Joseph C Carter

US Patent:

6754520, Jun 22, 2004

Filed:

Oct 19, 2001

Appl. No.:

10/039796

Inventors:

Mark DeSilets - San Jose CA
Timothy Buskard - Livermore CA
Joseph Carter - Los Gatos CA
Jacco Eerden - Eindoven, NL
Donald Wellnitz - Fitchburg WI

Assignee:

Koninklijke Philips Electronics N.V. - Eindhoven

International Classification:

A61B 505

US Classification:

600415, 600407, 600410, 600425, 606130, 382131, 378205, 25636304, 128906

Abstract:

The invention comprises a system and method for handling a patient in a tomographic imaging system using a plurality of imaging devices. The imaging devices each have a bore through which a patient is translated during scanning. One or more patient support structures extend from the front of the tomographic imaging system, where the patient is initially placed, through the bores of the system. The patient is translated through the bores of the system and along the patient support structures by an actuator.

US Patent:

58594248, Jan 12, 1999

Filed:

Apr 8, 1997

Appl. No.:

8/835533

Inventors:

Adam E. Norton - Palo Alto CA
Kenneth C. Johnson - Santa Clara CA
Joseph R. Carter - San Jose CA

Assignee:

KLA-Tencor Corporation - San Jose CA

International Classification:

G01J 350

US Classification:

250226

Abstract:

Because of diffraction effects caused by slits or apertures in optical measurement systems, the radiation energy which is directed towards a particular region on a sample will be spread over a larger area than desirable. By employing an apodizing filter in the radiation path in such system, diffraction tails of the system will be reduced. The apodizing filter preferably has a pattern of alternating high transmittance areas and substantially opaque areas where the locally averaged transmittance function is an apodizing function. In the preferred embodiment, the locally averaged transmittance function varies smoothly and monotonically from the periphery to the center of the filter.

US Patent:

57710945, Jun 23, 1998

Filed:

Jan 29, 1997

Appl. No.:

8/790090

Inventors:

Joseph Carter - San Jose CA
Jennming Chen - Campbell CA
Xing Chen - San Jose CA

Assignee:

Kla-Tencor Corporation - San Jose CA

International Classification:

G01J 336
G01N 2121

US Classification:

356326

Abstract:

The pixel position-to-wavelength calibration function of film measurement devices such as spectroscopic ellipsometers and spectroreflectometers may shift due to temperature and humidity changes and mechanical factors. One or more wavelength markers provided by the light source or reference sample may be used to correct the calibration function. The pixel positions of one or more persistent wavelength markers are noted during the calibration process and the current positions of such markers are again noted to account for shifts due to various factors to correct the calibration function.