John F Kitchin

US Patent:

7039884, May 2, 2006

Filed:

Oct 11, 2002

Appl. No.:

10/269609

Inventors:

John F. Kitchin - Shrewsbury MA, US

Assignee:

Hewlett-Packard Development Company, L.P. - Houston TX

International Classification:

G06F 17/50

US Classification:

716 4, 382151

Abstract:

A method of extracting circuit parameters from picosecond-scale photon timing measurements is disclosed. In one embodiment, the method is implemented by a system that comprises a photomultiplier, a data acquirer, and a processing module. The photomultiplier detects photons emitted from current-carrying channels in an integrated circuit, and associates a detection position and a detection time with each detected photon. The data acquirer receives position and time signals from the photomultiplier, and further receives a trigger signal. The data acquirer determines a relative detection time for each photon by combining the time and trigger signals. The data acquirer gradually compiles the photon detection data and makes it available to the processing module. The processing module responsively determines optimal values for a parameterized model of the data. The model is preferably based on non-homogeneous Poisson process statistics, and may employ a maximum likelihood approach to estimating the optimal values.

US Patent:

7057182, Jun 6, 2006

Filed:

Mar 12, 2004

Appl. No.:

10/799170

Inventors:

John F. Kitchin - Shrewsbury MA, US

Assignee:

Hewlett-Packard Development Company, L.P. - Houston TX

International Classification:

G01T 1/24
G01T 1/20

US Classification:

25037011, 25033906, 716 4

Abstract:

Embodiments of the invention may reduce timing and spatial distortion in Picosecond Imaging and Circuit Analysis (PICA). In one embodiment, a method of determining distortion in a circuit image comprises: defining potential photon emission areas in the circuit image using a layout database, determining ideal photon emissions over the potential photon emission areas, measuring photon emissions for the potential photon emission areas, comparing the ideal photon emission with the measured photon emissions, and producing a mathematical model that predicts the amount of spatial distortion over the potential photon emission area.