Javier F Ruiz

US Patent:

6717669, Apr 6, 2004

Filed:

Mar 6, 2002

Appl. No.:

10/091836

Inventors:

Javier Ruiz - Oceanside CA

Assignee:

SCI Instruments, Inc. - Carlsbad CA

International Classification:

G01J 328

US Classification:

356328, 356307

Abstract:

Auto-calibrating spectrometers and methods that measure transmission or reflection versus wavelength of a sample without need for calibration for long periods of time. Reflection and transmission spectrometers along with auto-calibrating methods for use therewith are disclosed. Light is focused onto a sample using a lens or similar optical element that transmits light towards the sample reflects light impinging upon it, and transmits light reflected from the sample. If one monitors the light reflected from the first lens and sample, very useful information is available related to the system response versus time. The present invention monitors the reflected light from the first lens and sample, and corrects for the system changes over time using this reflected light.

US Patent:

7505133, Mar 17, 2009

Filed:

Jun 22, 2004

Appl. No.:

10/873735

Inventors:

Emad Zawaideh - Carlsbad CA, US
Javier Ruiz - Oceanside CA, US

Assignee:

SCI Instruments, Inc. - Carlsbad CA

International Classification:

G01J 4/001

US Classification:

356369

Abstract:

Metrology systems and methods that measure thin film thickness and or index of refraction of semiconductor wafers with at least one deposited or grown thin film layer. The present invention measures near normal incidence and grazing angle of incidence reflection (using reflected broadband UV, visible, and near infrared electromagnetic radiation) from a small region on a sample. Embodiments of the system selectively comprise a near-normal incidence spectrometer/ellipsometer, a high angle of incidence spectrometer/ellipsometer, or a combination of the two.

US Patent:

8319966, Nov 27, 2012

Filed:

Mar 12, 2009

Appl. No.:

12/403119

Inventors:

Emad Zawaideh - Carlsbad CA, US
Javier Ruiz - Oceanside CA, US

International Classification:

G01J 4/00

US Classification:

356364, 356368

Abstract:

Metrology systems and methods that measure thin film thickness and or index of refraction of semiconductor wafers with at least one deposited or grown thin film layer. The present invention measures near normal incidence and grazing angle of incidence reflection (using reflected broadband UV, visible, and near infrared electromagnetic radiation) from a small region on a sample. Embodiments of the system selectively comprise a near-normal incidence spectrometer/ellipsometer, a high angle of incidence spectrometer/ellipsometer, or a combination of the two.

US Patent:

52836762, Feb 1, 1994

Filed:

May 10, 1993

Appl. No.:

8/059511

Inventors:

Thomas C. Borah - Vista CA
Javier A. Ruiz - Oceanside CA

Assignee:

Hughes-JVC Technology Corporation - Carlsbad CA

International Classification:

G02F 11335
G02F 1135
G02F 113

US Classification:

359 67

Abstract:

Creation of DC fields in a liquid crystal light valve caused a DC induced transient optical phenomenon in which output brightness level undergoes a change as the DC fields are redistributed within the liquid crystal light valve. Adverse effects of the DC induced transient optical output are minimized by employing a liquid crystal material of greatly decreased resistivity, which reduces the time constant of the liquid crystal device, making it comparable to the response time of the liquid crystal material itself.

US Patent:

58447229, Dec 1, 1998

Filed:

Jun 5, 1997

Appl. No.:

8/864884

Inventors:

Craig P. Stephens - Carlsbad CA
David G. Jackson - Oceanside CA
Javier A. Ruiz - Oceanside CA
Rodney D. Sterling - Carlsbad CA

Assignee:

Hughes-JVC Technology Corporation - Carlsbad CA

International Classification:

G02B 2714
G02B 702

US Classification:

359637

Abstract:

An optical system is provided that has an enclosure which is substantially filled with a fluid. The enclosure also has an aperture for receiving an electromagnetic wave that is altered by an optical component contained in the enclosure. The enclosure also has an aperture mask and blocker that are at least partially immersed in the fluid.

US Patent:

54900042, Feb 6, 1996

Filed:

May 2, 1994

Appl. No.:

8/236987

Inventors:

Craig Stephens - Carlsbad CA
Thomas C. Borah - Vista CA
Tim Kozakai - Carlsbad CA
Yu-Tai Lee - San Diego CA
Javier A. Ruiz - Oceanside CA

International Classification:

G02F 11335
G02F 1135

US Classification:

359 67

Abstract:

A liquid crystal light valve device exhibiting improved performance capabilities fabricated using a cadmium telluride light blocking layer doped with nitrogen. Because of the incorporation of nitrogen into the cadmium telluride light blocking layer, the layer can be applied using high-speed, low-cost sputtering techniques without resulting in excessive photoconductivity or photoshading. The cost of the addition of nitrogen is minimal. The process of the present invention is amenable to precise control and wide flexibility which results in control of the quality aspects of the light blocking layer such as particulate density.

US Patent:

55702139, Oct 29, 1996

Filed:

May 10, 1994

Appl. No.:

8/240541

Inventors:

Javier A. Ruiz - Oceanside CA
Rodney D. Sterling - Carlsbad CA

Assignee:

Hughes-JVC Technology Corporation - Carlsbad CA

International Classification:

G02F 1135
G02F 11335

US Classification:

359 72

Abstract:

A reflective liquid crystal light valve includes transparent conductive layers of indium tin oxide (30) employed as an electrode to electrically modulate orientation of molecules of a liquid crystal material that receives a high intensity reading light (40) applied through the transparent electrode. Unwanted double reflection (64,66) from interfaces between the indium tin oxide electrode (30) and adjacent layers (22,32) are minimized by application of broad band anti-reflective coatings (70,72,74,76) formed by one or more pairs of thin layers having alternately high and low indices of refraction.

US Patent:

55768547, Nov 19, 1996

Filed:

Nov 12, 1993

Appl. No.:

8/152996

Inventors:

Jack H. Schmidt - Carlsbad CA
Ned Nestorovic - San Diego CA
Rodney D. Sterling - Carlsbad CA
Joseph M. Haggerty - Fallbrook CA
Javier A. Ruiz - Oceanside CA
Robert Edwards - San Marcos CA
Roger Hollister - Torrance CA

Assignee:

Hughes-JVC Technology Corporation - Carlsbad CA

International Classification:

G02F 11335
G02F 11333

US Classification:

359 40

Abstract:

In a liquid crystal light valve projector, a quarter-wave compensator plate is disposed between a polarization plate and a liquid crystal light valve to compensate for polarization irregularities induced by the off-incident reflections in the cone of light projected onto the LCLV. The quarter-wave compensation plate reverses the phase of the P component of said illumination light with respect to said compensator plate by 180. degree. thereby eliminating P-polarization leakage during the dark state of an LCLV projector. The invention also combines the compensator plate with a heat shield and a low stress-optical coefficient counter electrode substrate to reduce the birefringence of the LCLV thereby also minimizing leakage of P-polarized light onto the projection screen during the dark state of the projector.