Joseph G Gray

US Patent:

6526120, Feb 25, 2003

Filed:

May 4, 1999

Appl. No.:

09/304899

Inventors:

Joseph N. Gray - Ames IA 50010
Feyzi Inanc - Ames IA 50010
Selcuk Arslan - Ames IA 50011

International Classification:

G01N 2304

US Classification:

378 57, 378 51, 56 102 R

Abstract:

The present invention is an apparatus and method for measuring flow rate of materials, for example the flow rate of agricultural products. The apparatus includes an x-ray generator positioned near flowing materials, a converter for converting the x-ray radiation which passes through the flowing materials into visible light, a camera for capturing images of the visible light, and a processor for processing the images to determine the flow rate. The invention may also include an image intensifier to intensify the images before being converted by the camera. The method directs x-rays through flowing material, converts the x-rays to visible light, records the intensity of the visible light and derives the flow rate from the intensity measures.

US Patent:

7092484, Aug 15, 2006

Filed:

Jun 13, 2003

Appl. No.:

10/461992

Inventors:

Terrence C. Jensen - Ames IA, US
Joseph N. Gray - Ames IA, US

Assignee:

Iowa State University Research Foundation, Inc. - Ames IA

International Classification:

A61B 6/02
G06K 9/62
G06K 9/64
B22D 46/00

US Classification:

378 41, 378 58, 378 62, 2502521, 356394, 348 42, 164 41, 1642501

Abstract:

The present invention is a method for inspecting objects. The method includes obtaining a structural model of a first object, the model providing dimensions and material properties for the first object, inspecting a second object to provide inspection data for at least two views of a structure of the second object, comparing inspection and predicted data based on the structural model of the first object and a simulation of the inspection process, reconstructing stereographic data for the second object based on the structural model of the first object and contributions of the inspection data of the second object. In another embodiment, where there is a structural model of an object, the object can be subjected to a dynamic process and the object is inspected throughout the process.

US Patent:

55005349, Mar 19, 1996

Filed:

Mar 31, 1994

Appl. No.:

8/220913

Inventors:

Douglas S. Robinson - Ames IA
Terrence C. Jensen - Ames IA
Joseph N. Gray - Ames IA

Assignee:

Iowa State University Research Foundation - Ames IA

International Classification:

G01T 1185

US Classification:

2503851

Abstract:

An integrated x-ray detection system includes an x-ray detector fabricated on a wafer with a housing for containing a gas. The detector has a plurality of microstrip anodes and the housing passes x-rays which partially ionize the gas thereby producing a pulse at one of the anodes. The same wafer also has a plurality of integrated active signal processing circuits which are respectively coupled to the anodes. Each active signal processing circuit receives and processes pulses from respective ones of the anodes and outputs a digital signal indicating the location and energy of x-rays detected by the detector. An isolation layer separates the x-ray detector from the active signal processing circuits.

US Patent:

56886985, Nov 18, 1997

Filed:

Jun 7, 1995

Appl. No.:

8/475331

Inventors:

Douglas S. Robinson - Ames IA
Terrence C. Jensen - Ames IA
Joseph N. Gray - Ames IA

Assignee:

Iowa State University Research Foundation - Ames IA

International Classification:

H01L 31115

US Classification:

437 3

Abstract:

An integrated x-ray detection system includes an x-ray detector fabricated on a wafer with a housing for containing a gas. The detector has a plurality of microstrip anodes and the housing passes x-rays which partially ionize the gas thereby producing a pulse at one of the anodes. The same wafer also has a plurality of integrated active signal processing circuits which are respectively coupled to the anodes. Each active signal processing circuit receives and processes pulses from respective ones of the anodes and outputs a digital signal indicating the location and energy of x-rays detected by the detector. An isolation layer separates the x-ray detector from the active signal processing circuits.