Johan J Ericsson

US Patent:

7013229, Mar 14, 2006

Filed:

Nov 13, 2003

Appl. No.:

10/712645

Inventors:

Kenneth H. Wong - Santa Rosa CA, US
James C. Liu - Santa Rosa CA, US
Johan J. Ericsson - Windsor CA, US

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

G01R 35/00

US Classification:

702107, 702 85

Abstract:

Calibration is performed for the testing of a device under test. A first port of the device under test is connected to a port of a calibration module. A second port of the device under test is connected to a first port of a device tester. A third port of the device under test is connected to a second port of a device tester. The device tester performs measurements by the device tester to obtain calibration parameters. In response to commands from the device tester, the calibration module changes termination values at the port of the calibration module. The changing of the termination values is performed without physical disconnection of the port of the calibration module from the first port of the device under test.

US Patent:

7868607, Jan 11, 2011

Filed:

Apr 20, 2007

Appl. No.:

11/738051

Inventors:

Joel P. Dunsmore - Sebastopol CA, US
Sean Hubert - Santa Rosa CA, US
Loren C. Betts - Rohnert Park CA, US
Johan Ericsson - Windsor CA, US

Assignee:

Agilent Technologies, Inc. - Santa Clara CA

International Classification:

G01R 23/14
G01R 27/28

US Classification:

324 7623, 324 7643, 324 7652, 324617

Abstract:

A method is presented where the phase trace is offset for each sweep such that the first point is always at zero degrees. The resulting traces are then averaged. The average reduces the noise in the phase trace and results in a less noisy group delay trace.

US Patent:

20030006987, Jan 9, 2003

Filed:

Jun 27, 2001

Appl. No.:

09/894251

Inventors:

Johan Ericsson - Windsor CA, US
Dara Sariaslani - Santa Rosa CA, US
Joyjeet Bhowmik - Santa Rosa CA, US
Joel Dunsmore - Sebastopol CA, US

International Classification:

G06T011/20

US Classification:

345/440000

Abstract:

A graphical indicator to assist a user in adjusting the value of a parameter to a target value. The graphical indicator has target value indicia that represents a target value of the parameter, and measured value indicia that represents a measured value of the parameter. A change in a measured value of the parameter relative to the target value is represented by a first corresponding amount of movement of the measured value indicia relative to the target value indicia when the measured value is within a first span of parameter values, and a second, different corresponding amount of movement of the measured value indicia relative to the target value indicia when the measured value is within a second span of parameter values. The graphical indicator provides increased sensitivity to changes in the measured value of the parameter as the measured value becomes closer to the target value of the parameter.

US Patent:

20140306719, Oct 16, 2014

Filed:

Apr 16, 2013

Appl. No.:

13/863721

Inventors:

- Loveland CO, US
Johan ERICSSON - Windsor CA, US

Assignee:

AGILENT TECHNOLOGIES, INC. - Loveland CO

International Classification:

G01R 35/00

US Classification:

324601

Abstract:

A method of calibrating a test instrument comprises determining a first response of a calibration device on the test instrument over a first set of operating ranges, determining a derived second response of the calibration device on the test instrument over a second set of operating ranges based on the first response, measuring the second response of the calibration device on the test instrument over the second set of operating ranges, and determining correction factors of the test instrument for the second set of operating ranges based on a comparison between the measured second response and the derived second response.