Jonathan David Ellis

US Patent:

20160144580, May 26, 2016

Filed:

Jul 8, 2014

Appl. No.:

14/903165

Inventors:

- Rochester NY, US
Jonathan Ellis - Pittsford NY, US

Assignee:

Universisty of Rochester - Rochester NY

International Classification:

B29D 11/00
B23K 26/082
B23K 26/0622
A61F 9/008
G02B 26/10

Abstract:

A high numerical aperture opto-mechanical scanner for writing refractive index modifications includes a fast axis scanner having a fast scanning axis. A waveform generator is electrically coupled to the fast axis scanner, and a waveform is provided by the waveform generator which defines a fast scan of the fast axis scanner. A scanning lens assembly is mechanically coupled to the fast axis scanner, the scanning lens assembly having a NA greater than 0.5 and a scanning lens motion along the fast scanning axis. A femtosecond laser is optically coupled through the scanning lens assembly to a surface of a material, creating a femtosecond laser light scanning pattern to write the refractive index modifications into the material. A method for writing refractive index modifications using a high numerical aperture opto-mechanical scanner is also described.

US Patent:

20150103356, Apr 16, 2015

Filed:

Nov 29, 2012

Appl. No.:

14/361106

Inventors:

Jonathan D. Ellis - Rochester NY, US
Josephus Wilhelmus Spronck - Delft, NL

Assignee:

DELFT UNIVERSITY OF TECHNOLOGY - Delft
UNIVERSITY OF ROCHESTER - Rochester NY

International Classification:

G01B 9/02
G01B 11/14

US Classification:

356482, 356498

Abstract:

A compact, balanced, up to three degrees of freedom measuring interferometer which enables fiber delivery of an optical source without periodic nonlinearity, an interferometer system, and method for using an interferometer to measure up to three degrees of freedom is disclosed.

US Patent:

20150077759, Mar 19, 2015

Filed:

Jul 30, 2014

Appl. No.:

14/446790

Inventors:

Jonathan D. Ellis - Pittsford NY, US
Christopher Roll - Arlington MA, US
Andrew Keene - East Greenwich RI, US
Michael A. Echter - Penfield NY, US

Assignee:

UNIVERSITY OF ROCHESTER - Rochester NY

International Classification:

G01B 9/02
G01B 11/14
G01B 11/26
G01B 11/00

US Classification:

356482, 356477

Abstract:

An optical probe system has a light source fiber-delivered and the detector fiber-coupled for analyzing carrier fringes using a line sensor to measure displacement and tilt. Simultaneous surface metrology to measure both the front and back surface of the same optic, is enabled provided the two surfaces are substantially parallel to within the measurement range. Alternatively, the front surface can be measured and then subsequently the back surface.