James F Huntington

US Patent:

20130249566, Sep 26, 2013

Filed:

Mar 23, 2012

Appl. No.:

13/428959

Inventors:

James Huntington - Beaverton OR, US

Assignee:

ELECTRO SCIENTIFIC INDUSTRIES, INC. - Portland OR

International Classification:

G01R 35/00

US Classification:

324601

Abstract:

Calibrating automatic test systems for testing electronic components using Kelvin probes is taught. A nominal contact resistance of a Kelvin probe is measured using a test slug to replace an electronic component to be measured on the test system. The measured resistance is stored by the test system and can be used to compensate for a measured value for an electronic component. A test slug can be periodically inserted into the test system to update the contact resistance measure and/or track the contact resistance to measure Kelvin probe wear and/or contamination.

US Patent:

20140091820, Apr 3, 2014

Filed:

Sep 28, 2012

Appl. No.:

13/629924

Inventors:

- Portland OR, US
Jae H. Kim - Lake Oswego OR, US
Daniel Joel Boatright - Tigard OR, US
Michael Charley Stocks - Portland OR, US
James Ray Huntington - Beaverton OR, US

Assignee:

ELECTRO SCIENTIFIC INDUSTRIES, INC. - Portland OR

International Classification:

G01R 1/067
G01R 31/28

US Classification:

3247541

Abstract:

Detecting misalignment of test probes with component carriers in an automated test system is taught. Automated test systems for testing electronic components can have electronic components held in component carriers in preparation for testing. Testing can include moving test probes through openings provided in the component carrier to contact the electronic components held therein. Aspects of disclosed implementations use force feedback from the test probes to determine if the test probes have successfully contacted the electronic component without, for example, contacting the component carrier.