Jing S Lin

age ~51

from Potomac, MD

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Also known as:

Jing Zhai
Lin J Ing

Connected to:

Jing Lin Phones & Addresses

Potomac, MD
Union City, CA
34659 Lang Ave, Fremont, CA 94555
Berkeley, CA
Richmond, CA
Los Angeles, CA
Anaheim, CA
Baldwin Park, CA

Education

School / High School:

Cornell Law School

Ranks

Licence:

New York - Currently registered
Date:

2007

Specialities

Buyer's Agent • Listing Agent

Lawyers & Attorneys

Jing Lin - Lawyer

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Address:

Skadden Arps Slate Meagher & Flom
37404748xx (Office)

Licenses:

New York - Currently registered 2007

Education:

Cornell Law School

Isbn (Books And Publications)

The Red Guards' Path to Violence: Political, Educational, and Psychological Factors

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Author
Jing Lin

ISBN #
0275938727

Education in Post-Mao China

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Author
Jing Lin

ISBN #
0275942708

The Opening of the Chinese Mind : Democratic Changes in China since 1978

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Author
Jing Lin

ISBN #
0275945944

Social Transformation and Private Education in China

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Author
Jing Lin

ISBN #
0275955907

Name / Title

Company / Classification

Phones & Addresses

Jing Lin
Owner

Lin, Jing
Television Station

1907 Gatewood Pl, Silver Spring, MD 20903

Jing J. Lin
Principal

Jing Jin Lin Plumbing Co
Plumbing/Heating/Air Cond Contractor

42 Lee Ave, San Francisco, CA 94112
4153342928

Jing Lin
Bioinformatics Developer, Pilot Plant Biotechnology Unit Core Fac

U S Dept of Health and Human Services
Associations

200 Independence Ave SW, Washington, DC 20201
900 2 St NE #211, Washington, DC 20201
2026190257, 2024089520

Jing Lin

Spoil Yourself, LLC
Personal Services-Massage

100 W Broadway, Glendale, CA 91210
5147 Xavier Cmn, Fremont, CA 94555
130 14 St, Oakland, CA 94612
5108930803

Jing Lin

LIN'S RESTAURANT LC

Jing Lin

EASTERN BUFFET LLC

Jing Lin

Signaldt Biosystems, LLC
Biotech · Commercial Physical Research

39 California Ave, Pleasanton, CA 94566

Jing Lin
Principal

Feifei Day Spa Llp
Physical Fitness Facility

9075 Shady Grv Ct, Gaithersburg, MD 20877

Us Patents

Method For Automatically Generating Checkers For Finding Functional Defects In A Description Of A Circuit
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US Patent:

6609229, Aug 19, 2003
Filed:

Aug 9, 2000
Appl. No.:

09/635598
Inventors:

Tai An Ly - Fremont CA
Jean-Charles Giomi - Menlo Park CA
Kalyana C. Mulam - San Jose CA
Paul Andrew Wilcox - Palo Alto CA
David Lansing Dill - Redwood City CA
Paul Estrada, II - Los Altos CA
Jing Chyuarn Lin - Sunnyvale CA
Robert Kristianto Mardjuki - Danville CA
Ping Fai Yeung - San Jose CA
Assignee:

O-In Design Automation, Inc. - San Jose CA
International Classification:

G06F 1750
US Classification:

716 4, 703 14, 703 17
Abstract:

A programmed computer generates descriptions of circuits (called âcheckersâ) that flag functional defects in a description of a circuit undergoing functional verification. The programmed computer automatically converts the circuits description into a graph, automatically examines the graph for instances of a predetermined arrangement of nodes and connections, and automatically generates instructions that flag a behavior of a device represented by the instance in conformance with a known defective behavior. The checkers can be used during simulation or emulation of the circuit, or during operation of the circuit in a semiconductor die The circuits description can be in Verilog or VHDL and the automatically generated checkers can also be described in Verilog or VHDL. Therefore, the checkers can co-simulate with the circuit, monitoring the simulated operation of the circuit and flagging detective behavior. The programmed computer can automatically determine load conditions of registers in the circuit and automatically generate checkers to flag data loss in the registers.

