Jeffrey C. Dunnihoo - Austin TX Minghua Lin - Campbell CA
Assignee:
Integrated Technology Express, Inc. - Sunnyvale CA
International Classification:
G06F 104
US Classification:
713502, 713400, 713601, 709400, 710 47, 710260
Abstract:
A programmable timer is disclosed for use in conjunction with a microcontroller circuit. The timer is used as part of a time slice arbiter in a real time operating system, which arbiter manages device routines by allocating them to distinct code time slices executable by such microcontroller. The set up of time slices, including their number, sequence, duration, etc. , can be configured and optimized to achieve a desired system performance level based on characteristics of an associated system bus, devices on the bus, etc. The timer operates as a hardware controller to direct the interrupt handler to various entry points in the corresponding routines associated with interrupt based devices on a system bus.
Polarity Independent Power Supply Control Methods And Systems Using The Same
A method of controlling a power supply having an output activated in response to a first logic level of a control signal and deactivated in response to a second logic level of the control signal. A clock is generated on a second power source and used to time a time-out period of a selected number of clock periods. In response to the step of sensing, if the state of the output of the power supply is inactive through the timeout period, then the first logic level of the control signal is generated to activate the power supply for use in powering operations of an associated device. After completion of these operations, the second logic level of the control signal is generated to deactivate the power supply. If however, the state of the output of the power supply is active during the time-out period, then the first logic level of the control signal is maintained to power operations of the associated device. At the end of these operations, the second logic level of the control signal is generated to deactivate the power supply.
Bidirectional Buffer With Slew Rate Control And Method Of Bidirectionally Transmitting Signals With Slew Rate Control
Chadwick N. Marak - San Jose CA, US Jeffrey C. Dunnihoo - Bertram TX, US Adam J. Whitworth - Los Altos CA, US
Assignee:
California Micro Devices - Milpitas CA
International Classification:
H03K 19/0175
US Classification:
326 83, 326 26
Abstract:
The present invention is directed to bidirectional buffer with slew rate control in at least one direction. The present invention is also directed to a method of bidirectionally transmitting signals with slew rate control in at least one direction.
Apparatus And Method That Provides Active Pull-Up And Logic Translation From One Signal Mode To Another Signal Mode
Chadwick N. Marak - San Jose CA, US Jeffrey C Dunnihoo - Bertram TX, US
Assignee:
California Micro Devices - Milpitas CA
International Classification:
H03K 19/094
US Classification:
326 68, 326 80, 326 81
Abstract:
Described is an integrated circuit that causes an input signal having one signal mode with a high state, a low state and a transition state to be dynamically level shifted to another signal mode with a respective high and low state, while minimizing a duration of the transition state of the output signal, wherein the one signal mode and the another signal mode have respectively different high and low state levels.
Method And Apparatus That Provides Differential Connections With Improved Esd Protection And Routing
Jeffrey C Dunnihoo - Bertram TX, US Chadwick N. Marak - San Jose CA, US Michael S. Evans - Los Gatos CA, US
Assignee:
California Micro Devices - Milpitas CA
International Classification:
H01L 23/62
US Classification:
257355, 257546, 257666, 257691, 257692, 257697
Abstract:
The present invention provides a single ESD device package that can be used to provide ESD protection to multiple high-speed lines, in particular multiple high-speed differential lines. The present invention has various aspects. Minute parasitic matching is achieved within a single package, and TMDS signal discontinuities are reduced by allowing uniform straight through routing. Also, the straight through routing and pin locations are matched to allow those straight routing lines to mate directly to high speed lines. Also, straight ground lines having a single via are associated with the straight through routing lines.
Harry Gee - Sunnyvale CA, US Wenjiang Zeng - Sunnyvale CA, US Jeffrey C. Dunnihoo - Bertram TX, US
Assignee:
Semiconductor Components Industries, LLC - Phoenix AZ
International Classification:
H02H 9/00
US Classification:
361 56
Abstract:
A semiconductor device is described that includes one or more electrostatic discharge (ESD) protection circuits. Each circuit comprises reverse-biased steering diodes connected in series between power rail and signal ground, a bypass Zener diode and a substrate Zener diode. The Zener diodes provide ESD protection and the steering diode cooperate with the substrate Zener diode to provide a bypass function that is substantially symmetric about the signal ground. Noise in the circuit can be shunted using internal and/or external capacitances that can be implemented as Zener diodes.
Impedance Compensated Electrostatic Discharge Circuit For Protection Of High-Speed Interfaces And Method Of Using The Same
Jeffrey C. Dunnihoo - Bertram TX, US Richard Kimoto - Fremont CA, US
Assignee:
Semiconductor Components Industries, LLC - Phoenix AZ
International Classification:
H02H 9/00
US Classification:
361 56
Abstract:
The embodiments of the apparatus and method described herein provide an integrated ESD/EOS protection solution which simplifies system PCB design for signal integrity compliance. As part of providing this solution, it is also desired to implement improved ESD/EOS protection and improved PCB routing.
Embedded Transient Scanning System Apparatus And Methodology
Pragma Design, Inc. - Bertram TX, US Jeffrey C. Dunnihoo - Bertram TX, US
Assignee:
Pragma Design, Inc. - Bertram TX
International Classification:
G01R 31/28
US Classification:
702 58, 32476203
Abstract:
Systems and methods for scanning and characterizing an integrated circuit for transient events. Embedded apparatus can detect transient events that may be incident on the integrated circuit, and moreover, identify particular nodes of the integrated circuit that are affected by the transient event. Additionally, the integrated circuit can be characterized by applying known transient pulses of varying severity to selected nodes of the integrated circuit, detecting the severity levels at which the selected nodes can fail, and storing indications pertaining to pulse severity at which selected nodes can fail. Moreover, based on the characterization, targeted protection mechanisms can be provided for nodes that are characterized as being susceptible.
Eos/Esd Association Inc. 2008 - 2019
Member
Pragma Media 2008 - 2019
Publisher
Pragma Design, Inc. 2008 - 2019
Esd Systems Architect
Nxp Semiconductors Aug 2009 - Jul 2011
Esd Systems Architecture
California Micro Devices Mar 2002 - Jun 2009
Product Architect
Education:
The University of Texas at Austin 1988 - 1992
Arlington High School 1986 - 1988
Skills:
Semiconductors Signal Integrity Ic Mixed Signal Electronics Analog Asic Circuit Design Analog Circuit Design Soc Pcb Design Debugging Simulations Verilog Embedded Systems Electrical Engineering Eda Failure Analysis Wireless Product Management