations
ISLN:
906327355
Admitted:
1967
University:
University of Kentucky, A.B.
Law School:
University of Kentucky, J.D.
James Hudson - Lawyer
view sourceSpecialties:
Environmental Law
Criminal Law
Criminal Law
ISLN:
906327256
Admitted:
1980
University:
Davidson College, A.B., 1977
Law School:
University of South Carolina School of Law, J.D., 1980
James Hudson, Austin TX - Lawyer
view sourceAddress:
2153 S Lamar Blvd, Austin, TX 78704
Phone:
5124447873 (Phone)
Experience:
75 years
Jurisdiction:
Texas (1950)
Memberships:
Texas State Bar (1950)
Medicine Doctors
Dr. James M Hudson, Godfrey IL - MD (Doctor of Medicine)
view sourceSpecialties:
Ophthalmology
Address:
Illinois Eye Surgeons
1310 Dadrian Professional Park, Godfrey, IL 62035
6184335005 (Phone)
1310 Dadrian Professional Park, Godfrey, IL 62035
6184335005 (Phone)
Certifications:
Ophthalmology, 1983
Awards:
Healthgrades Honor Roll
Languages:
English
Hospitals:
Illinois Eye Surgeons
1310 Dadrian Professional Park, Godfrey, IL 62035
Alton Memorial Hospital
One Memorial Drive, Alton, IL 62002
1310 Dadrian Professional Park, Godfrey, IL 62035
Alton Memorial Hospital
One Memorial Drive, Alton, IL 62002
Education:
Medical School
Washington Center / School of Medicine
Graduated: 1975
Medical School
Jewish Hosp-Wash U
Graduated: 1975
Medical School
U Mo Affil Hosp
Graduated: 1975
Washington Center / School of Medicine
Graduated: 1975
Medical School
Jewish Hosp-Wash U
Graduated: 1975
Medical School
U Mo Affil Hosp
Graduated: 1975
James M Hudson, Alton IL
view sourceSpecialties:
Ophthalmology
Work:
Riverbend Phys. & Surgeon Sc
533 E 3Rd St, Alton, IL 62002
Riverbend Physicians & Surgeons Sc
1310 Dadrian Professional Park, Godfrey, IL 62035
JFJ Eyecare, Ltd.
3990 N Illinois St, Swansea, IL 62226
JFJ Eyecare, Ltd.
2421 Corporate Ctr, Granite City, IL 62040
JFJ Eyecare, Ltd.
408 W Second St, Centralia, IL 62801
JFJ Eyecare, Ltd.
991 Fairfax St, Carlyle, IL 62231
JFJ Eyecare, Ltd.
204 Bradford Ln, Waterloo, IL 62298
JFJ Eyecare, Ltd.
103 Clintonian Plz, Breese, IL 62230
JFJ Eyecare, Ltd.
109 S 32Nd St, Mount Vernon, IL 62864
JFJ Eyecare, Ltd.
12 Professional Park Dr, Maryville, IL 62062
JFJ Eyecare, Ltd.
210 S Main St, Red Bud, IL 62278
JFJ Eyecare, Ltd.
18 Ginger Creek Dr, Glen Carbon, IL 62034
JFJ Eyecare, Ltd.
111 W Lincoln St, Belleville, IL 62220
JFJ Eyecare, Ltd.
415 W Main St, Collinsville, IL 62234
533 E 3Rd St, Alton, IL 62002
Riverbend Physicians & Surgeons Sc
1310 Dadrian Professional Park, Godfrey, IL 62035
JFJ Eyecare, Ltd.
3990 N Illinois St, Swansea, IL 62226
JFJ Eyecare, Ltd.
2421 Corporate Ctr, Granite City, IL 62040
JFJ Eyecare, Ltd.
408 W Second St, Centralia, IL 62801
JFJ Eyecare, Ltd.
991 Fairfax St, Carlyle, IL 62231
JFJ Eyecare, Ltd.
204 Bradford Ln, Waterloo, IL 62298
JFJ Eyecare, Ltd.
