Douglas A. Larson - Lakeville MN Joseph Jeddeloh - Blaine MN Jeffrey J. Rooney - Blaine MN
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G06F 1300
US Classification:
710119, 710107, 710244, 710240
Abstract:
One embodiment of the present invention provides a method for flexibly allocating I/O pins used for bus grant signals between bus controllers located on a semiconductor chip. The method operates by receiving a first set of grant lines from a first bus arbitration circuit. This first set of grant lines is used to grant control of a first bus to devices on the first bus. The method divides the first set of grant lines into a first subset of grant lines and a second subset of grant lines. The method also receives a second set of grant lines from a second bus arbitration circuit. This second set of grant lines is used to grant control of a second bus to devices on the second bus. The method divides the second set of grant lines into a third subset of grant lines and a fourth subset of grant lines. Next, the method selects outputs from between the first subset of grant lines and the third subset of grant lines, and drives the outputs off of the semiconductor chip through a first set of output pins. During a first mode of operation, the first subset of grant lines is selected to be driven through the first set of output pins, and during a second mode of operation the third subset of grant lines is selected to driven through the first set of output pins.
Apparatus For Flexibly Allocating Request/Grant Pins Between Multiple Bus Controllers
Douglas A. Larson - Lakeville MN Joseph Jeddeloh - NE. Blaine MN Jeffrey J. Rooney - Blaine MN
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G06F 1300
US Classification:
710107, 710240, 710 52
Abstract:
One embodiment of the present invention provides an apparatus that flexibly allocates I/O pins used for bus grant signals between bus controllers. The apparatus includes a semiconductor chip containing a first bus arbitration circuit and a second bus arbitration circuit. A first set of grant lines originates from the first bus arbitration circuit and is used to grant control of a first bus to devices on the first bus. This first set of grant lines is divided into a first subset of grant lines and a second subset of grant lines. A second set of grant lines originates from the second bus arbitration circuit and is used to grant control of a second bus to devices on the second bus. This second set of grant lines is divided into a third subset of grant lines and a fourth subset of grant lines. A selector circuit selects a plurality of outputs from between the first subset of grant lines and the third subset of grant lines. This plurality of outputs is coupled to a first set of output pins on the semiconductor chip.
A system for dynamically allocating buffers between components in a computer system is described. The system uses matched sets of bi-directional buffers to control data flow between the processor and the computer bus. The dynamic buffer allocation system allows simultaneous data transfer from the processor to the buffers, and from the buffers to the computer bus.
A system for dynamically allocating buffers between components in a computer system is described. The system uses matched sets of bi-directional buffers to control data flow between the processor and the computer bus. The dynamic buffer allocation system allows simultaneous data transfer from the processor to the buffers, and from the buffers to the computer bus.
Providing Memory Test Patterns For Dll Calibration
Travis E. Swanson - Ramsey MN, US Jeffrey J. Rooney - Blaine MN, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G01R 31/28 G06F 7/02
US Classification:
714738, 714739, 714821
Abstract:
A system and method to provide memory test patterns for the calibration of a delay locked loop (DLL) using a pseudo random bit sequence (PRBS) stored in a serial presence detect (SPD) circuit memory. The test bits stored in the SPD memory are transferred to a memory controller register (MCR) and implemented on the system data bus as test patterns that closely simulate run-time switching conditions on the system bus, so as to allow more accurate calibration of the DLL. Test data write/read operations may be performed while signals for the test patterns are present on various bit lines in the data bus so as to allow for accurate determination or adjustment of the value for the delay to be provided by the DLL to the strobe signals during memory data reading operations at run time. Memory chips may also be tested over an operating range of values using the generated test patterns.
Integrated Testing Apparatus, Systems, And Methods
Paul A. LaBerge - Shoreview MN, US Jeffrey J. Rooney - Blaine MN, US Charles K. Snodgrass - Bosie ID, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G06F 11/00 G11C 29/00 G01R 31/02 G01R 31/26
US Classification:
714738, 714723, 714704, 324763, 324765
Abstract:
Embodiments herein may enable an algorithmic pattern generator (APG) to present iterative values of one or more operational parameters to a device under test (DUT). At each iteration, one or more test patterns may be presented to the DUT. The APG may capture test results from a set of iterations of the operational parameters. The APG may also write values associated with a next operational parameter to be iterated to a test parameter configuration space within the device tester.
Programmable On-Chip Logic Analyzer Apparatus, Systems, And Methods
Kirsten S. Lunzer - Arden Hills MN, US Jeffrey J. Rooney - Blaine MN, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
H03K 19/173
US Classification:
326 38, 326 41, 326 47, 714 30, 714 31, 714 39
Abstract:
Apparatus, systems, and methods disclosed herein may cause an event trigger state machine associated with a programmable on-chip logic analyzer (POCLA) to transition to a programmable state at a programmable number of occurrences of a programmable set of events associated with a first subset of signals on a first subset of input signal paths. States associated with a second subset of signals on a second subset of input signal paths may be stored at a time relative to a transition to the programmable state if a set of storage criteria have been met. Additional embodiments are disclosed and claimed.
Programmable On-Chip Logic Analyzer Apparatus, Systems, And Methods
Apparatus, systems, and methods disclosed herein may cause an event trigger state machine associated with a programmable on-chip logic analyzer (POCLA) to transition to a programmable state at a programmable number of occurrences of a programmable set of events associated with a first subset of signals on a first subset of input signal paths. States associated with a second subset of signals on a second subset of input signal paths may be stored at a time relative to a transition to the programmable state if a set of storage criteria have been met. Additional embodiments are disclosed and claimed.
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In September 1989, Performance Lexus opened our doors as one of the first Lexus dealerships in the country. Since that first day our focus has been on “taking care of our customers” in a way that they...
Jeffrey Rooney
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Jeffrey Rooney 1990 graduate of East Central High School in San antonio, TX is on Classmates.com. See pictures, plan your class reunion and get caught up with Jeffrey and other ...
Jeffrey Rooney <c:out value="1987" />graduate of Eagle Rock High School in Los angeles, CA is on Classmates.com. See pictures, plan your class reunion and get caught up with ...
Jeffrey Rooney (1969-1973), James Berry (1972-1976), Cruz Tony (1993-1997), Kim Matthews (1986-1990), Brent Carpenter (1993-1997), Tim Winterhalter (1976-1980)