Jason M Horn

US Patent:

7924026, Apr 12, 2011

Filed:

Mar 24, 2008

Appl. No.:

12/054258

Inventors:

Jason M. Horn - Santa Rosa CA, US
David E. Root - Santa Rosa CA, US
Daniel Gunyan - Rohnert Park CA, US
Jianjun Xu - Petaluma CA, US

Assignee:

Agilent Technologies, Inc. - Santa Clara CA

International Classification:

G01R 23/20
G06F 17/50

US Classification:

324638, 324623, 324624, 703 13

Abstract:

A method for determining input tones required to produce a desired output includes the step of extracting a linearization of a spectral map representing a device under test (DUT) that i) is under drive of a large signal having one or more fundamental frequencies with associated amplitudes and phases, and ii) produces an approximation of a desired output having at least one unwanted spectral component. The method includes the further step of using an inverse of the extracted linearization to determine the input tones required to produce the desired output under a given load condition.

US Patent:

8533136, Sep 10, 2013

Filed:

Feb 28, 2011

Appl. No.:

13/036917

Inventors:

Jianjun Xu - Petaluma CA, US
Jason M. Horn - Santa Rosa CA, US
Masaya Iwamoto - Rohnert Park CA, US
David E. Root - Santa Rosa CA, US

Assignee:

Agilent Technologies, Inc. - Santa Clara CA

International Classification:

G06N 5/00

US Classification:

706 16, 706 45

Abstract:

A method and system are provided for generating a nonlinear simulation model of a device under test (DUT). The method and system include receiving large-signal nonlinear waveform data based on responses of the DUT to input signals, determining a set of first dynamical variables and a set of second dynamical variables from the nonlinear waveform data, calculating values of second dynamical variables, providing nonlinear constitutive relations as functions of the first dynamical variables and the calculated values of the second dynamical variables, and compiling the nonlinear simulation model of the DUT using the identified nonlinear constitutive relations.

US Patent:

20090184722, Jul 23, 2009

Filed:

Jan 17, 2008

Appl. No.:

12/015932

Inventors:

Daniel B. Gunyan - Santa Rosa CA, US
David E. Root - Santa Rosa CA, US
Loren C. Betts - Santa Rosa CA, US
Jason M. Horn - Santa Rosa CA, US

International Classification:

G01R 27/04

US Classification:

324638

Abstract:

The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.