Jon R Tower

age ~56

from Colorado Springs, CO

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Also known as:

Jon Richard Tower
Jon Richard Towe
Richard J Tower
Richard L Tower
John R Tower
Ruth Tower

Phone and address:: 7420 Margarita Pl, Colorado Springs, CO 80919

Connected to:

Wikipedia

John Tower

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John Goodwin Tower (September 29, 1925 April 5, 1991) was the first Republican United States senator from Texas since Reconstruction. He served from 1961

John Henry Towers

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John Henry Towers (January 30, 1885 April 30, 1955) was a United States Navy admiral and pioneer Naval aviator. He made important contributions to the

Name / Title

Company / Classification

Phones & Addresses

Jon R. Tower
Vice President

Omnitest Incorporated
Business Services at Non-Commercial Site

218 Sand Dollar Rd, Melbourne, FL 32903

Jon Tower
Vice President

American Manageering Corporation

221 W Hibiscus Blvd, Melbourne, FL 32901
2117 S Babcock St, Melbourne, FL 32901

Jon Tower
Vice President

OMNIAPP INCORPORATED
Business Services at Non-Commercial Site

218 Sand Dollar Rd, Indialantic, FL 32903

Us Patents

Systems And Methods For Measuring Geometric Changes Of Embedded Passive Materials During A Lamination Process
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US Patent:

20110164256, Jul 7, 2011
Filed:

Jan 7, 2010
Appl. No.:

12/683513
Inventors:

Lendon L. Bendix - Melbourne FL, US
Barry G. Grossman - Melbourne FL, US
Mathew M. Kincaid - Indialantic FL, US
Jon Tower - Indialantic FL, US
Assignee:

Harris Corporation - Melbourne FL
International Classification:

G01B 9/02
G01B 11/14
G01B 11/00
US Classification:

356482, 356496, 356519
Abstract:

Systems () and methods () for measuring geometric changes of a passive material () when heat and pressure are applied thereto. The methods involve forming a pad () on a passive material panel (). The pad includes at least one of a layer of a passive material () and a layer of a metal (). The methods also involve coupling an interferometer () to the pad. The method also involves forming a multi-layer structure by placing at least one substrate panel () on top of the passive material such that an aperture () formed in the substrate panel is aligned with the pad. Pressure and heat are applied to the multi-layer structure. Data is collected using the interferometer while the pressure and heat are applied to the multi-layer structure. The interferometer can include, but is not limited to, a Fabry-Perot interferometer, a Michelson interferometer and/or a Mach-Zehnder interferometer.