Joseph H Christian

US Patent:

20210066056, Mar 4, 2021

Filed:

Sep 10, 2020

Appl. No.:

17/017580

Inventors:

- Hillsboro OR, US
Sergey GORELICK - Cheltenham, AU
Chad RUE - Portland OR, US
Joseph CHRISTIAN - Beaverton OR, US
Kenny MANI - Beaverton OR, US
Steven RANDOLPH - Portland OR, US
Matthias LANGHORST - Hameln, DE

International Classification:

H01J 49/00
G01N 1/32
H01J 37/32

Abstract:

The invention relates to a method, a device and a system for the treatment of biological frozen samples using plasma focused ion beams (FIB). The samples can then be used for mass spectrometry (MS), genomics, such as gene sequencing analysis or next generation sequencing (NGS) analysis, and proteomics. The present invention particularly relates to a method of treatment of at least one biological sample. This method is particularly used for high performance microscopy, proteomics analytics, sequencing, such as NGS etc. According to the present invention the method comprises the steps of providing at least one biological sample in frozen form. The milling treats at least one part of the sample by a plasma ion beam comprising at least one of an O and/or a Xe plasma.

US Patent:

20200411282, Dec 31, 2020

Filed:

Jun 29, 2020

Appl. No.:

16/914924

Inventors:

- Hillsboro OR, US
Alexander Makarov - Bremen, DE
Josh Gilbert - Hillsboro OR, US
Aaron Torok - Hillsboro OR, US
Joseph Christian - Hillsboro OR, US
Alan Bahm - Hillsboro OR, US
Kun Liu - Hillsboro OR, US
Tom Nichols - Hillsboro OR, US
Jeff Kosmoski - Hillsboro OR, US
Dmitry Grinfeld - Hillsboro OR, US

Assignee:

FEI Company - Hillsboro OR

International Classification:

H01J 37/295
H01J 37/20
H01J 49/42

Abstract:

Systems and method for the preparation and delivery of biological samples for charged particle analysis are disclosed herein. An example system at least includes an ion filter coupled to select a sample ion from an ionized sample supply, the ion filter including a quadrupole filter to select the sample ion from the sample supply, an energy reduction cell coupled to receive the selected sample ion and reduce a kinetic energy of the sample ion, a validation unit coupled to receive the sample ion and determine whether the sample ion is a target sample ion, a substrate coupled to receive the sample, wherein the substrate is electron transparent, an ion transport module coupled to receive the sample ion from the ion filter and transport the sample ion to the substrate, and an imaging system arranged to image, with a low energy charged particle beam, the sample located on the substrate, wherein the substrate is arranged in an analysis location. The imaging system including a charge particle emitter coupled to direct coherent charged particles toward the sample; and a detector arranged to detect interference patterns formed from interaction of the coherent charged particles and the sample.

US Patent:

20190206664, Jul 4, 2019

Filed:

Dec 19, 2018

Appl. No.:

16/225213

Inventors:

- Hillsboro OR, US
Sergey GORELICK - Cheltenham, AU
Chad RUE - Portland OR, US
Joseph CHRISTIAN - Beaverton OR, US
Kenny MANI - Beaverton OR, US
Steven RANDOLPH - Portland OR, US
Matthias LANGHORST - Hameln, DE

International Classification:

H01J 49/00

Abstract:

The invention relates to a method, a device and a system for the treatment of biological frozen samples using plasma focused ion beams (FIB). The samples can then be used for mass spectrometry (MS), genomics, such as gene sequencing analysis or next generation sequencing (NGS) analysis, and proteomics. The present invention particularly relates to a method of treatment of at least one biological sample. This method is particularly used for high performance microscopy, proteomics analytics, sequencing, such as NGS etc. According to the present invention the method comprises the steps of providing at least one biological sample in frozen form. The milling treats at least one part of the sample by a plasma ion beam comprising at least one of an O and/or a Xe plasma.