103 Clintonian Plz, Breese, IL 62230
JFJ Eyecare, Ltd.
109 S 32Nd St, Mount Vernon, IL 62864
JFJ Eyecare, Ltd.
12 Professional Park Dr, Maryville, IL 62062
JFJ Eyecare, Ltd.
210 S Main St, Red Bud, IL 62278
JFJ Eyecare, Ltd.
18 Ginger Creek Dr, Glen Carbon, IL 62034
JFJ Eyecare, Ltd.
111 W Lincoln St, Belleville, IL 62220
JFJ Eyecare, Ltd.
415 W Main St, Collinsville, IL 62234
Education:
Washington University at St. Louis (1975)
James Melvin Hudson, Godfrey IL
view sourceSpecialties:
Ophthalmologist
Address:
1310 Dadrian Professional Park, Godfrey, IL 62035
Education:
Washington University, School of Medicine - Doctor of Medicine
University of Missouri Hospital - Residency - Ophthalmology
University of Missouri Hospital - Residency - Ophthalmology
Board certifications:
American Board of Ophthalmology Certification in Ophthalmology
Us Patents
-
Defect Analyzer
view source -
US Patent:7103505, Sep 5, 2006
-
Filed:Nov 12, 2003
-
Appl. No.:10/706304
-
Inventors:Janet Teshima - Hillsboro OR, US
Daniel E. Partin - Hillsboro OR, US
James E. Hudson - Portland OR, US -
Assignee:FEI Company - Hillsboro OR
-
International Classification:G06F 19/00
-
US Classification:702183, 700121, 702117, 702118, 702185, 714 46
-
Abstract:The present invention provides methods, devices, and systems for analyzing defects in an object such as a semiconductor wafer. In one embodiment, it provides a method of characterizing defects in semiconductor wafers during fabrication in a semiconductor fabrication facility. This method comprises the following actions. The semiconductor wafers are inspected to locate defects. Locations corresponding to the located defects are then stored in a defect file. A dual charged-particle beam system is automatically navigated to the vicinity defect location using information from the defect file. The defect is automatically identified and a charged particle beam image of the defect is then obtained. The charged particle beam image is then analyzed to characterize the defect. A recipe is then determined for further analysis of the defect.
-
Defect Analyzer
view source -
US Patent:7474986, Jan 6, 2009
-
Filed:Aug 1, 2006
-
Appl. No.:11/497565
-
Inventors:Janet Teshima - Hillsboro OR, US
Daniel E. Partin - Hillsboro OR, US
James E. Hudson - Portland OR, US -
Assignee:FEI Company - Hillsboro OR
-
International Classification:G01R 27/28
-
US Classification:702183, 702117, 702118, 702185, 700121, 714 46
-
Abstract:The present invention provides methods, devices, and systems for analyzing defects in an object such as a semiconductor wafer. In one embodiment, it provides a method of characterizing defects in semiconductor wafers during fabrication in a semiconductor fabrication facility. This method comprises the following actions. The semiconductor wafers are inspected to locate defects. Locations corresponding to the located defects are then stored in a defect file. A dual charged-particle beam system is automatically navigated to the vicinity defect location using information from the defect file. The defect is automatically identified and a charged particle beam image of the defect is then obtained. The charged particle beam image is then analyzed to characterize the defect. A recipe is then determined for further analysis of the defect.
-
Defect Analyzer
view source -
US Patent:7987072, Jul 26, 2011
-
Filed:Jan 5, 2009
-
Appl. No.:12/348771
-
Inventors:Janet Teshima - Hillsboro OR, US
Daniel E. Partin - Hillsboro OR, US
James E. Hudson - Portland OR, US -
Assignee:FEI Company - Hillsboro OR
-
International Classification:G01R 27/28
-
US Classification:702183, 702117, 702118, 702185, 700121, 714 46, 250310, 250311
-
Abstract:The present invention provides methods, devices, and systems for analyzing defects in an object such as a semiconductor wafer. In one embodiment, it provides a method of characterizing defects in semiconductor wafers during fabrication in a semiconductor fabrication facility. This method comprises the following actions. The semiconductor wafers are inspected to locate defects. Locations corresponding to the located defects are then stored in a defect file. A dual charged-particle beam system is automatically navigated to the vicinity defect location using information from the defect file. The defect is automatically identified and a charged particle beam image of the defect is then obtained. The charged particle beam image is then analyzed to characterize the defect. A recipe is then determined for further analysis of the defect.
