Jonathan L Dummer from 2611 Ely Ln, Redding, CA 96001, age 48, Phone: 5302462104

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Location:

1246 Redwood Blvd, Redding, CA 96003

Industry:

Electrical/Electronic Manufacturing

Work:

Op-Test
Chief Technology Officer

Education:

University of California, Davis 1996 - 2001
Master of Science, Masters, Mechanical Engineering

Interests:

Graphics
Music
Programming

System And Method Of Testing High Brightness Led (Hbled)
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US Patent:

20110025337, Feb 3, 2011
Filed:

Jul 29, 2010
Appl. No.:

12/845823
Inventors:

Daniel Creighton Morrow - Redding CA, US
Jonathan Leigh Dummer - Redding CA, US
International Classification:

G01R 31/00
US Classification:

324414
Abstract:

A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters. In another embodiment, a photodetector is implemented to measure the integrated power of the optical output of the HBLED.

System And Method Of Quantifying Color And Intensity Of Light Sources
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US Patent:

20120038363, Feb 16, 2012
Filed:

Aug 8, 2011
Appl. No.:

13/205170
Inventors:

Daniel Creighton Morrow - Redding CA, US
Jonathan Leigh Dummer - Redding CA, US
Assignee:

Sof-Tek Integrators, Inc. dba Op-Test - Redding CA
International Classification:

G01R 31/00
US Classification:

324414
Abstract:

A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided. In one embodiment, a method of characterizing a Solid State Light (SSL) source includes a SSL source under test (DUT), a Spectral Power Distribution (SPD) of light emission of the SSL source, a curve-fitting function, a set of configuration data comprising the order of the curve-fitting function, the number of nodes, wavelength boundary limits, saturation threshold, and noise floor threshold, a computing device for curve-fitting, node detection, iteration and program control and inputting and outputting data; and a set of C-Parameters, noise parameters, and confidence values.

System And Method Of Quantifying Color And Intensity Of Light Sources
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US Patent:

20150355028, Dec 10, 2015
Filed:

Aug 18, 2015
Appl. No.:

14/829251
Inventors:

- Redding CA, US
Jonathan Leigh DUMMER - Redding CA, US
International Classification:

G01J 3/46
Abstract:

A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided. In one embodiment, a method of characterizing a Solid State Light (SSL) source includes a SSL source under test (DUT), a Spectral Power Distribution (SPD) of light emission of the SSL source, a curve-fitting function, a set of configuration data comprising the order of the curve-fitting function, the number of nodes, wavelength boundary limits, saturation threshold, and noise floor threshold, a computing device for curve-fitting, node detection, iteration and program control and inputting and outputting data; and a set of C-Parameters, noise parameters, and confidence values.

Method And System For Characterizing Light Emitting Devices
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US Patent:

20140268152, Sep 18, 2014
Filed:

Mar 11, 2014
Appl. No.:

14/204113
Inventors:

- Redding CA, US
Jonathan DUMMER - Redding CA, US
Stanley Curtis DODDS - Redding CA, US
Assignee:

Sof-Tek Integrators, Inc. dba as Op-Test - Redding CA
International Classification:

G01J 3/46
G01N 21/66
US Classification:

356402
Abstract:

Embodiments as disclosed herein provide a method and system that characterizes physical properties, such as thickness, uniformity, polarization, and/or sizes and locations of defect (e.g. defect density distribution) of crystalline structures grown on or thin films deposited on a substrate of a solid state light emitting device. The embodiments disclosed herein generally include exciting the light emitting device with an energy source and analyze optical energy emitted by the crystalline structures grown on or the thin films deposited on the substrate.

System And Method Of Testing High Brightness Led (Hbled)
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US Patent:

20140088910, Mar 27, 2014
Filed:

Nov 25, 2013
Appl. No.:

14/089252
Inventors:

- Redding CA, US
Jonathan Leigh Dummer - Redding CA, US
Assignee:

Sof-Tek Integrators, Inc. dba Op-Test - Redding CA
International Classification:

G01R 31/26
US Classification:

702117
Abstract:

A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters. In another embodiment, a photodetector is implemented to measure the integrated power of the optical output of the HBLED.