John L Kitchen

US Patent:

8335904, Dec 18, 2012

Filed:

Dec 30, 2008

Appl. No.:

12/317910

Inventors:

John Kitchen - Westborough MA, US
Amnon Naamad - Brookline MA, US
Alexandr Veprinsky - Brookline MA, US

Assignee:

EMC Corporation - Hopkinton MA

International Classification:

G06F 12/00
G06F 13/00
G06F 13/28
G06F 7/00
G06F 17/30

US Classification:

711170, 711154, 711173, 711E12001, 707797

Abstract:

Measuring access rates of a computer memory include subdividing the memory into subsections, monitoring access rates for each of the subsections, in response to a subsection having a relatively high access rate, subdividing the subsection into multiple subsections that are separately monitored, and, in response to at least two adjacent subsections having a relatively low access rate, merging the at least two subsections into a single subsection. Monitoring access rates may include monitoring at least one of the following operational parameters: number of data accesses, number of cache accesses, number of cache misses, number of read accesses, number of write accesses, and ratio of read accesses to write accesses. Two or more operational parameters may be used and the operational parameters may be weighted.