John S Greig

US Patent:

44235054, Dec 27, 1983

Filed:

Nov 23, 1981

Appl. No.:

6/323867

Inventors:

John H. Greig - Massapequa NY

Assignee:

Loral Corp. - Yonkers NY

International Classification:

H04B 156

US Classification:

370 32

Abstract:

An adaptive canceller construction for cancelling signals received by a radio receiver operating in close proximity to a transmitter having means for extending the usefulness of the device over a wide band of frequencies. The canceller is provided with a memory which will remember the adopted parameter from one time in a given band to the next, so that as a jammer frequency jumps back and forth among several narrow frequency bands, the canceller will jump among a corresponding set of remembered parameters.

US Patent:

41018303, Jul 18, 1978

Filed:

Feb 15, 1977

Appl. No.:

5/768824

Inventors:

John H. Greig - Massapequa NY

Assignee:

MSI Electronics Inc. - Woodside NY

International Classification:

G01R 106
G01R 3122
H01R 304

US Classification:

324158F

Abstract:

The disclosed apparatus provides a mercury electrode for making non-destructive tests, especially for Schottky-diode tests of semi-conductors such as silicon. By developing vacuum under a test wafer on a support, a column of mercury is drawn into contact with the test wafer through a bore in the support that accurately establishes the area of the contact. The vacuum system also holds the test wafer securely in position, it avoids spillage of mercury, and additional circuit-completing contact can be made to the wafer with independently controlled pressure.

US Patent:

RE320242, Nov 5, 1985

Filed:

Jun 21, 1979

Appl. No.:

6/050695

Inventors:

John H. Greig - Massapequa NY

Assignee:

MSI Electronics Inc. - Woodside NY

International Classification:

G01R 106
G01R 3102

US Classification:

324158F

Abstract:

The disclosed apparatus provides a mercury electrode for making non-destructive tests, especially for Schottky-diode tests of semi-conductors such as silicon. By developing vacuum under a test wafer on a support, a column of mercury is drawn into contact with the test wafer through a bore in the support that accurately establishes the area of the contact. The vacuum system also holds the test wafer securely in position, it avoids spillage of mercury, and additional circuit-completing contact can be made to the wafer with independently controlled pressure.