Jason David Hilton Mills

Address:

2610 Rollingwood Dr, Austin, TX 78746

VIN:

3GNFK16327G312118

Make:

CHEVROLET

Model:

SUBURBAN

Year:

2007

US Patent:

20170343787, Nov 30, 2017

Filed:

Aug 18, 2017

Appl. No.:

15/680962

Inventors:

- Newton NJ, US
Jörn Wollenzin - Lübeck, DE
Ross Johnstone - Oak Hill VA, US
Kirk Gossage - Austin TX, US
Jeffrey S. Brooker - Oak Hill VA, US
Jason Mills - Austin TX, US
James Jiang - Hackettstown NJ, US
Dierck Hillmann - Lübeck, DE

International Classification:

G02B 21/24
G02B 7/28
G01B 9/02
G02B 21/00
G02B 21/26

Abstract:

Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

US Patent:

20160216501, Jul 28, 2016

Filed:

Jan 13, 2016

Appl. No.:

14/994835

Inventors:

- Newton NJ, US
Jörn Wollenzin - Lubeck, DE
Ross Johnstone - Oak Hill VA, US
Kirk Gossage - Austin TX, US
Jeffrey S. Brooker - Oak Hill VA, US
Jason Mills - Austin TX, US
James Jiang - Hackettstown NJ, US
Dierck Hillmann - Lubeck, DE

International Classification:

G02B 21/24
G02B 21/26
G02B 5/12
G02B 21/08

Abstract:

Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

US Patent:

20140104468, Apr 17, 2014

Filed:

Oct 11, 2013

Appl. No.:

14/052251

Inventors:

- Newton NJ, US
Jason Mills - Austin TX, US
Ash Prabala - Austin TX, US
Frank Armstrong - Rochester NY, US
Jeffrey Erickson - Cedar Park TX, US
Gregory Havenga - Austin TX, US
Charles Taylor - Johnson City TX, US
William Ratdke - Ellicott City MD, US

Assignee:

Thorlabs, Inc. - Newton NJ

International Classification:

H04N 5/372

US Classification:

348295

Abstract:

A method for operating a focal plane array in a Time Delay Integration (TDI) mode, the method including: shifting a number of rows during TDI integration, wherein the number of rows shifted is less than a total number of rows of the focal plane array; and reading out a number of rows equal to the total number of rows of the focal plane array minus the number of rows shifted, leaving behind the partially-integrated rows.