-
Defect Analyzer
view source -
US Patent:8249828, Aug 21, 2012
-
Filed:Jun 22, 2011
-
Appl. No.:13/166547
-
Inventors:Janet Teshima - Hillsboro OR, US
Daniel E. Partin - Hillsboro OR, US
James E. Hudson - Portland OR, US -
Assignee:FEI Company - Hillsboro OR
-
International Classification:G01R 27/28
-
US Classification:702183, 702117, 702118, 702185, 700121, 714 46, 250310, 250311
-
Abstract:The present invention provides methods, devices, and systems for analyzing defects in an object such as a semiconductor wafer. In one embodiment, it provides a method of characterizing defects in semiconductor wafers during fabrication in a semiconductor fabrication facility. This method comprises the following actions. The semiconductor wafers are inspected to locate defects. Locations corresponding to the located defects are then stored in a defect file. A dual charged-particle beam system is automatically navigated to the vicinity defect location using information from the defect file. The defect is automatically identified and a charged particle beam image of the defect is then obtained. The charged particle beam image is then analyzed to characterize the defect. A recipe is then determined for further analysis of the defect.
-
High Speed Detection Of Shunt Defects In Photovoltaic And Optoelectronic Devices
view source -
US Patent:8278937, Oct 2, 2012
-
Filed:Feb 8, 2010
-
Appl. No.:12/658489
-
Inventors:Leonid A. Vasilyev - Beaverton OR, US
John M. Schmidt - Oakland CA, US
James E. Hudson - Portland OR, US
Gregory S. Horner - Felton CA, US -
Assignee:Tau Science Corporation - Felton CA
-
International Classification:G01R 31/02
-
US Classification:324537, 324555
-
Abstract:The current invention provides a shunt defect detection device that includes a device under test (DUT) that is fixedly held by a thermally isolating mount, a power source disposed to provide a directional bias condition to the DUT, a probe disposed to provide a localized power to the DUT from the power source, an emission detector disposed to measure a temporal emission from the DUT when in the directional bias condition, where the measured temporal emission is output as temporal data from the emission detector to a suitably programmed computer that uses the temporal data to determine a heating rate of the DUT and is disposed to estimate an overheat risk level of the DUT, where an output from the computer designates the DUT a pass status, an uncertain status, a fail status or a process to bin status according to the overheat risk level.
-
High Speed Quantum Efficiency Measurement Apparatus Utilizing Solid State Lightsource
view source -
US Patent:8299416, Oct 30, 2012
-
Filed:Mar 1, 2010
-
Appl. No.:12/660688
-
Inventors:Mark A. Arbore - Los Altos CA, US
David L Klein - Palo Alto CA, US
Leonid A. Vasilyev - Beaverton OR, US
John M. Schmidt - Oakland CA, US
James E. Hudson - Portland OR, US
Gregory S. Horner - Felton CA, US -
Assignee:Tau Science Corporation - Felton CA
-
International Classification:G01N 21/64
G01J 1/58 -
US Classification:2502222, 2504591, 702182
-
Abstract:The present invention provides a high-speed Quantum Efficiency (QE) measurement device that includes at least one device under test (DUT), at least one conditioned light source with a less than 50 nm bandwidth, where a portion of the conditioned light source is monitored. Delivery optics are provided to direct the conditioned light to the DUT, a controller drives the conditioned light source in a time dependent operation, and at least one reflectance measurement assembly receives a portion of the conditioned light reflected from the DUT. A time-resolved measurement device includes a current measurement device and/or a voltage measurement device disposed to resolve a current and/or voltage generated in the DUT by each conditioned light source, where a sufficiently programmed computer determines and outputs a QE value for each DUT according to an incident intensity of at least one wavelength of from the conditioned light source and the time-resolved measurement.
