Jay H Hendricks

US Patent:

61139831, Sep 5, 2000

Filed:

Apr 3, 1998

Appl. No.:

9/054401

Inventors:

Michael R. Zachariah - Tucson AZ
Jay H. Hendricks - Ellicott City MD

Assignee:

The United States of America as represented by the Secretary of Commerce - Washington DC

International Classification:

C23C 1600

US Classification:

427253

Abstract:

A new low temperature method for nanostructured metal and ceramic thin film growth by chemical vapor deposition (CVD) involves the use of a low pressure co-flow diffusion flame reactor to react alkali metal vapor and metal halide vapor to deposit metal, alloy and ceramic films. The reaction chemistry is described by the following general equation: (mn)Na+nMX. sub. m. fwdarw. (M). sub. n +(nm)NaX where Na is sodium, or another alkali metal (e. g. , K, Rb, Cs), and MX. sub. m is a metal-halide (M is a metal or other element such as Si, B or C; X is a halogen atom, e. g. , chlorine, fluorine or the like; and m and n are integers). This reaction chemistry is a viable technique for thin film growth. In one mode, using the precursors of sodium metal vapor, titanium tetrachloride (the limiting reagent), and either argon or nitrogen gases, titanium (Ti), titanium nitride (TiN), titanium dioxide (TiO. sub. 2), and titanium silicide (TiSi, Ti. sub. 5 Si. sub. 3, TiSi. sub. 2, Ti. sub. 5 Si. sub.

US Patent:

20200355606, Nov 12, 2020

Filed:

Jul 24, 2020

Appl. No.:

16/938300

Inventors:

- Gaithersburg MD, US
Stephen Paul Eckel - Gaithersburg MD, US
Jacob Edmond Ricker - Gaithersburg MD, US
Jay Howard Hendricks - Clarksburg MD, US

International Classification:

G01N 21/41
G01B 9/02

Abstract:

An optical refraction barometer measures pressure based on refractivity changes and includes: an optical light source; an optical frequency controller; a first optical phase controller; a first polarization controller; an electronic reference arm in optical communication with the first polarization controller; a second optical phase controller in optical communication with the optical frequency controller; a second polarization controller in optical communication with the second optical phase controller; an electronic sample arm in optical communication with the second polarization controller and in electrical communication with the second optical phase controller; a second sideband frequency generator; a mixer in electrical communication with the detector and the second sideband frequency generator; and a first sideband frequency generator in electrical communication with the mixer; and a dual fixed length optical cavity refractometer.

US Patent:

20200041255, Feb 6, 2020

Filed:

Jul 24, 2019

Appl. No.:

16/520668

Inventors:

- Gaithersburg MD, US
Kevin O. Douglass - Ellicott City MD, US
Stephen P. Eckel - Rockville MD, US
Patrick F. Egan - Rockville MD, US
Jay H. Hendricks - Clarksburg MD, US

International Classification:

G01B 11/16
G02B 27/10
H01S 5/40
H01S 3/23

Abstract:

A deformometer includes: a cavity body; entry and exit optical cavity optics, such that the optical cavity produces filtered combined light from combined light; a first laser that provides first light; a second laser that provides second light; an optical combiner that: receives the first light; receives the second light; combines the first light and the second light; produces combined light from the first light and the second light; and communicates the combined light to the entry optical cavity optic; a beam splitter that: receives the filtered combined light; splits the filtered combined light; a first light detector in optical communication with the beam splitter and that: receives the first filtered light from the beam splitter; and produces a first cavity signal from the first filtered light; and a second light detector that: receives the second filtered light; and produces a second cavity signal from the second filtered light.

US Patent:

20200041256, Feb 6, 2020

Filed:

Jul 24, 2019

Appl. No.:

16/520672

Inventors:

- Gaithersburg MD, US
Kevin O. Douglass - Ellicott City MD, US
Stephen P. Eckel - Rockville MD, US
Patrick F. Egan - Rockville MD, US
Jay H. Hendricks - Clarksburg MD, US

International Classification:

G01B 11/16
G02B 27/10
H01S 5/40
H01S 3/23
H01S 3/107

Abstract:

A deformometer includes: a cavity body; entry and exit optical cavity optics, such that the optical cavity produces filtered combined light from combined light; a first laser that provides first light; a second laser that provides second light; an optical combiner that: receives the first light; receives the second light; combines the first light and the second light; produces combined light from the first light and the second light; and communicates the combined light to the entry optical cavity optic; a beam splitter that: receives the filtered combined light; splits the filtered combined light; a first light detector in optical communication with the beam splitter and that: receives the first filtered light from the beam splitter; and produces a first cavity signal from the first filtered light; and a second light detector that: receives the second filtered light; and produces a second cavity signal from the second filtered light.

US Patent:

20200041257, Feb 6, 2020

Filed:

Jul 24, 2019

Appl. No.:

16/520677

Inventors:

- Gaithersburg MD, US
Jay H. Hendricks - Clarksburg MD, US

International Classification:

G01B 11/16
H01S 3/23
H01S 5/40

Abstract:

A deformometer includes: a cavity body; entry and exit optical cavity optics, such that the optical cavity produces filtered combined light from combined light; a first laser that provides first light; a second laser that provides second light; an optical combiner that: receives the first light; receives the second light; combines the first light and the second light; produces combined light from the first light and the second light; and communicates the combined light to the entry optical cavity optic; a beam splitter that: receives the filtered combined light; splits the filtered combined light; a first light detector in optical communication with the beam splitter and that: receives the first filtered light from the beam splitter; and produces a first cavity signal from the first filtered light; and a second light detector that: receives the second filtered light; and produces a second cavity signal from the second filtered light.

US Patent:

20200041379, Feb 6, 2020

Filed:

Jul 24, 2019

Appl. No.:

16/520687

Inventors:

- Gaithersburg MD, US
Stephen P. Eckel - Rockville MD, US
Patrick F. Egan - Rockville MD, US
Jay H. Hendricks - Clarksburg MD, US

International Classification:

G01M 11/00
G02B 6/35
G01N 21/25

Abstract:

A deformometer includes: a cavity body; entry and exit optical cavity optics, such that the optical cavity produces filtered combined light from combined light; a first laser that provides first light; a second laser that provides second light; an optical combiner that: receives the first light; receives the second light; combines the first light and the second light; produces combined light from the first light and the second light; and communicates the combined light to the entry optical cavity optic; a beam splitter that: receives the filtered combined light; splits the filtered combined light; a first light detector in optical communication with the beam splitter and that: receives the first filtered light from the beam splitter; and produces a first cavity signal from the first filtered light; and a second light detector that: receives the second filtered light; and produces a second cavity signal from the second filtered light.