Method For Automatically Searching For Functional Defects In A Description Of A Circuit
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US Patent:

6885983, Apr 26, 2005
Filed:

May 4, 2001
Appl. No.:

09/849005
Inventors:

Robert Kristianto Mardjuki - Danville CA, US
David Lansing Dill - Redwood City CA, US
Jing Chyuarn Lin - Sunnyvale CA, US
Ping Fai Yeung - San Jose CA, US
Paul Il Estrada - Los Alto CA, US
Jean-Charles Giomi - Menlo Park CA, US
Tai An Ly - Fremont CA, US
Kalyana C. Mulam - San Jose CA, US
Paul Andrew Wilcox - Palo Alto CA, US
Assignee:

Mentor Graphics Corporation - Wilsonville OR
International Classification:

G06F017/50
US Classification:

703 14, 703 15, 703 16, 716 4
Abstract:

A programmed computer searches for functional defects in a description of a circuit undergoing functional verification in the following manner. The programmed computer simulates the functional behavior of the circuit in response to a test vector, automatically restores the state of the simulation without causing the simulation to pass through a reset state, and then simulates the functional behavior of the circuit in response to another test vector. A predetermined rule can be used to identify test vectors to be simulated, and the predetermined rule can depend upon a measure of functional verification, including the number of times during simulation when a first state transition is performed by a first controller at the same time as a second state transition is performed by a second controller. During simulation of the test vectors, manually generated tests or automatically generated checkers can monitor portions of the circuit for defective behavior.

Method For Automatically Generating Checkers For Finding Functional Defects In A Description Of Circuit
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US Patent:

7007249, Feb 28, 2006
Filed:

Jan 20, 2003
Appl. No.:

10/348116
Inventors:

Tai An Ly - Fremont CA, US
Jean-Charles Giomi - Menlo Park CA, US
Kalyana C. Mulam - San Jose CA, US
Paul Andrew Wilcox - Palo Alto CA, US
David Lansing Dill - Redwood City CA, US
Paul II Estrada - Los Alto CA, US
Jing Chyuarn Lin - Sunnyvale CA, US
Robert Kristianto Mardjuki - Danville CA, US
Ping Fai Yeung - San Jose CA, US
International Classification:

G06F 17/50
US Classification:

716 4, 716 5, 703 13, 703 20, 703 23, 703 28
Abstract:

A programmed computer generates descriptions of circuits (called “checkers”) that flag functional defects in a description of a circuit undergoing functional verification. The programmed computer automatically converts the circuit's description into a graph, automatically examines the graph for instances of a predetermined arrangement of nodes and connections, and automatically generates instructions that flag a behavior of a device represented by the instance in conformance with a known defective behavior. The checkers can be used during simulation or emulation of the circuit, or during operation of the circuit in a semiconductor die. The circuit's description can be in Verilog or VHDL and the automatically generated checkers can also be described in Verilog or VHDL. Therefore, the checkers can co-simulate with the circuit, monitoring the simulated operation of the circuit and flagging defective behavior. The programmed computer can automatically determine load conditions of registers in the circuit and automatically generate checkers to flag data loss in the registers.

Method For Automatically Searching For Functional Defects In A Description Of A Circuit
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US Patent:

7478028, Jan 13, 2009
Filed:

Jan 12, 2005
Appl. No.:

11/035275
Inventors:

Robert Kristianto Mardjuki - Danville CA, US
David Lansing Dill - Redwood City CA, US
Jing Chyuarn Lin - Sunnyvale CA, US
Ping Fai Yeung - San Jose CA, US
Paul II Estrada - Los Alto CA, US
Jean-Charles Giomi - Menlo Park CA, US
Tai An Ly - Fremont CA, US
Kalyana C. Mulam - San Jose CA, US
Paul Andrew Wilcox - Palo Alto CA, US
International Classification:

G06F 17/50
US Classification:

703 14, 703 15, 703 16, 716 4
Abstract:

A programmed computer searches for functional defects in a description of a circuit undergoing functional verification in the following manner. The programmed computer simulates the functional behavior of the circuit in response to a test vector, automatically restores the state of the simulation without causing the simulation to pass through a reset state, and then simulates the functional behavior of the circuit in response to another test vector. A predetermined rule can be used to identify test vectors to be simulated, and the predetermined rule can depend upon a measure of functional verification, including the number of times during simulation when a first state transition is performed by a first-controller at the same time as a second state transition is performed by a second controller. During simulation of the test vectors, manually generated tests or automatically generated checkers can monitor portions of the circuit for defective behavior.

Engineering Change Order Process Optimization
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US Patent:

7552409, Jun 23, 2009
Filed:

Jun 7, 2005
Appl. No.:

11/147814
Inventors:

Kayhan Kucukcakar - Sunnyvale CA, US
Jing C. Lin - Cupertino CA, US
Jinan Lou - Cupertino CA, US
Assignee:

Synopsys, Inc. - Mountain View CA
International Classification:

G06F 17/50
US Classification:

716 5, 716 6, 703 16
Abstract:

A method for reaching signoff closure in an ECO (engineering change order) process involves the use of violation context data from the signoff tool as the basis for design layout modifications in an implementation tool. The violation context data includes violation information other than violation location/path information. Because the signoff tool, and more specifically, the signoff algorithm used by that tool is the most accurate model of actual IC behavior, the use of violation context data generated by the signoff tool to implement changes to the design layout will generally produce appropriate and effective results. By accessing this violation context data from the signoff tool, an implementation tool need not rely on its less accurate implementation analysis to determine the optimal design layout modifications for correcting violations detected by the signoff tool.