-
Method And Apparatus For Sample Extraction And Handling
view source -
US Patent:8357913, Jan 22, 2013
-
Filed:Oct 20, 2007
-
Appl. No.:12/446376
-
Inventors:Enrique Agorio - Lake Oswego OR, US
James Edgar Hudson - Portland OR, US
Michael Tanguay - Portland OR, US
Jason Arjavac - Hillsboro OR, US
Gerhard Daniel - Portland OR, US -
Assignee:FEI Company - Hillsboro OR
-
International Classification:G01N 1/28
G21K 5/08 -
US Classification:25044011, 250311
-
Abstract:An improved method and apparatus for extracting and handling samples for STEM analysis. Preferred embodiments of the present invention make use of a micromanipulator and a hollow microprobe probe using vacuum pressure to adhere the microprobe tip to the sample. By applying a small vacuum pressure to the lamella through the microprobe tip, the lamella can be held more securely and its placement controlled more accurately than by using electrostatic force alone. By using a probe having a beveled tip and which can also be rotated around its long axis, the extracted sample can be placed down flat on a sample holder. This allows sample placement and orientation to be precisely controlled, thus greatly increasing predictability of analysis and throughput.
-
Method And Apparatus For Sample Extraction And Handling
view source -
US Patent:20130153785, Jun 20, 2013
-
Filed:Jan 21, 2013
-
Appl. No.:13/746124
-
Inventors:FEI Company - Hillsboro OR, US
James Edgar Hudson - Portland OR, US
Gerhard Daniel - Portland OR, US
Michael Tanguay - York ME, US
Jason Arjavac - Portland OR, US -
Assignee:FEI Company - Hillsboro OR
-
International Classification:H01J 37/20
-
US Classification:25044211
-
Abstract:An improved method and apparatus for extracting and handling samples for S/TEM analysis. Preferred embodiments of the present invention make use of a micromanipulator and a hollow microprobe probe using vacuum pressure to adhere the microprobe tip to the sample. By applying a small vacuum pressure to the lamella through the microprobe tip, the lamella can be held more securely and its placement controlled more accurately than by using electrostatic force alone. By using a probe having a beveled tip and which can also be rotated around its long axis, the extracted sample can be placed down flat on a sample holder. This allows sample placement and orientation to be precisely controlled, thus greatly increasing predictability of analysis and throughput.
Isbn (Books And Publications)
New Hope for Binge Eaters: Advances in the Understanding and Treatment of Bulimia
view sourceAuthor
James I. Hudson
ISBN #
0060152338
Resumes
James Hudson St. Louis, MO
view sourceWork:
Post Office // United States Navy Uss Midway CVA41
Florissant, MO
Nov 1985 to Nov 2010
Letter Carrier // Boiler Tech
Florissant, MO
Nov 1985 to Nov 2010
Letter Carrier // Boiler Tech
James Hudson Granite City, IL
view sourceWork:
Jims Pawn and Jewery
Granite City, IL
Jun 2014 to Dec 2014
Cashier/Customer Service Rep
Granite City, IL
Jun 2014 to Dec 2014
Cashier/Customer Service Rep
Education:
Granite City High School
Granite City, IL
2010 to 2014
Diploma
Granite City, IL
2010 to 2014
Diploma
Amazon
You Are Here: Tales of Cartographic Wonders
view sourceMaps define our lives as they define our world. What were once the priceless resources of a brave and lonely few as they set off into the unknown are now carried in the pockets of billions around the globe. But they were never merely lines on paper - while depicting our geography we infused them wit...
