Jeffrey Keith Perkins

US Patent:

6449741, Sep 10, 2002

Filed:

Oct 30, 1998

Appl. No.:

09/183038

Inventors:

Donald V. Organ - Saratoga CA
Kenneth J. Lanier - Medway MA
Roger W. Blethen - Dover MA
H. Neil Kelly - Westwood MA
Michael G. Davis - San Jose CA
Jeffrey H. Perkins - Cambridge MA
Tommie Berry - Pleasanton CA
Phillip Burlison - Morgan Hill CA
Mark Deome - San Jose CA
Christopher J. Hannaford - South Weymouth MA
Edward J. Terrenzi - Walpole MA
David Menis - Cohasset MA
David W. Curry - Cohasset MA
Eric Rosenfeld - Ashland MA

Assignee:

LTX Corporation - Westwood MA

International Classification:

H02H 305

US Classification:

714724, 714 46

Abstract:

An electronic tester with digital, and analog, and memory test circuitry on a single platform. A test head is coupled to a device under test. The device under test can be a system-on-a-chip integrated circuit, a mixed signal integrated circuit, a digital integrated circuit, or an analog integrated circuit. Digital test circuitry applies digital test signals to the device under test coupled to the test head and receives digital outputs from the device under test in response to the digital test signals. Analog test circuitry applies analog test signals to the device under test coupled to the test head and receives analog outputs from the device under test in response to the analog test signals. Memory test circuitry applies memory test patterns to the device under test coupled to the test head and receives memory outputs from the device under test in response to the memory test patterns. A tester computer supervises the application of digital, analog, and memory test signals from the digital, analog, and memory test circuitry to the device under test such that signals applied to the device under test can be solely digital test signals, solely analog test signals, solely memory test signals, or mixed digital, analog, and memory test signals.

US Patent:

7191368, Mar 13, 2007

Filed:

Aug 22, 2001

Appl. No.:

09/938157

Inventors:

Donald V. Organ - Saratoga CA, US
Kenneth J. Lanier - Medway MA, US
Roger W. Blethen - Dover MA, US
H. Neil Kelly - Westwood MA, US
Michael G. Davis - San Jose CA, US
Jeffrey H. Perkins - Cambridge MA, US
Tommie Berry - Pleasanton CA, US
Phillip Burlison - Morgan Hill CA, US
Mark Deome - San Jose CA, US
Christopher J. Hannaford - South Weymouth MA, US
Edward J. Terrenzi - Walpole MA, US
David Menis - Cohasset MA, US
David W. Curry - Cohasset MA, US
Eric Rosenfeld - Ashland MA, US

Assignee:

LTX Corporation - Norwood MA

International Classification:

G06F 11/00

US Classification:

714 57, 714 46, 715761, 715762, 715763, 715764, 715765

Abstract:

An electronic tester with digital, and analog, and memory test circuitry on a single platform. A test head is coupled to a device under test. The device under test can be a system-on-a-chip integrated circuit, a mixed signal integrated circuit, a digital integrated circuit, or an analog integrated circuit. Digital test circuitry applies digital test signals to the device under test coupled to the test head and receives digital outputs from the device under test in response to the digital test signals. Analog test circuitry applies analog test signals to the device under test coupled to the test head and receives analog outputs from the device under test in response to the analog test signals. Memory test circuitry applies memory test patterns to the device under test coupled to the test head and receives memory outputs from the device under test in response to the memory test patterns. A tester computer supervises the application of digital, analog, and memory test signals from the digital, analog, and memory test circuitry to the device under test such that signals applied to the device under test can be solely digital test signals, solely analog test signals, solely memory test signals, or mixed digital, analog, and memory test signals.

US Patent:

20150317861, Nov 5, 2015

Filed:

Jun 26, 2015

Appl. No.:

14/752749

Inventors:

Jeffrey M. Perkins - Fort Worth TX, US

International Classification:

G07F 11/38
A47F 1/12

Abstract:

A single serving, slideable type container dispensing apparatus, manually operated horizontally through slideable guideways with interchangeable and adjustable guideway blades and a saw-tooth trough tray that accommodates cans, cartons and beverage containers various sizes, and shapes including neck-less and tapered designs.

US Patent:

20150008239, Jan 8, 2015

Filed:

Jul 8, 2013

Appl. No.:

13/987177

Inventors:

Jeffrey Michael Perkins - Fort Worth TX, US

International Classification:

G07F 11/38
A47F 1/12

US Classification:

221133, 221279

Abstract:

This invention relates to the re-design of the original Ideal Dispensing apparatus, U.S. Pat. No. 2,174,712, (1939) and U.S. Pat. No. 2,637,612, (1953). Stated patent design was a single serving, slideable type container dispensing apparatus, manually operated horizontally through slideable guideways that were permanently welded fixed, one size, guideways that included a simple pan/tray for containers, cans and cartons. The new design gives the all-around versatility with the new all metal individual interchangeable and adjustable guideway blades and a saw tooth trough tray that accommodates majority of sizes, and shapes cans, cartons and beverage containers to include neck-less, and tapered designs in todays marketplace. This said new apparatus with new trough tray magnifies a novel and unobvious design combining and optimizing the utilization of space and versatility, with ease of installation and adjustment. This is optimal for changing, adding to the guideway storage and dispensing of said containers regardless of container design.

Address:

4286 Cardinal Blvd, Port Orange, FL 32127

VIN:

1B3HB48B37D522118

Make:

DODGE

Model:

CALIBER

Year:

2007