Jason P Mcclure

US Patent:

7999933, Aug 16, 2011

Filed:

Aug 14, 2009

Appl. No.:

12/541586

Inventors:

Jason McClure - Acton MA, US

Assignee:

Princeton Instruments - Acton MA

International Classification:

G01J 3/00

US Classification:

356300

Abstract:

Disclosed is a method for calibrating optical spectrographs, and in particular optical spectrographs having focal plane array detectors. The method comprises the steps of detecting a spectrum of a known source, referencing a table of known spectral wavelengths and relative intensities, and deriving a spectrograph model based on the spectrograph's physical properties to approximate the observed spectrum, wherein non-linear optimization techniques refine the theoretical model parameters, thereby minimizing the residual difference between observed and calculated spectral intensities in an iterative process producing a set of physical model parameters that best describe the modeling spectrograph for calibration of subsequent spectral acquisitions.

US Patent:

8436423, May 7, 2013

Filed:

Jan 20, 2011

Appl. No.:

13/010328

Inventors:

William Edward Asher - Leominster MA, US
Michael Alan Case - Stow MA, US
Jason McClure - Acton MA, US

Assignee:

Roper Scientific, Inc. - Tucson AZ

International Classification:

H01L 29/00

US Classification:

257341, 257342

Abstract:

A backside-illuminated image sensor is disclosed having improved quantum efficiency (QE) in the near infrared wavelengths (NIR: 750-1100 nm) with minimal optical interference fringes produced by multiple reflected rays within the photosensitive Si region of the sensor, which may be a charge-coupled device, a complementary metal oxide sensor or an electron-multiplication sensor. The invention comprises a fringe suppression layer applied to the backside surface of the photosensitive Si region of a detector (Si substrate) whereby the fringe suppression layer functions in concert with the Si substrate to reduce the occurrence of interference fringes in the NIR while maintaining a high QE over a broad range of wavelengths (300-1100 nm). The combination of a fringe suppression layer applied to a Si substrate provides a new class of back illuminated solid state detectors for imaging.

US Patent:

20140192042, Jul 10, 2014

Filed:

Jan 4, 2013

Appl. No.:

13/734438

Inventors:

Jason McClure - Leominster MA, US

International Classification:

G06T 15/50

US Classification:

345419

Abstract:

Embodiments include methods that may be used to optically obtain the precise three-dimensional location of multiple objects from one or more two dimensional images. An optical point spread function having a transverse shape which varies with axial distance may be implemented to obtain depth information. The transverse variation in the PSF with depth may be produced using a cylindrical lens. The objects may be imaged by a focal plane array detector. One or more 2D images may be used to find the 3D location of the objects using sparse signal reconstruction methods.