Author
Lindsay Buroker, Jason LaPier, Charlotte Ashley, Igor Ljubuncic, Daniel J. Ausema, Wilson Geiger, Kate Coe, Adam R. Shannon, Neil James Hudson, Jez Patterson, P.J. Richards, Alec Hutson, Lee Blevins, Christopher Walker, Robert A. Francis, Lynn Rushlau, Joseph A. Lopez
Binding
Kindle Edition
ISBN #
16
J. Hudson Taylor: An Autobiography
view sourceJames Hudson Taylor (1832-1905), was a British Protestant Christian missionary to China, and founder of the China Inland Mission. The society that he began was responsible for bringing over 800 missionaries to the country who began 125 schools and directly resulted in 18,000 Christian conversions, a...
Author
J. Hudson Taylor
Binding
Paperback
Pages
104
Publisher
ReadaClassic.com
ISBN #
1611043301
EAN Code
9781611043303
ISBN #
4
A Retrospect
view sourceTHE following account of some of the experiences which eventually led to the formation of the CHINA INLAND MISSION, and to its taking the form in which it has been developed, first appeared in the pages of China's Millions.
Author
James Hudson Taylor
Binding
Paperback
Pages
96
Publisher
CreateSpace Independent Publishing Platform
ISBN #
1507876637
EAN Code
9781507876633
ISBN #
15
Biography of James Hudson Taylor
view sourceAuthor
Howard Taylor; Mrs Howard Taylor
Binding
Paperback
Pages
512
Publisher
Hodder & Stoughton Religious
ISBN #
0340176385
EAN Code
9780340176382
ISBN #
10
Name / Title
Company / Classification
Phones & Addresses
Owner
Hmco Inc
Plumbing/ Heating/ Air Cond Contractor
Plumbing/ Heating/ Air Cond Contractor
314 N Jefferson Ave, Saint Louis, MO 63103
PO Box 31307, Saint Louis, MO 63131
3146213440
PO Box 31307, Saint Louis, MO 63131
3146213440
President
HUDSON HOME INSPECTIONS, LLC
Business Services · Energy Audit · Home Inspection
Business Services · Energy Audit · Home Inspection
PO Box 8048, Round Rock, TX 78683
1014 Gulf Way, Round Rock, TX 78665
5129231747
1014 Gulf Way, Round Rock, TX 78665
5129231747
President
Jims Pawn & Jewelry
Pawnshop
Pawnshop
1909 Edison Ave, Mitchell, IL 62040
6184523186
6184523186
President
WESTERN INDUSTRIAL CERAMICS, INC
Refractories · Clay Refractories · New Single-Family Housing Construction (except Operative Bui
Refractories · Clay Refractories · New Single-Family Housing Construction (except Operative Bui
10725 SW Tualatin-Sherwood Rd, Tualatin, OR 97062
10725 SW Tualatin Sherwood Rd, Tualatin, OR 97062
5036923770, 5036925299
10725 SW Tualatin Sherwood Rd, Tualatin, OR 97062
5036923770, 5036925299
Vice-President
Bmc Hauling Inc
Local Trucking
Local Trucking
PO Box 440459, Saint Louis, MO 63144
435 W Main St, Wildwood, MO 63025
6369385353
435 W Main St, Wildwood, MO 63025
6369385353
President, Director
DRIPPING SPRINGS ANIMAL HOSPITAL, INC
General Practice of Veterinary Medicine · Veterinarian
General Practice of Veterinary Medicine · Veterinarian
1520 E Hwy 290, Dripping Springs, TX 78620
1000 E Hwy 290, Mount Sharp, TX 78620
11040 Tangleridge Cir, Austin, TX 78736
5128584787, 5128584396
1000 E Hwy 290, Mount Sharp, TX 78620
11040 Tangleridge Cir, Austin, TX 78736
5128584787, 5128584396
Director
EC LOYALTY CORPORATION
Nonclassifiable Establishments
Nonclassifiable Establishments
50 W Douglas St STE 701, Freeport, IL 61032
13601 Preston Rd, Dallas, TX 75240
10900 Stonelake Blvd, Austin, TX 78759
201 E Railroad St 4, Lena, IL 61048
13601 Preston Rd, Dallas, TX 75240
10900 Stonelake Blvd, Austin, TX 78759
201 E Railroad St 4, Lena, IL 61048
Managing
St. Olive Baptist Church
Religious Organization
Religious Organization
5001 Convict Hl Rd, Austin, TX 78749
News
Cowboys 40-37 Giants (Sep 14, 2025) Game Recap
view source- Backup left tackle James Hudson III, playing because Andrew Thomas was out with a foot injury, drew four penalties in a span of six plays on New York's first drive, which covered 110 yards but ended in a field goal thanks to 60 yards in penalties.
