John L Roy

US Patent:

20070046934, Mar 1, 2007

Filed:

Aug 26, 2005

Appl. No.:

11/213057

Inventors:

John Roy - Del Mar CA, US

Assignee:

New Wave Research, Inc. - Fremont CA

International Classification:

G01J 3/30

US Classification:

356318000, 356072000

Abstract:

A system is described that combines an optical spectrometer and a particle analysis spectrometer for simultaneous and/or sequential analysis of a sample placed in a sample chamber. A laser resonator generates a light beam on the sample in the sample chamber to produce a plasma formation and an aerosol formation. The optical spectrometer (spectrophotometer) analyzes a plasma formation generated from the sample surface of the sample, qualifies and/or quantifies and records chemical data of the sample. The particle analysis spectrometer analyzes an aerosol formation generated from the sample in the sample chamber, and qualifies and/or quantifies and records data of the sample. The combination of the optical spectrometer and the particle analysis spectrometer in the system enables simultaneous and/or sequential analysis, qualification and/or quantification, and recording of the chemical and physical data derived from the transfer of laser energy into a solid, liquid or gas.