Jonathan E Nelson

Address:

35 Queensland Ln N, Minneapolis, MN 55447

VIN:

1GKET63M172150359

Make:

GMC

Model:

ENVOY

Year:

2007

US Patent:

7406860, Aug 5, 2008

Filed:

Apr 28, 2006

Appl. No.:

11/413579

Inventors:

Lin Zhou - Eagan MN, US
Huiwen Liu - Eden Prairie MN, US
Dale Egbert - Deephaven MN, US
Jonathan A. Nelson - Maple Grove MN, US
Jianxin Zhu - Eagan MN, US

Assignee:

Seagate Technology LLC - Scotts Valley CA

International Classification:

G01B 6/28

US Classification:

73105

Abstract:

A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.

US Patent:

8296860, Oct 23, 2012

Filed:

Mar 16, 2009

Appl. No.:

12/404849

Inventors:

Huiwen Liu - Eden Prairie MN, US
Lin Zhou - Eagan MN, US
Dale Egbert - Deephaven MN, US
Jonathan Arland Nelson - Maple Grove MN, US
Peter Gunderson - Ellsworth WI, US

Assignee:

Seagate Technology LLC - Cupertino CA

International Classification:

G01B 5/28

US Classification:

850 33, 850 1, 850 4, 850 11, 850 19, 850 20, 250306, 250307, 250310, 977850, 977851, 977860, 977863, 977872, 73105

Abstract:

An atomic force microscopy (AFM) method includes a scanning probe that scans a surface of a structure to produce a first structure image. The structure is then rotated by 90 with respect to the scanning probe. The scanning probe scans the surface of the structure again to produce a second structure image. The first and second structure images are combined to produce best fit image of the surface area of the structure. The same method is used to produce the best fit image of a flat standard. The best fit image of the flat standard is subtracted from the best fit image of the structure to obtain a true topographical image in which Z direction run out error is substantially reduced or eliminated.

US Patent:

20080276696, Nov 13, 2008

Filed:

Jul 25, 2008

Appl. No.:

12/179688

Inventors:

Lin Zhou - Eagan MN, US
Huiwen Liu - Eden Prairie MN, US
Dale Egbert - Deephaven MN, US
Jonathan A. Nelson - Maple Grove MN, US
Jianxin Zhu - Eagan MN, US

Assignee:

SEAGATE TECHNOLOGY LLC - Scotts Valley CA

International Classification:

G01B 5/28

US Classification:

73105

Abstract:

A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.

US Patent:

20140046220, Feb 13, 2014

Filed:

Apr 18, 2012

Appl. No.:

14/113270

Inventors:

Jonathan D. Nelson - Champlin MN, US

International Classification:

A61B 17/00
A61B 5/00
A61B 5/103

US Classification:

600587, 606213

Abstract:

A vascular closure device () having a proximal end and a distal end is described. The vascular closure device may include an insertion sheath (), a handle, and a locator anchor () positionable distally outside a distal end of the insertion sheath when the handle is in a first position. The handle may be movable from the first position to a second position located proximally relative to the first position, the locator anchor being configured to expand laterally when the handle is moved from the first position to the second position. Additionally, the handle may be movable from the second position to a third position located proximally relative to the second position to deploy a vascular closure implant in a puncture tract. A vascular closure method is also disclosed.

US Patent:

20160025772, Jan 28, 2016

Filed:

Oct 2, 2015

Appl. No.:

14/873839

Inventors:

- Cupertino CA, US
Huiwen Liu - Eden Prairie MN, US
Dale Egbert - Deephaven MN, US
Jonathan A. Nelson - Maple Grove MN, US
Jianxin Zhu - Eagan MN, US

International Classification:

G01Q 40/00
G01Q 30/06

Abstract:

Apparatus and associated method that contemplates performing a first atomic force microscope (AFM) scan of a first region of a sample centered at a first position at a first angle to produce a first scan image, the first AFM scan including a first component scan at a first speed and a second component scan at a second speed; performing a second AFM scan of the first region of the sample at a second angle to produce a second scan image, the second AFM scan including performing a third component scan at the first speed and a fourth component scan at the second speed; and correcting a first error in the first scan image based on the second scan image to produce a corrected image output.