- Date: Sep 14, 2025
- Category: Sports
- Source: Google
Fights break out between players at Giants OTAs
view source- After edge rusher Brian Burns and tackle James Hudson, who is playing in place of first-team left tackle Andrew Thomas, did some pushing and shoving, edge rusher Kayvon Thibodeaux and right tackle Jermaine Eluemunor got into it on the next rep. Hudson grabbed Thibodeaux and Burns returned for the si
- Date: Jun 05, 2025
- Category: Sports
- Source: Google
Way too early New York Giants 53-man roster projection
view source- Offensive line (9) Andrew Thomas, Jon Runyan Jr., John Michael Schmitz, Greg Van Roten, Jermaine Eleumunor, Marcus Mbow, James Hudson III, Jake Kubas, Evan NealOut: Aaron Stinnie, Josh Ezeudu, Stone Forsythe,
- Date: Apr 29, 2025
- Category: Sports
- Source: Google
Ed’s 7-round New York Giants mock draft: Abdul Carter and a big swing at QB in first two picks
view source- may offer some flexibility, though I look at him as a right tackle. He has 24 career starts at right tackle, 10 at left tackle and one each at left and right guard. Trapilo probably isnt a guy the Giants would want to play right away, but that is what Jermaine Eluemunor and James Hudson are for.
- Date: Apr 13, 2025
- Category: Sports
- Source: Google
NFL Week 3: Cowboys aren't contenders; what we learned from Sunday games
view source- acking him eight times and pressuring him constantly. Making it worse for the Browns is they lost three linemen in this game to injuries left tackle Jedrick Wills (knee), right guard Wyatt Teller (knee) and right tackle James Hudson (shoulder), who was forced to play because Jack Conklin was out. If
- Date: Sep 22, 2024
- Category: Sports
- Source: Google
2024 NFL Preseason, Week 3: One thing to watch for on each of the 32 teams
view source- BROWNS: The injury issues of 2023 have rolled over to this year, too, and there's a mini-crisis potentially brewing at offensive tackle. In last week's game against the Vikings, the Browns lost three key OT options to injury: James Hudson (ankle), Germain Ifedi (hand) and Hakeem Adeniji (knee). Ifed
- Date: Aug 21, 2024
- Category: Sports
- Source: Google
Browns 7-round mock draft: Future needs filled in Cleveland in 2024, beyond
view source- awand Jones will start at one of the tackle spots this year. If healthy, Jack Conklin will man the right tackle. But we all know how Conklin is injury-prone, and his next injury will be his last snap in brown and orange. Jed Wills is inconsistent and is not a finisher. James Hudson cant be trusted.
- Date: Apr 25, 2024
- Category: Sports
- Source: Google
Keon Coleman, perfect fits at pick No. 54 in 2024 NFL draft
view source- Jedrick Wills and James Hudson III (their swing tackle) have a lot of starting experience, and Jack Conklin is likely near the end of his time with the Browns. This leaves just second-year player Dawand Jones as the only long-term figure at the offensive tackle position beyond 2024. While Wills coul
- Date: Apr 23, 2024
- Category: Sports
- Source: Google
Flickr
Googleplus
James Hudson
Lived:
Austin,TX
Work:
Stella International - Owner
Education:
Launceston College
Youtube
Get Report for James Edgar Hudson from Portland, OR, age ~56