Joseph G Hirschberg

US Patent:

41847377, Jan 22, 1980

Filed:

May 4, 1978

Appl. No.:

5/902822

Inventors:

Joseph G. Hirschberg - Coral Gables FL

International Classification:

G02B 2114

US Classification:

350 13

Abstract:

An interference microscope based on the principles of nonlinear optics comprises an ordinary microscope which has three additional internal optical elements, namely, two nonlinear frequency-doubling platelets and an infra-red filter, each suitably positioned. Light from an infra-red laser light source is passed through the platelets and filter, and the phase shift of the resulting image in the visible spectrum at the eyepiece is measured in order to calculate the optical thickness of a transparent object.

US Patent:

42635110, Apr 21, 1981

Filed:

Dec 29, 1978

Appl. No.:

5/974313

Inventors:

Joseph G. Hirschberg - Coral Gables FL

Assignee:

University of Miami - Coral Gables FL

International Classification:

G01N 2126

US Classification:

250343

Abstract:

An in situ turbidity meter, for measuring water quality of a body of water comprising a pulsed infrared laser which illuminates the water, thereby producing scattered radiation from particles suspended in the water. A portion of the scattered radiation is collected and correlated to the turbidity of the water.

US Patent:

41506081, Apr 24, 1979

Filed:

Sep 6, 1977

Appl. No.:

5/830827

Inventors:

Joseph G. Hirschberg - Coral Gables FL
Harry E. Rubens - Bay Harbor Islands FL

International Classification:

A47J 3110

US Classification:

99306

Abstract:

A drip-coffee maker having a coffee dispersing section mounted to a coffee receiving vessel, the latter characterized by having double walls provided with an evacuated space therebetween, a filter contained in the dispersing section to filter the coffee into the vessel, and a venting means positioned between the dispersing section and the vessel to provide atmospheric connection between the vessel and the atmosphere.

US Patent:

49792032, Dec 18, 1990

Filed:

Jun 19, 1989

Appl. No.:

7/369206

Inventors:

Szymon Suckewer - Princeton NJ
Darrell S. DiCicco - Plainsboro NJ
Joseph G. Hirschberg - Coral Gables FL
Lewis D. Meixler - East Windsor NJ
Robert Sathre - Princeton NJ
Charles H. Skinner - Lawrenceville NJ

Assignee:

Princeton X-Ray Laser - Monmouth Junction NJ

International Classification:

G21K 700

US Classification:

378206

Abstract:

A microscope consisting of an x-ray contact microscope and an optical microscope. The optical, phase contrast, microscope is used to align a target with respect to a source of soft x-rays. The source of soft x-rays preferably comprises an x-ray laser but could comprise a synchrotron or other pulse source of x-rays. Transparent resist material is used to support the target. The optical microscope is located on the opposite side of the transparent resist material from the target and is employed to align the target with respect to the anticipated soft x-ray laser beam. After alignment with the use of the optical microscope, the target is exposed to the soft x-ray laser beam. The x-ray sensitive transparent resist material whose chemical bonds are altered by the x-ray beam passing through the target mater GOVERNMENT LICENSE RIGHTS This invention was made with government support under Contract No. De-FG02-86ER13609 awarded by the Department of Energy. The Government has certain rights in this invention.