Vapor Deposition Of Tungsten Materials
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US Patent:

7732327, Jun 8, 2010
Filed:

Sep 26, 2008
Appl. No.:

12/239046
Inventors:

Avgerinos V. Gelatos - Redwood City CA, US
Kai Wu - Palo Alto CA, US
Amit Khandelwal - Santa Clara CA, US
Ross Marshall - Sunnyvale CA, US
Emily Renuart - Santa Clara CA, US
Wing-Cheong Gilbert Lai - Santa Clara CA, US
Jing Lin - Mountain View CA, US
Assignee:

Applied Materials, Inc. - Santa Clara CA
International Classification:

H01L 21/4763
US Classification:

438649, 438683, 427255392, 257E21165
Abstract:

Embodiments of the invention provide an improved process for depositing tungsten-containing materials. The process utilizes soak processes and vapor deposition processes to provide tungsten films having significantly improved surface uniformity while increasing the production level throughput. In one embodiment, a method is provided which includes depositing a tungsten silicide layer on the substrate by exposing the substrate to a continuous flow of a silicon precursor while also exposing the substrate to intermittent pulses of a tungsten precursor. The method further provides that the substrate is exposed to the silicon and tungsten precursors which have a silicon/tungsten precursor flow rate ratio of greater than 1, for example, about 2, about 3, or greater. Subsequently, the method provides depositing a tungsten nitride layer on the tungsten suicide layer, depositing a tungsten nucleation layer on the tungsten nitride layer, and depositing a tungsten bulk layer on the tungsten nucleation layer.

Pre-Route And Post-Route Net Correlation With Defined Patterns
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US Patent:

8336015, Dec 18, 2012
Filed:

Jan 29, 2010
Appl. No.:

12/697142
Inventors:

Chi-Min Chu - Cupertino CA, US
Jing C. Lin - Cupertino CA, US
Assignee:

Synopsys, Inc. - Mountain View CA
International Classification:

G06F 17/50
US Classification:

716132
Abstract:

A method of improving pre-route and post-route correlation can include performing an initial placement, virtual routing, and lower-effort actual routing for the design. The results of the virtual routing and lower-effort actual routing can be compared to identify nets having miscorrelation. Based on the nets having at least a predetermined miscorrelation, one or more patterns can be defined. At this point, net routing constraints and/or scaling factors can be assigned to nets matching the defined patterns. These net routing constraints and scaling factors can be applied to the nets of the design that match the patterns. Optimized placement and a higher-effort actual routing of the design can be performed using the nets with the applied net routing constraints and scaling factors. An optimized, routed design can be generated as output.

System And User Interface For Machine-Assisted Human Labeling Of Pixels In An Image
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US Patent:

8452086, May 28, 2013
Filed:

Jul 10, 2009
Appl. No.:

12/500928
Inventors:

Eric Saund - San Carlos CA, US
Jing Lin - Saratoga CA, US
Prateek Sarkar - Sunnyvale CA, US
Assignee:

Palo Alto Research Center Incorporated - Palo Alto CA
International Classification:

G06K 9/34
US Classification:

382164, 715810
Abstract:

A user interface and method is embodied on a computer readable medium and executable on a computer. The user interface is a labeler which labels only foreground pixels of an image stored in a computing environment. The labeler operates in a Region mode/state and Brush mode/state, and includes a Tentative mode that permits an assigned label to be changed after pixels have been selected. Groups of pixels may be selected for labeling at once by a point-and-click command, and a pixel may belong to one or more groups of pixels which are stored in memory as image layers. The groups are formed dynamically by user selection actions, and/or through automatic recognition algorithms. Pixels already labeled with certain labels may be locked to not be altered by additional labeling operations. Unassigned pixels may be highlighted to increase the ease at which they are identified in an image. Comparisons between labeled images are undertaken to indicate differences between different groundtruth labeling.

License Records

Jing Lin

License #:

58175 - Expired

Category:

Nursing

Issued Date:

Dec 20, 2000

Effective Date:

Jan 3, 2003

Expiration Date:

Oct 31, 2002

Type:

Registered Nurse

Resumes

Jing Lin New York, NY

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Work:

Sushi Para
Washington, DC
Jul 2013 to Aug 2013
Manager Assistant Fuzhou Jia Ao Training School
Fuzhou, CN
Jul 2010 to Sep 2010
Teaching Assistant Master Kong
Fuqing, CN
Sep 2008 to Jun 2009
Sales Representative

Education:

Arkansas State University
Jonesboro, AR
May 2013
Master of Business Administration Fujian Normal University
Jul 2010
Bachelor of Marketing

Skills:

MS Office, Bilingual

Jing Lin Ellicott City, MD

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Work:

National Institutes of Health (NIH)- National Cancer Institute (NCI)

2011 to 2000
Fellow SABIOSCIENCES, A Qiagen Company
Frederick, MD
2008 to 2010
Staff Scientist UNIVERSITY OF MARYLAND, BALTIMORE
Baltimore, MD
2006 to 2007
Postdoctoral Fellow UNIVERSITY OF MARYLAND, BALTIMORE
Baltimore, MD
2002 to 2006
Graduate Research Assistant

Education:

University of Maryland
Baltimore, MD
2006
Ph.D. in Biochemistry and Molecular Biology

Skills:

Molecule biology: Plasmid purification, genomic DNA and RNA isolation and quantitation, Gateway cloning, subcloning, plasmid/retroviral vector construction, DNA recombination, PCR (overlap PCR, real-time PCR, RT-PCR), Site-directed mutagenesis, DNA restriction analysis, Co-immunoprecipitations, Electromobility shift assay (EMSA), SDS-PAGE, Western blotting, Southern blot, Northern blot, North-westerns, chromatin immunoprecipitation (ChIP), genotyping. Cell biology: Cell culture (embryonic stem cell, hematopoietic cells, primary mouse embryonic fibroblasts (MEF), primary hepatocytes cells isolation and culture, cancer cells and insect cells), freezing/thawing, characterizing, and differentiating primary mouse cells. Cell based assay: Cell transfection, stable production cell lines development, gene overexpression, gene silencing through antisense expression (siRNA and shRNA), dual-luciferase assay, CAT assay, MTT colorimetric assay, Internucleosomal fragmentation assay. Protein expression and purification techniques: Recombinant protein expression from E.coli & mammalian cells; Expertise with protein analytical and assay development techniques including HPLC, affinity chromatography, hydrophobic interaction (HIC), ion exchange (IEX), reversed phase chromatography (RP) and size exclusion (SEC). Virology: Lentiviral expression vector design and construction, lentivirus production and titration, virus isolation, propagation, characterization, purification and titration, viral neutralization assay such as Plaque Reduction Neutralization Test (PRNT), Micro-cytopathic effect neutralization test (MCPENT). Immunology: Rodent handling & injection techniques, Flow cytometry (FACS); antibody production and purification, antibody and antibody titer characterization, label antibody by FITC and HRP, Cytotoxic T lymphocyte (CTL), lymphocyte transformation test, immunofluorescence staining, IFA, ELISA, immunocytochemistry, immunohistochemistry, hemagglutination assay (HA) & hemagglutination inhibition assay (HAI). Biochemistry: in vitro peptide and protein phosphorylation, liposome preparation and test. Instrumentation: LSR II Sorp and FACScantoII for FACS, Zeiss LSM 510 & LSM 710 for confocal microscope, fluorescent microscope, real-time PCR machine, spectrophotometers, spectrofluorometer, sonication devices and ultracentrifuges etc.

Jing Lin Fairfax, VA

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Work:

Suburban Hospital

Mar 2014 to 2000
Registered Nurse I Suburban Hospital
Bethesda, MD
Sep 2013 to Dec 2013
Adult ICU Intern Wei Liu, M.D
Fairfax, VA
May 2008 to May 2011
Medical Office Assistant

Education:

Marymount University
Arlington, VA
Dec 2013
Bachelor of Science in Nursing

Skills:

Bilingual in English and Chinese; Microsoft Office Suite; Medical Terminology; Electronic Medical Records

Jing Lin Fremont, CA

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Work:

Super Buffet
San Jose, CA
Feb 2014 to Jul 2014
Waitress/Cashier

Education:

Foothill College
San Jose, CA
2012 to 2014
BA in Business

Jing Lin Fairfax, VA

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Work:

Acute Medical

Mar 2014 to 2000
Registered Nurse Acute Medical
Bethesda, MD
Sep 2013 to Dec 2013
Intern Wei Liu, M.D
Fairfax, VA
May 2008 to May 2011
Medical Receptionist

Education:

Marymount University
Arlington, VA
Dec 2013
Bachelor of Science in Nursing

Medicine Doctors

Jing Lin

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Specialties:

Neonatal-Perinatal Medicine

Work:

Newborn Medicine AssociatesMount Sinai Hospital Newborn Medicine
1184 5 Ave STE 341, New York, NY 10029
2122415446 (phone), 2125345207 (fax)

Education:

Medical School
Wenzhou Med Coll, Wenzhou, Zhejiang, China
Graduated: 1983

Languages:

English
Spanish

Description:

Dr. Lin graduated from the Wenzhou Med Coll, Wenzhou, Zhejiang, China in 1983. He works in New York, NY and specializes in Neonatal-Perinatal Medicine. Dr. Lin is affiliated with Mount Sinai Medical Center.