Jeffrey John Lovelace

US Patent:

6498829, Dec 24, 2002

Filed:

Jun 28, 2001

Appl. No.:

09/894511

Inventors:

Gloria E. O. Borgstahl - Toleda OH
Jeffrey J. Lovelace - Rossford OH
Edward H. Snell - Huntsville AL

Assignee:

The University of Toledo - Toledo OH

International Classification:

G01N 23207

US Classification:

378 73

Abstract:

A method and apparatus to simultaneously measure the diffraction resolution and mosaic spread of macromolecular crystals, are described. The method includes minimizing contributions of an x-ray beam to any reflection angular widths in the crystal, rapidly measuring multi reflection profiles in the crystal over a wide resolution range, evaluating and deconvoluting the Lorentz effect and beam contributions, and determining the direction in which the crystal is most perfect.