John Eric Tkaczyk

US Patent:

6395815, May 28, 2002

Filed:

Feb 11, 2000

Appl. No.:

09/503617

Inventors:

John Eric Tkaczyk - Delanson NY
Frederic Joseph Klug - Schenectady NY
Jayantha Amarasekera - Clifton Park NY
Chris Allen Sumpter - Scotia NY

Assignee:

General Electric Company - Schenectady NY

International Classification:

C08K 334

US Classification:

524449

Abstract:

A high temperature insulating composite composition comprising at least one ground silicate mineral and at least one silicone polymer. The at least one ground silicate mineral is at least one mineral selected from the group of olivine group; garnet group; aluminosilicates; ring silicates; chain silicates; and sheet silicates. The high temperature insulating material has particular usefulness for insulating electrical wires.

US Patent:

6470071, Oct 22, 2002

Filed:

Jan 31, 2001

Appl. No.:

09/774548

Inventors:

Richard Dudley Baertsch - Scotia NY
Walter Vincent Dixon - Delanson NY
Daniel Arthur Staver - Scotia NY
Nick Andrew Van Stralen - Ballston Lake NY
Robert Gideon Wodnicki - Schenectady NY
John Eric Tkaczyk - Delanson NY

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01N 23083

US Classification:

378 62, 378 4, 378901, 378 37

Abstract:

A real time data acquisition system includes a personal computer and a detector framing node cooperating to control generation of radiation and control radiographic detection. Data is acquired by a detector framing node and communicated independently of a non-real time operating system running on a host computer. The detector framing node controls events in real time according to an event instruction sequence and communicates received radioscopic data to a host memory. Data is received from a selected flat panel detector of a plurality of different flat panel detectors. The data is received as single frames or continuous frames before communication to the host memory.

US Patent:

6621887, Sep 16, 2003

Filed:

Oct 15, 2001

Appl. No.:

09/977474

Inventors:

Douglas Albagli - Clifton Park NY
Brian David Yanoff - Schenectady NY
John Eric Tkaczyk - Delanson NY
George Edward Possin - Niskayuna NY
Ping Xue - Cottage Grove WI

Assignee:

General Electric Company - Schenectady NY

International Classification:

G03C 900

US Classification:

378 42, 378 9811, 2502081

Abstract:

In one aspect of the invention a method for processing a fluoroscopic image is provided. The method includes scanning an object with an imaging system including at least one radiation source and at least one detector array, acquiring a plurality of dark images to generate a baseline image, acquiring a plurality of lag images subsequent to the baseline image, determining a plurality of parameters of a power law using at least one lag image and at least one baseline image, and performing a logâlog extrapolation of the power law including the determined parameters.

US Patent:

6632020, Oct 14, 2003

Filed:

Oct 12, 2001

Appl. No.:

09/975892

Inventors:

John Patrick Kaufhold - Altamont NY
John Eric Tkaczyk - Delanson NY
Dinko E. Gonzalez Trotter - Clifton Park NY
Jeffrey Wayne Eberhard - Albany NY
Jerry A. Thomas - Potomac MA

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01D 1800

US Classification:

378207, 378 51

Abstract:

A method for calibration of an imaging system includes providing a calibration phantom system including a first phantom element material block having a first surface at a first height, wherein the first phantom element material block at least partially includes a first material having a first attenuation coefficient. Providing a calibration phantom system also includes providing a second phantom element material block having a second surface at a second height different than the first height, the second phantom element material block at least partially including a second material having a second attenuation coefficient different than the first attenuation coefficient, wherein the first phantom element material block and said second phantom element material block are co-positioned on a detector. The method also includes imaging the calibration phantom system to obtain phantom images, processing the phantom images, and extracting a plurality of calibration values from the processed phantom images.

US Patent:

6644917, Nov 11, 2003

Filed:

Aug 14, 2001

Appl. No.:

09/682282

Inventors:

Ji-Cheng Zhao - Niskayuna NY
James Anthony Ruud - Delmar NY
John Eric Tkaczyk - Delanson NY
Ann Melinda Ritter - Niskayuna NY
Melvin Robert Jackson - Niskayuna NY
Jerome Johnson Tiemann - Schenectady NY

Assignee:

General Electric Company - Niskayuna NY

International Classification:

F01D 2100

US Classification:

415200, 416 61, 416241 R

Abstract:

A on-line method is provided for detecting wear and/or damage to gas turbine parts. Preferred embodiments of the invention provide a gas turbine comprising parts with smart coatings and collection and detection means to measure wear and erosion of gas turbine parts. In other preferred embodiments, smart coatings are provided comprising chemical taggants that can be collected and detected downstream, thus providing an on-line or in situ evaluation technology for wear and damage to gas turbine parts.

US Patent:

6674835, Jan 6, 2004

Filed:

Oct 12, 2001

Appl. No.:

09/976693

Inventors:

John Patrick Kaufhold - Altamont NY
Jeffrey Wayne Eberhard - Albany NY
Dinko E. Gonzalez Trotter - Clifton Park NY
Bernhard Erich Hermann Claus - Niskayuna NY
John Eric Tkaczyk - Delanson NY

Assignee:

General Electric Co. - Schenectady NY

International Classification:

G01N 2306

US Classification:

378 53, 378 56, 378207

Abstract:

A method for estimating a material composition of an imaged object using an imaging system. The imaging system includes a radiation source and a digital detector. The method also includes scanning a plurality of calibration phantoms with varying material composition to acquire a plurality of reference calibration images, estimating an attenuation coefficient thickness product for each pixel in the reference calibration images, and estimating a material composition of a region of interest using the estimated pixelwise coefficient thickness product.

US Patent:

6920203, Jul 19, 2005

Filed:

Dec 2, 2002

Appl. No.:

10/308704

Inventors:

Jonathan Short - Clifton Park NY, US
John Eric Tkaczyk - Delanson NY, US
Brian David Yanoff - Schenectady NY, US
Loucas Tsakalakos - Niskayuna NY, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G21K001/02

US Classification:

378147, 378148, 378158

Abstract:

A technique for selectively attenuating a radiation exposure in which a configurable collimator is employed between the radiation source and the radiation target. The configurable collimator typically comprises an array of independently addressable elements each of which has at least a high and a low attenuation state, though intermediate states may also be accommodated. The elements of the array may be selectively addressed to determine their state and to determine the attenuation profile of the collimator. One embodiment of the technique employs an array of microactuated attenuating louvers which may be selectively actuated to determine their radiation transmittance. A second embodiment of the technique employs a suspension of attenuating nematic colloids which may be ordered by the application of an electric or magnetic field. The ordered state of the nematic colloids within an element determine the radiation transmittance of that element. A third embodiment of the technique employs microfluidics to fill an array of fluid chambers with an attenuating fluid.

US Patent:

6987833, Jan 17, 2006

Filed:

Oct 16, 2003

Appl. No.:

10/687131

Inventors:

Yanfeng Du - Clifton Park NY, US
John Eric Tkaczyk - Delanson NY, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01N 23/087

US Classification:

378 989, 378 5, 378 53

Abstract:

A method for analyzing materials in an object includes acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views. The acquired x-ray projection data is utilized in a material decomposition to determine material densities at each pixel for two selected basis materials. A composition of an object at each pixel is determined utilizing a determined mapping of material density regions for the two selected basis materials. An image indicative of the composition of the object is displayed utilizing the determined composition.