age ~24
from Philadelphia, PA
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck ...
Binding
Paperback
Pages
298
Publisher
Springer
ISBN #
1441954228
EAN Code
9781441954220
ISBN #
7