Jason W Farris

US Patent:

7581962, Sep 1, 2009

Filed:

Mar 8, 2007

Appl. No.:

11/715712

Inventors:

David W. Henry - Platte City MO, US
Jason W. Farris - Parkville MO, US
Joseph J. Caven - Kansas City MO, US
Donald A. Marx - Olathe KS, US

Assignee:

Interconnect Devices, Inc. - Kansas City KS

International Classification:

H01R 12/00

US Classification:

439 71, 439525, 439526

Abstract:

An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

US Patent:

8062039, Nov 22, 2011

Filed:

Mar 5, 2009

Appl. No.:

12/398695

Inventors:

Jason W. Farris - Overland Park KS, US
David W. Henry - Platte City MO, US
Joseph J. Caven - Kansas City MO, US
Donald A. Marx - Olathe KS, US

Assignee:

Interconnect Devices, Inc. - Kansas City KS

International Classification:

H01R 12/00

US Classification:

439 71

Abstract:

An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

US Patent:

8575953, Nov 5, 2013

Filed:

Sep 2, 2011

Appl. No.:

13/225141

Inventors:

David W. Henry - Platte Citty MO, US
Kiley Beard - Kearney MO, US
William Thurston - Kansas City MO, US
Jason W. Farris - Overland Park KS, US
Bradley Smith - Mission KS, US

Assignee:

Interconnect Devices, Inc. - Kansas City KS

International Classification:

G01R 31/00

US Classification:

32475411, 32475505, 32475508, 32475605

Abstract:

A test contact may include a first portion having an open-ended rounded shape. The first portion may define an opening therethrough. The test contact may include a second portion having a curved structure. The first portion and the second portion may be formed integrally, and the second portion may be configured to contact a portion of a device lead.

US Patent:

20060267601, Nov 30, 2006

Filed:

May 25, 2005

Appl. No.:

11/137187

Inventors:

Jason Farris - Parkville MO, US
William Thurston - Kansas City MO, US

International Classification:

G01R 31/308

US Classification:

324753000

Abstract:

An eccentric offset Kelvin probe with a beveled contact tip radially offset from the longitudinal axis of the probe which provides a reduced tip spacing between adjacent pairs of probes.

US Patent:

20090289647, Nov 26, 2009

Filed:

May 1, 2009

Appl. No.:

12/434423

Inventors:

David W. Henry - Platte City MO, US
Kiley Beard - Kearney MO, US
William Thurston - Kansas City MO, US
Jason W. Farris - Overland Park KS, US
Bradley Smith - Mission KS, US

Assignee:

INTERCONNECT DEVICES, INC. - Kansas City KS

International Classification:

G01R 1/067
H01R 4/48
G01R 31/02

US Classification:

324754, 439862

Abstract:

A test contact may include a first portion having an open-ended rounded shape. The first portion may define an opening therethrough. The test contact may include a second portion having a curved structure. The first portion and the second portion may be formed integrally, and the second portion may be configured to contact a portion of a device lead.

US Patent:

20210030968, Feb 4, 2021

Filed:

Mar 22, 2019

Appl. No.:

16/982202

Inventors:

- Ra'anana, IL
Samuel DAUPHINAIS - Scottsdale AZ, US
Jason W. FARRIS - Gilbert AZ, US

International Classification:

A61M 5/315
A61M 5/20

Abstract:

An assembly for advancing a piston through a rotationally fixed cartridge includes a rotatable, axially fixed first member and an axially movable, rotatable second member connected thereto via a threaded connection and connectable to the piston. A friction pad is rotationally fixedly connected with the second member and includes first and second sets of fingers extending radially outwardly from a central disk. Both the first and second sets of fingers are configured to contact an interior side wall of the cartridge. The first set of fingers are angled toward a first rotational direction and are configured to wedge the friction pad between the side wall and the second member upon rotation of the first member in the first direction, thereby substantially preventing rotation in the first direction. The second set of fingers are angled toward a second rotational direction and are configured to substantially prevent rotation in the second direction.