Jason H Christiansen

US Patent:

7978258, Jul 12, 2011

Filed:

Aug 29, 2008

Appl. No.:

12/201753

Inventors:

Jason Christiansen - Glastonbury CT, US
Dylan M. Reilly - Middletown CT, US
Mark Gustavson - Niantic CT, US

Assignee:

HistoRx, Inc. - New Haven CT

International Classification:

H04N 5/238

US Classification:

348364

Abstract:

The invention relates to a system for automatically adjusting an exposure time to improve or otherwise optimize a dynamic range of a digital image. The system includes a camera configured to capture an image of a subject within the field of view at a first exposure time. The captured image is composed of multiple pixels, with each pixel having a respective intensity value. The system further includes a shutter or suitable control configured to control an exposure time of the camera. A controller configured to carryout the following steps including: (a) querying a frequency distribution of pixel intensity values; (b) determining an effective “center of mass” of such a distribution, or histogram, to determine an adjusted exposure time; and (c) capturing a second image of the subject at the adjusted exposure time thereby obtaining an image with an improved or optimal dynamic range.

US Patent:

8027030, Sep 27, 2011

Filed:

Jan 24, 2011

Appl. No.:

13/012707

Inventors:

Jason Christiansen - Glastonbury CT, US
Robert Pinard - Andover MA, US
Maciej P. Zerkowski - Old Lyme CT, US
Gregory R. Tedeschi - Cromwell CT, US

Assignee:

HistoRx, Inc. - New Haven CT

International Classification:

G01J 1/40
G02B 27/14

US Classification:

3562438, 359634

Abstract:

Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

US Patent:

8120768, Feb 21, 2012

Filed:

Jan 20, 2011

Appl. No.:

13/010643

Inventors:

Jason Christiansen - Glastonbury CT, US
Robert Pinard - Andover MA, US
Maciej P. Zerkowski - Old Lyme CT, US
Gregory R. Tedeschi - Cromwell CT, US

Assignee:

HistoRx, Inc. - Branford CT

International Classification:

G01J 1/00

US Classification:

3562438, 3562431

Abstract:

Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

US Patent:

8314931, Nov 20, 2012

Filed:

Aug 12, 2011

Appl. No.:

13/209068

Inventors:

Jason Christiansen - Glastonbury CT, US
Robert Pinard - Andover MA, US
Maciej P. Zerkowski - Old Lyme CT, US
Gregory R. Tedeschi - Cromwell CT, US

Assignee:

HistoRx, Inc. - New Haven CT

International Classification:

G01J 1/40
G02B 27/14

US Classification:

3562431, 356634

Abstract:

Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

US Patent:

8335360, Dec 18, 2012

Filed:

May 14, 2008

Appl. No.:

12/153171

Inventors:

Jason H. Christiansen - Glastonbury CT, US
Robert Pinard - New Haven CT, US
Mark Gustavson - Niantic CT, US
Brian Bourke - Hamden CT, US
Dylan M. Reilly - Middletown CT, US
Gregory R. Tedeschi - Cromwell CT, US

Assignee:

Historx, Inc. - New Haven CT

International Classification:

G06K 9/00

US Classification:

382128, 382133

Abstract:

The present invention relates generally to improved methods of defining areas or compartments within which biomarker expression is detected and quantified. In particular, the present invention relates to automated methods for delineating marker-defined compartments objectively with minimal operator intervention or decision making. The method provides for precise definition of tissue, cellular or subcellular compartments particularly in histological tissue sections in which to quantitatively analyzing protein expression.

US Patent:

8427635, Apr 23, 2013

Filed:

Jan 27, 2012

Appl. No.:

13/360532

Inventors:

Jason Christiansen - Glastonbury CT, US
Robert Pinard - New Haven CT, US
Maciej P. Zerkowski - Old Lyme CT, US
Gregory R. Tedeschi - Cromwell CT, US

Assignee:

HistoRx, Inc. - New Haven CT

International Classification:

G01J 1/00

US Classification:

3562431, 3562438

Abstract:

Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

US Patent:

20080309929, Dec 18, 2008

Filed:

Jun 13, 2008

Appl. No.:

12/139370

Inventors:

Jason Christiansen - Glastonbury CT, US
Robert Pinard - Andover MA, US
Maciej P. Zerkowski - Old Lyme CT, US
Gregory R. Tedeschi - Cromwell CT, US

International Classification:

G01J 1/10

US Classification:

3562431

Abstract:

Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

US Patent:

20100081666, Apr 1, 2010

Filed:

Jul 14, 2009

Appl. No.:

12/503019

Inventors:

Christina M. COUGHLIN - Berwyn PA, US
Michael E. BURCZYNSKI - Cedar Knolls NJ, US
Marisa P. DOLLED-FILHART - New Haven CT, US
Robert PINARD - Andover MA, US
Donald WALDROM - Fairfield CT, US
Charles ZACHARCHUK - Westford MA, US
Frederick IMMERMANN - Suffern NY, US
Maha KARNOUB - Doylestown PA, US
Jason CHRISTIANSEN - Glastonbury CT, US
Mark GUSTAVSON - Niantic CT, US
Annette MOLINARO - New Haven CT, US
Alpana Waldron - Fairfield CT, US

Assignee:

Wyeth - Madison NJ

International Classification:

A61K 31/506
C12Q 1/68
C12Q 1/48
C12Q 1/02

US Classification:

51425219, 435 6, 435 15, 435 29, 51425306, 514275

Abstract:

Methods of cancer diagnosis and prognosis using biomarkers.