Joseph P Griffith

US Patent:

56939973, Dec 2, 1997

Filed:

Feb 9, 1996

Appl. No.:

8/599570

Inventors:

Joseph E. Griffith - Berkeley Heights NJ
Rafael N. Kleiman - New Brunswick NJ

Assignee:

Lucent Technologies Inc. - Murray Hill NJ

International Classification:

H02N 200
H01L 4108

US Classification:

310328

Abstract:

A non-tilting positioner for a micropositioning device constructed of piezoelectric plate actuators each arranged with a pair of opposed parallel edges respectively coupled to first and second elements. A first surface of each plate is divided into quadrants, with first electrodes in each of the quadrants. At least one second electrode is provided on the opposed surface. Electric voltages are applied to the first and second electrodes with appropriate polarities so as to generate an electric field through the thickness of the plate which is of a first polarity in a first pair of diagonally opposite quadrants and is of the opposite polarity in the second pair of diagonally opposite quadrants. Movement along a line parallel to the plane of the plate is thereby effected. Movement in a third orthogonal direction can also be attained by selecting an appropriate electrode pattern.

US Patent:

61786535, Jan 30, 2001

Filed:

Nov 20, 1998

Appl. No.:

9/196827

Inventors:

Joseph Edward Griffith - Berkeley Heights NJ
Charles E. Bryson - Sunnyvale CA
Jeffrey Bruce Bindell - Orlando FL

Assignee:

Lucent Technologies Inc. - Murray Hill NJ

International Classification:

G01B 900
G01B 500

US Classification:

33555

Abstract:

A probe tip locator for use in determining the x-axis location and y-axis location of a probe tip of a microscope relative to the locator, the locator comprising a plurality of first reference lines parallel in a first direction, each of the first reference lines representing a predetermined x-axis location of the probe tip; a plurality of sets of parallel encoded bit fields, each one of the sets corresponding to one of the first reference lines; and a plurality of second reference lines parallel in a second direction, each one of the second reference lines intersecting at least one of the first reference lines at an acute angle, such that a scan of a portion of the locator is used to determine the x-axis location and y-axis location of the probe tip relative to the probe tip locator by movement of the probe tip relative to the probe tip locator.

US Patent:

53076931, May 3, 1994

Filed:

Jan 21, 1993

Appl. No.:

8/007304

Inventors:

Joseph E. Griffith - Berkeley Heights NJ
Gabriel L. Miller - Westfield NJ

Assignee:

AT&T Bell Laboratories - Murray Hill NJ

International Classification:

G01L 116

US Classification:

7386268

Abstract:

A force-sensing system suitable, for example, for atomic force microscopy. This system includes a rocking beam, a base, and means for supporting the beam adjacent a surface of the base such that the beam can pivot about at least one axis parallel to the base surface. In contrast to rocking-beam systems of the prior art, the support means comprise at least one pivot element that can be held against the base surface by a magnetic field.

US Patent:

56273711, May 6, 1997

Filed:

Feb 9, 1996

Appl. No.:

8/600658

Inventors:

Joseph E. Griffith - Berkeley Heights NJ
Rafael N. Kleiman - New Brunswick NJ

Assignee:

Lucent Technologies Inc. - Murray Hill NJ

International Classification:

G01N 2300

US Classification:

250306

Abstract:

A scanning probe microscope positioner including an elongated rigid member which is controllably tilted in a predictable manner. One end of the rigid member is subjected to differential motion on opposite sides of its longitudinal axis so as to cause its opposite end to partake of lateral displacement which is a magnification of the differential motion. By a careful selection of component materials and sizes, inherent thermal compensation can be attained.