John F Sweeney

US Patent:

7694238, Apr 6, 2010

Filed:

Mar 22, 2004

Appl. No.:

10/806571

Inventors:

Mark Gibson - Arlington MA, US
James C. Wilkinson - Andover MA, US
John Sweeney - Acton MA, US
Seetharam Misro - Pune, IN

Assignee:

SolidWorks Corporation - Concord MA

International Classification:

G06F 3/00
G06F 9/44

US Classification:

715848, 715849, 715850, 715851, 715852, 717108

Abstract:

Selecting an obscured object of a computer-generated model consisting of a plurality of objects displayed on a computer screen includes receiving input data interpreted as an instruction to change a visibility characteristic of a first one of the plurality of objects (the first one of the objects obscuring another of the objects, and the first object being determined based on the location of an on-screen cursor), and modifying a visibility characteristic of the first object to cause another one of the objects to become discernable and selectable.

US Patent:

48946052, Jan 16, 1990

Filed:

Feb 24, 1988

Appl. No.:

7/159757

Inventors:

Diethelm Ringleb - Andover MA
Reinhard Schumann - Stow MA
Elsworth Stearns - Hudson MA
Tom Stylianos - Acton MA
John Sweeney - Derry NH

Assignee:

Digital Equipment Corporation - Maynard MA

International Classification:

G01R 2702
G01R 3128

US Classification:

324537

Abstract:

A method of performing continuity testing of individual lead sets bonded to an integrated semiconductor component with a continuity test circuit fabricated on the component. The continuity test circuit includes a plurality of current gates, each of which is associated with a different semiconductor component contact pad a lead set is bonded to. Each current gate includes a first terminal connected to the associated contact pad and a second terminal connected to a common conductor all the current gate second terminals are connected to. The common conductor terminates at a semiconductor component contact test pad a lead set is bonded to. Whenever a test signal is applied to either the first or second terminal of a current gate, a measurable response signal is generated by the current gate over the other terminal. Continuity testing of the lead sets bonded to the chip is performed by applying a test signal to either a wiring board conductor connected to the lead set being tested or a wiring board conductor connected to the lead set connected to the semicondcutor component test contact pad. A test probe is then applied to the board conductor the test signal is not applied to.

US Patent:

20200167724, May 28, 2020

Filed:

Nov 26, 2019

Appl. No.:

16/695736

Inventors:

- Sunnyvale CA, US
John Sweeney - Cambridge MA, US
Francis Carter Wheatley - Minneapolis MN, US
Marc Albert Held - Boston MA, US

International Classification:

G06Q 10/08
G06Q 10/06
H04W 4/029
H04W 4/021
H04B 17/318

Abstract:

Systems and methods are described for a wireless asset-tracking system that enables automated continuous characterization of aspects of shipment flow through a supply chain. In various embodiments, modular wireless tracking devices traveling with shipments report location and other data to a computational back end. The data are processed by analytic software running on the back end, which produces outputs such as supply-chain maps and metrics. The back-end software monitors for anomalies (e.g., delays, diversions) and notifies the user of prominent issues. In addition, the software remotely manages power consumption by trackers. It may also indicate opportunities for improving the efficiency of the supply chain.