James Lee Summers

US Patent:

6587671, Jul 1, 2003

Filed:

May 28, 1999

Appl. No.:

09/322505

Inventors:

Kerwin D. Kanago - Veradale WA
David L. Platt - Veradale WA
James B. Summers - Spokane WA
Melvin D. Humpherys - Spokane WA
Richard P. Ryan - Spokane WA
Matthew Johnson - Half Moon Bay CA

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

H04Q 734

US Classification:

455 671, 455423, 455424, 455425, 455115, 379 21, 370241, 370253, 3241581

Abstract:

An RF test set having a concurrent measurement architecture is provided. The RF test set is adapted for testing an RF communications device such as a cellular phone according to a set of RF tests. An RF source and an RF receiver are used to communicate with the cellular phone in order to perform the call processing operations to control the cellular phone while performing parametric measurements according to the RF tests. Concurrent measurements allow operation of concurrent measurement processes and call processing operations to take place in the RF test set in order to decrease the time required for each RF test and to increase measurement throughput of the RF test set.

US Patent:

7045995, May 16, 2006

Filed:

May 14, 2004

Appl. No.:

10/846306

Inventors:

James B. Summers - Spokane Valley WA, US

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

G01R 27/00

US Classification:

3241581, 324601

Abstract:

In one embodiment, an algorithm is employed to calibrate electronic circuitry that is adjustable according to operating parameters. The calibration causes an output component to be substantially nulled. The algorithm includes adjusting at least one of the operating parameters over a plurality of values, applying an input signal to the electronic circuitry concurrently with the adjusting, measuring magnitudes of the output component from the electronic circuitry produced in response to the input signal and the adjusting, wherein the plurality of values are selected such that the magnitudes are not substantially nulled, and providing the magnitudes and the plurality of values to a curve fitting algorithm to calculate a plurality of operating parameters that cause the output component to be substantially nulled.

US Patent:

20060224345, Oct 5, 2006

Filed:

Apr 4, 2005

Appl. No.:

11/098695

Inventors:

Fred Ives - Veradale WA, US
James Summers - Spokane Valley WA, US
Brad Andersen - Spokane Valley WA, US

International Classification:

G01R 35/00
G06F 19/00

US Classification:

702107000

Abstract:

A system and method is designed to measure its own environmentally caused inaccuracies and, based upon these measurements, adjust itself to compensate for the inaccuracies. In one embodiment, a test system first measures the signal loss through a model “long” path constructed in the same substrate as is the main test circuit. Since the test path is constructed on the same substrate it then represents the actual environmental impact on the test circuit. The test signal is then sent through a “short” test path and the ratio difference from a reference measurement condition between the two paths yields the necessary compensation which is then used to calibrate the test circuit. In another embodiment, a test signal is applied across a capacitance made up of copper on different layers of substrate material. The actual environmental conditions on the substrate layers modify the measured capacitance value, which is then provided along with temperature as input to a model which determines compensation for the test circuit. Both embodiments can be applied to individual circuits or to systems that are subject to environmentally induced changes to their transmission line loss characteristics.