Joel R Bailey

US Patent:

7117274, Oct 3, 2006

Filed:

Mar 5, 2004

Appl. No.:

10/794991

Inventors:

Daniel Lee Avery - Chandler AZ, US
Michael J. Smith - Chandler AZ, US
Joel Patrick Bailey - Chandler AZ, US
Jerry Schumacher - Gilbert AZ, US

Assignee:

Koninklijke Philips Electronics N.V. - Eindhoven

International Classification:

G01R 31/28

US Classification:

710 19, 714 43, 714738

Abstract:

A circuit testing and control approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths. According to an example embodiment of the present invention, graphical user interface (GUI) () includes stored computer-executable code that, when executed, causes a micro-computer circuit to send configuration signals to a microcontroller (). A configurable circuit () coupled to the microcontroller is then configured by the microcontroller, in response to the configuration signals, for routing test signals using controllable switches. In one implementation, the configurable circuit includes circuits on inter-connectable circuit boards (), with sense nodes for detecting the presence of an inter-connectable circuit board coupled to another. In response to the detected presence (or lack thereof), the controllable switches control the routing of the test signals between the inter-connectable circuit boards. The configuration signals are used for one or more of actively controlling the microcontroller, programming the microcontroller (e. g.

US Patent:

7219278, May 15, 2007

Filed:

Mar 8, 2004

Appl. No.:

10/796484

Inventors:

Daniel Lee Avery - Chandler AZ, US
Michael J. Smith - Chandler AZ, US
Joel Patrick Bailey - Chandler AZ, US
Randall Pendley - Tempe AZ, US

Assignee:

NXP B.V. - Eindhoven

International Classification:

G01R 31/28
H04L 12/26

US Classification:

714724, 370251

Abstract:

A circuit testing approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths. According to an example embodiment of the present invention, a configurator arrangement () is programmed to control a configured circuit (), the control including automatically setting switches () on the configured circuit. In one implementation, the configurator arrangement is programmed to automatically detect test signals (i. e. , digital and/or JTAG test signals) and to control switches () for routing test data along a test circuit path. With this approach, manual switching for routing the test signals is not necessary, which has been found to be useful in applications where access to the circuit paths for switching is difficult or impossible. In another implementation, a communications link () passes signals between the configurator arrangement and a user interface (), including control signals from the user interface and data from the configured circuit. The configurator arrangement () is further controllable (i. e.

US Patent:

20040193979, Sep 30, 2004

Filed:

Mar 8, 2004

Appl. No.:

10/796480

Inventors:

Daniel Avery - Chandler AZ, US
Joel Bailey - Chandler AZ, US
Randall Pendley - Tempe AZ, US
Allyn Farmer - Scottsdale AZ, US

Assignee:

Koninklijke Philips Electronics N.V.

International Classification:

G01R031/28

US Classification:

714/724000

Abstract:

A circuit testing approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths. According to an example embodiment of the present invention, a configurator arrangement () controls a configured circuit () by monitoring test signals and, in response, setting switches () on the configured circuit. In one implementation, the configurator circuit arrangement is programmed to automatically detect test signals (i.e., digital and/or JTAG test signals) and to control switches () for routing test data along a test circuit path on the configured circuit and/or between the configured circuit and an external circuit. With this approach, manual switching for routing the test signals is not necessary, which has been found to be useful in applications where access to the circuit paths for switching is difficult or impossible. In another implementation, a communications link () passes signals between the configurator circuit arrangement () and a user interface (), including control signals from the user interface and data from the configured circuit (). The configurator circuit arrangement () is further controllable (i.e., manually) or programmable by signals received from the user interface ().

US Patent:

20060200715, Sep 7, 2006

Filed:

Feb 28, 2004

Appl. No.:

10/548993

Inventors:

Daniel Avery - Chandler AZ, US
Joel Bailey - Chandler AZ, US

Assignee:

KONINKLIJKE PHILIPS ELECTRONICS N.V. - Eindhoven

International Classification:

G01R 31/28

US Classification:

714724000

Abstract:

A circuit testing approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths (). According to an example embodiment of the present invention, a microcontroller () is programmed to monitor input nodes () using an interrupt routine for automatically detecting test signals (i.e., digital and/or JTAG test signals). Upon the detection of the test signals, the microcontroller controls a controllable switch () for routing the test data along one of the test circuit paths. With this approach, manual switching for routing the test signals is not necessary, which has been found to be useful in applications where access to the circuit paths for switching is difficult or impossible.